Built-in test for VLSI: pseudorandom techniques
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
Wiley
1987
|
| Ausgabe: | 1. print. |
| Schriftenreihe: | A Wiley-Interscience publication
|
| Schlagworte: | |
| Beschreibung: | XIII, 354 S. |
| ISBN: | 0471624632 |
Internformat
MARC
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| 041 | 0 | |a eng | |
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| 100 | 1 | |a Bardell, Paul H. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Built-in test for VLSI |b pseudorandom techniques |
| 250 | |a 1. print. | ||
| 264 | 1 | |a New York [u.a.] |b Wiley |c 1987 | |
| 300 | |a XIII, 354 S. | ||
| 336 | |b txt |2 rdacontent | ||
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| 490 | 0 | |a A Wiley-Interscience publication | |
| 650 | 4 | |a Electronic equipment - Very large scale integrated circuits - Testing | |
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| 650 | 7 | |a Prüftechnik |2 swd | |
| 650 | 7 | |a VLSI |2 swd | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Testing | |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
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| 700 | 1 | |a MacAnney, William H. |e Verfasser |4 aut | |
| 700 | 1 | |a Savir, Jacob |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015103569 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
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| author | Bardell, Paul H. MacAnney, William H. Savir, Jacob |
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| author_sort | Bardell, Paul H. |
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| bvnumber | BV021888338 |
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| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ST 190 |
| ctrlnum | (OCoLC)16580098 (DE-599)BVBBV021888338 |
| dewey-full | 621.381/73 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381/73 |
| dewey-search | 621.381/73 |
| dewey-sort | 3621.381 273 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 1. print. |
| format | Book |
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| id | DE-604.BV021888338 |
| illustrated | Not Illustrated |
| index_date | 2024-07-02T16:04:04Z |
| indexdate | 2024-07-09T20:46:44Z |
| institution | BVB |
| isbn | 0471624632 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015103569 |
| oclc_num | 16580098 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | XIII, 354 S. |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| publisher | Wiley |
| record_format | marc |
| series2 | A Wiley-Interscience publication |
| spelling | Bardell, Paul H. Verfasser aut Built-in test for VLSI pseudorandom techniques 1. print. New York [u.a.] Wiley 1987 XIII, 354 S. txt rdacontent n rdamedia nc rdacarrier A Wiley-Interscience publication Electronic equipment - Very large scale integrated circuits - Testing Circuits intégrés à très grande échelle - Essais Prüftechnik swd VLSI swd Integrated circuits Very large scale integration Testing VLSI (DE-588)4117388-0 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf VLSI (DE-588)4117388-0 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 MacAnney, William H. Verfasser aut Savir, Jacob Verfasser aut 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Bardell, Paul H. MacAnney, William H. Savir, Jacob Built-in test for VLSI pseudorandom techniques Electronic equipment - Very large scale integrated circuits - Testing Circuits intégrés à très grande échelle - Essais Prüftechnik swd VLSI swd Integrated circuits Very large scale integration Testing VLSI (DE-588)4117388-0 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4117388-0 (DE-588)4047610-8 |
| title | Built-in test for VLSI pseudorandom techniques |
| title_auth | Built-in test for VLSI pseudorandom techniques |
| title_exact_search | Built-in test for VLSI pseudorandom techniques |
| title_exact_search_txtP | Built-in test for VLSI pseudorandom techniques |
| title_full | Built-in test for VLSI pseudorandom techniques |
| title_fullStr | Built-in test for VLSI pseudorandom techniques |
| title_full_unstemmed | Built-in test for VLSI pseudorandom techniques |
| title_short | Built-in test for VLSI |
| title_sort | built in test for vlsi pseudorandom techniques |
| title_sub | pseudorandom techniques |
| topic | Electronic equipment - Very large scale integrated circuits - Testing Circuits intégrés à très grande échelle - Essais Prüftechnik swd VLSI swd Integrated circuits Very large scale integration Testing VLSI (DE-588)4117388-0 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Electronic equipment - Very large scale integrated circuits - Testing Circuits intégrés à très grande échelle - Essais Prüftechnik VLSI Integrated circuits Very large scale integration Testing |
| work_keys_str_mv | AT bardellpaulh builtintestforvlsipseudorandomtechniques AT macanneywilliamh builtintestforvlsipseudorandomtechniques AT savirjacob builtintestforvlsipseudorandomtechniques |