Point defects in semiconductors:
Gespeichert in:
Hauptverfasser: | , |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Berlin [u.a.]
Springer
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Schriftenreihe: | Springer series in solid-state sciences
... |
Schlagworte: |
Internformat
MARC
LEADER | 00000nam a2200000zca4500 | ||
---|---|---|---|
001 | BV021862395 | ||
003 | DE-604 | ||
005 | 20140828 | ||
007 | t | ||
008 | 020701nuuuuuuuu |||| 00||| eng d | ||
035 | |a (DE-599)BVBBV021862395 | ||
040 | |a DE-604 |b ger | ||
041 | 0 | |a eng | |
084 | |a UP 1090 |0 (DE-625)146343: |2 rvk | ||
084 | |a UP 2100 |0 (DE-625)146354: |2 rvk | ||
100 | 1 | |a Lannoo, Michel |e Verfasser |4 aut | |
245 | 1 | 0 | |a Point defects in semiconductors |c M. Lannoo ; J. Bourgoin |
264 | 1 | |a Berlin [u.a.] |b Springer | |
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 0 | |a Springer series in solid-state sciences |v ... | |
650 | 0 | 7 | |a Störstelle |0 (DE-588)4193400-3 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Halbleiterphysik |0 (DE-588)4113829-6 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Halbleiterphysik |0 (DE-588)4113829-6 |D s |
689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Störstelle |0 (DE-588)4193400-3 |D s |
689 | 1 | |5 DE-604 | |
700 | 1 | |a Bourgoin, Jacques |e Verfasser |4 aut | |
999 | |a oai:aleph.bib-bvb.de:BVB01-015078194 |
Datensatz im Suchindex
_version_ | 1804135800586108928 |
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adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author | Lannoo, Michel Bourgoin, Jacques |
author_facet | Lannoo, Michel Bourgoin, Jacques |
author_role | aut aut |
author_sort | Lannoo, Michel |
author_variant | m l ml j b jb |
building | Verbundindex |
bvnumber | BV021862395 |
classification_rvk | UP 1090 UP 2100 |
ctrlnum | (DE-599)BVBBV021862395 |
discipline | Physik |
discipline_str_mv | Physik |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01039nam a2200325zca4500</leader><controlfield tag="001">BV021862395</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20140828 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">020701nuuuuuuuu |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021862395</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 1090</subfield><subfield code="0">(DE-625)146343:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 2100</subfield><subfield code="0">(DE-625)146354:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Lannoo, Michel</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Point defects in semiconductors</subfield><subfield code="c">M. Lannoo ; J. Bourgoin</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin [u.a.]</subfield><subfield code="b">Springer</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Springer series in solid-state sciences</subfield><subfield code="v">...</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Störstelle</subfield><subfield code="0">(DE-588)4193400-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiterphysik</subfield><subfield code="0">(DE-588)4113829-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiterphysik</subfield><subfield code="0">(DE-588)4113829-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Störstelle</subfield><subfield code="0">(DE-588)4193400-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Bourgoin, Jacques</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015078194</subfield></datafield></record></collection> |
id | DE-604.BV021862395 |
illustrated | Not Illustrated |
index_date | 2024-07-02T16:02:55Z |
indexdate | 2024-07-09T20:46:16Z |
institution | BVB |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015078194 |
open_access_boolean | |
publishDateSort | 0000 |
publisher | Springer |
record_format | marc |
series2 | Springer series in solid-state sciences |
spelling | Lannoo, Michel Verfasser aut Point defects in semiconductors M. Lannoo ; J. Bourgoin Berlin [u.a.] Springer txt rdacontent n rdamedia nc rdacarrier Springer series in solid-state sciences ... Störstelle (DE-588)4193400-3 gnd rswk-swf Halbleiterphysik (DE-588)4113829-6 gnd rswk-swf Halbleiterphysik (DE-588)4113829-6 s DE-604 Störstelle (DE-588)4193400-3 s Bourgoin, Jacques Verfasser aut |
spellingShingle | Lannoo, Michel Bourgoin, Jacques Point defects in semiconductors Störstelle (DE-588)4193400-3 gnd Halbleiterphysik (DE-588)4113829-6 gnd |
subject_GND | (DE-588)4193400-3 (DE-588)4113829-6 |
title | Point defects in semiconductors |
title_auth | Point defects in semiconductors |
title_exact_search | Point defects in semiconductors |
title_exact_search_txtP | Point defects in semiconductors |
title_full | Point defects in semiconductors M. Lannoo ; J. Bourgoin |
title_fullStr | Point defects in semiconductors M. Lannoo ; J. Bourgoin |
title_full_unstemmed | Point defects in semiconductors M. Lannoo ; J. Bourgoin |
title_short | Point defects in semiconductors |
title_sort | point defects in semiconductors |
topic | Störstelle (DE-588)4193400-3 gnd Halbleiterphysik (DE-588)4113829-6 gnd |
topic_facet | Störstelle Halbleiterphysik |
work_keys_str_mv | AT lannoomichel pointdefectsinsemiconductors AT bourgoinjacques pointdefectsinsemiconductors |