Proceedings of the Topical Conference on Probing the Nanometer Scale Properties of Surfaces and Interfaces: 3-4 October 1988, Atlanta, Ga.
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Bibliographic Details
Corporate Author: Topical Conference on Probing the Nanometer Scale Properties of Surfaces and Interfaces Atlanta, Ga (Author)
Format: Conference Proceeding Book
Language:Undetermined
Published: New York American Inst. of Physics 1989
Subjects:
Item Description:In: Journal of vacuum science and technology / 2/A. Vol.7, Nr.4, 1989
Physical Description:S. 2823-2930 Ill., graph. Darst.

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