LSI/VLSI testability design:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
McGraw-Hill
1987
|
| Ausgabe: | 1. print. |
| Schlagworte: | |
| Beschreibung: | XV, 701 S. |
| ISBN: | 0070653410 |
Internformat
MARC
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| 100 | 1 | |a Tsui, Frank F. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a LSI/VLSI testability design |
| 250 | |a 1. print. | ||
| 264 | 1 | |a New York [u.a.] |b McGraw-Hill |c 1987 | |
| 300 | |a XV, 701 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Integrated circuits |x Large scale integration |x Testing | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Testing | |
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Datensatz im Suchindex
| _version_ | 1804135811806920704 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Tsui, Frank F. |
| author_facet | Tsui, Frank F. |
| author_role | aut |
| author_sort | Tsui, Frank F. |
| author_variant | f f t ff fft |
| building | Verbundindex |
| bvnumber | BV021873099 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ST 190 ZN 4030 ZN 4950 |
| ctrlnum | (OCoLC)13327973 (DE-599)BVBBV021873099 |
| dewey-full | 621.395/028/7 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.395/028/7 |
| dewey-search | 621.395/028/7 |
| dewey-sort | 3621.395 228 17 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 1. print. |
| format | Book |
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| id | DE-604.BV021873099 |
| illustrated | Not Illustrated |
| index_date | 2024-07-02T16:03:29Z |
| indexdate | 2024-07-09T20:46:26Z |
| institution | BVB |
| isbn | 0070653410 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015088878 |
| oclc_num | 13327973 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | XV, 701 S. |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| publisher | McGraw-Hill |
| record_format | marc |
| spelling | Tsui, Frank F. Verfasser aut LSI/VLSI testability design 1. print. New York [u.a.] McGraw-Hill 1987 XV, 701 S. txt rdacontent n rdamedia nc rdacarrier Integrated circuits Large scale integration Testing Integrated circuits Very large scale integration Testing VLSI (DE-588)4117388-0 gnd rswk-swf Schaltungsentwurf (DE-588)4179389-4 gnd rswk-swf LSI (DE-588)4168200-2 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Entwurf (DE-588)4121208-3 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Schaltungsentwurf (DE-588)4179389-4 s DE-604 Integrierte Schaltung (DE-588)4027242-4 s Entwurf (DE-588)4121208-3 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 LSI (DE-588)4168200-2 s Testen (DE-588)4367264-4 s 2\p DE-604 VLSI (DE-588)4117388-0 s 3\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Tsui, Frank F. LSI/VLSI testability design Integrated circuits Large scale integration Testing Integrated circuits Very large scale integration Testing VLSI (DE-588)4117388-0 gnd Schaltungsentwurf (DE-588)4179389-4 gnd LSI (DE-588)4168200-2 gnd Testen (DE-588)4367264-4 gnd Entwurf (DE-588)4121208-3 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4117388-0 (DE-588)4179389-4 (DE-588)4168200-2 (DE-588)4367264-4 (DE-588)4121208-3 (DE-588)4027242-4 (DE-588)4047610-8 |
| title | LSI/VLSI testability design |
| title_auth | LSI/VLSI testability design |
| title_exact_search | LSI/VLSI testability design |
| title_exact_search_txtP | LSI/VLSI testability design |
| title_full | LSI/VLSI testability design |
| title_fullStr | LSI/VLSI testability design |
| title_full_unstemmed | LSI/VLSI testability design |
| title_short | LSI/VLSI testability design |
| title_sort | lsi vlsi testability design |
| topic | Integrated circuits Large scale integration Testing Integrated circuits Very large scale integration Testing VLSI (DE-588)4117388-0 gnd Schaltungsentwurf (DE-588)4179389-4 gnd LSI (DE-588)4168200-2 gnd Testen (DE-588)4367264-4 gnd Entwurf (DE-588)4121208-3 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Integrated circuits Large scale integration Testing Integrated circuits Very large scale integration Testing VLSI Schaltungsentwurf LSI Testen Entwurf Integrierte Schaltung Prüftechnik |
| work_keys_str_mv | AT tsuifrankf lsivlsitestabilitydesign |