Ramanspektroskopische Untersuchungen zur Entstehung von verspannten GaAs-SiGe-Heterostrukturen und Si-SiGe-Übergittern:
Saved in:
Bibliographic Details
Main Author: Brugger, Johann G. (Author)
Format: Thesis Book
Language:German
Published: 1987
Subjects:
Physical Description:161 S. graph. Darst.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!