A survey of algorithms for integrating wafer-scale systolic arrays:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Cambridge, Mass.
Laboratory for Computer Science, Mass. Inst. of Technology
1986
|
| Schlagworte: | |
| Beschreibung: | 24 S. graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV021896183 | ||
| 003 | DE-604 | ||
| 005 | 20040301000000.0 | ||
| 007 | t | ||
| 008 | 910228s1986 d||| |||| 00||| eng d | ||
| 035 | |a (OCoLC)17002478 | ||
| 035 | |a (DE-599)BVBBV021896183 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-706 | ||
| 088 | |a MIT LCS TM 302 | ||
| 100 | 1 | |a Leighton, Frank T. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a A survey of algorithms for integrating wafer-scale systolic arrays |c Tom Leighton ; Charles Leiserson |
| 264 | 1 | |a Cambridge, Mass. |b Laboratory for Computer Science, Mass. Inst. of Technology |c 1986 | |
| 300 | |a 24 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Algorithms | |
| 650 | 4 | |a Fault-tolerant computing | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration | |
| 650 | 0 | 7 | |a Fehlertoleranz |0 (DE-588)4123192-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Algorithmus |0 (DE-588)4001183-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Algorithmus |0 (DE-588)4001183-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Fehlertoleranz |0 (DE-588)4123192-2 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Leiserson, Charles E. |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015111366 | ||
Datensatz im Suchindex
| _version_ | 1804135840933216256 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Leighton, Frank T. Leiserson, Charles E. |
| author_facet | Leighton, Frank T. Leiserson, Charles E. |
| author_role | aut aut |
| author_sort | Leighton, Frank T. |
| author_variant | f t l ft ftl c e l ce cel |
| building | Verbundindex |
| bvnumber | BV021896183 |
| ctrlnum | (OCoLC)17002478 (DE-599)BVBBV021896183 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01254nam a2200373zc 4500</leader><controlfield tag="001">BV021896183</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20040301000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">910228s1986 d||| |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)17002478</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021896183</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield></datafield><datafield tag="088" ind1=" " ind2=" "><subfield code="a">MIT LCS TM 302</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Leighton, Frank T.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">A survey of algorithms for integrating wafer-scale systolic arrays</subfield><subfield code="c">Tom Leighton ; Charles Leiserson</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cambridge, Mass.</subfield><subfield code="b">Laboratory for Computer Science, Mass. Inst. of Technology</subfield><subfield code="c">1986</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">24 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Algorithms</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Fault-tolerant computing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Very large scale integration</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Algorithmus</subfield><subfield code="0">(DE-588)4001183-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Algorithmus</subfield><subfield code="0">(DE-588)4001183-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Leiserson, Charles E.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015111366</subfield></datafield></record></collection> |
| id | DE-604.BV021896183 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:04:23Z |
| indexdate | 2024-07-09T20:46:54Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015111366 |
| oclc_num | 17002478 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | 24 S. graph. Darst. |
| publishDate | 1986 |
| publishDateSearch | 1986 |
| publishDateSort | 1986 |
| publisher | Laboratory for Computer Science, Mass. Inst. of Technology |
| record_format | marc |
| spelling | Leighton, Frank T. Verfasser aut A survey of algorithms for integrating wafer-scale systolic arrays Tom Leighton ; Charles Leiserson Cambridge, Mass. Laboratory for Computer Science, Mass. Inst. of Technology 1986 24 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Algorithms Fault-tolerant computing Integrated circuits Very large scale integration Fehlertoleranz (DE-588)4123192-2 gnd rswk-swf Algorithmus (DE-588)4001183-5 gnd rswk-swf Algorithmus (DE-588)4001183-5 s DE-604 Fehlertoleranz (DE-588)4123192-2 s Leiserson, Charles E. Verfasser aut |
| spellingShingle | Leighton, Frank T. Leiserson, Charles E. A survey of algorithms for integrating wafer-scale systolic arrays Algorithms Fault-tolerant computing Integrated circuits Very large scale integration Fehlertoleranz (DE-588)4123192-2 gnd Algorithmus (DE-588)4001183-5 gnd |
| subject_GND | (DE-588)4123192-2 (DE-588)4001183-5 |
| title | A survey of algorithms for integrating wafer-scale systolic arrays |
| title_auth | A survey of algorithms for integrating wafer-scale systolic arrays |
| title_exact_search | A survey of algorithms for integrating wafer-scale systolic arrays |
| title_exact_search_txtP | A survey of algorithms for integrating wafer-scale systolic arrays |
| title_full | A survey of algorithms for integrating wafer-scale systolic arrays Tom Leighton ; Charles Leiserson |
| title_fullStr | A survey of algorithms for integrating wafer-scale systolic arrays Tom Leighton ; Charles Leiserson |
| title_full_unstemmed | A survey of algorithms for integrating wafer-scale systolic arrays Tom Leighton ; Charles Leiserson |
| title_short | A survey of algorithms for integrating wafer-scale systolic arrays |
| title_sort | a survey of algorithms for integrating wafer scale systolic arrays |
| topic | Algorithms Fault-tolerant computing Integrated circuits Very large scale integration Fehlertoleranz (DE-588)4123192-2 gnd Algorithmus (DE-588)4001183-5 gnd |
| topic_facet | Algorithms Fault-tolerant computing Integrated circuits Very large scale integration Fehlertoleranz Algorithmus |
| work_keys_str_mv | AT leightonfrankt asurveyofalgorithmsforintegratingwaferscalesystolicarrays AT leisersoncharlese asurveyofalgorithmsforintegratingwaferscalesystolicarrays |