APA (7th ed.) Citation

Bardell, P. H., MacAnney, W. H., & Savir, J. (1987). Built-in test for VLSI: Pseudorandom techniques (1. print.). Wiley.

Chicago Style (17th ed.) Citation

Bardell, Paul H., William H. MacAnney, and Jacob Savir. Built-in Test for VLSI: Pseudorandom Techniques. 1. print. New York [u.a.]: Wiley, 1987.

MLA (9th ed.) Citation

Bardell, Paul H., et al. Built-in Test for VLSI: Pseudorandom Techniques. 1. print. Wiley, 1987.