Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors: Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997
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| Corporate Author: | |
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| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Amsterdam [u.a.]
Gordon and Breach
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| Subjects: | |
| Item Description: | Literaturangaben. - In: Radiation effects and defects in solids ; ... |
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MARC
| LEADER | 00000nam a2200000zca4500 | ||
|---|---|---|---|
| 001 | BV021862189 | ||
| 003 | DE-604 | ||
| 005 | 20040302000000.0 | ||
| 007 | t | ||
| 008 | 020118nuuuuuuuu |||| 10||| eng d | ||
| 035 | |a (DE-599)BVBBV021862189 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 111 | 2 | |a Symposium on Defect Dependent Processes in Insulators and Semiconductors |d 1997 |c Campos do Jordão |j Verfasser |0 (DE-588)6014514-6 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors |b Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
| 264 | 1 | |a Amsterdam [u.a.] |b Gordon and Breach | |
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Literaturangaben. - In: Radiation effects and defects in solids ; ... | ||
| 650 | 0 | 7 | |a Physikalische Eigenschaft |0 (DE-588)4134738-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Nichtleiter |0 (DE-588)4123451-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Nichtleiter |0 (DE-588)4123451-0 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
| 689 | 2 | |5 DE-604 | |
| 689 | 3 | 0 | |a Physikalische Eigenschaft |0 (DE-588)4134738-9 |D s |
| 689 | 3 | |5 DE-604 | |
| 700 | 1 | |a Watanabe, Shigueo |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015077988 | ||
Record in the Search Index
| _version_ | 1804135800456085504 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author_corporate | Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos do Jordão |
| author_corporate_role | aut |
| author_facet | Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos do Jordão |
| author_sort | Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos do Jordão |
| building | Verbundindex |
| bvnumber | BV021862189 |
| ctrlnum | (DE-599)BVBBV021862189 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01537nam a2200385zca4500</leader><controlfield tag="001">BV021862189</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20040302000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">020118nuuuuuuuu |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021862189</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">Symposium on Defect Dependent Processes in Insulators and Semiconductors</subfield><subfield code="d">1997</subfield><subfield code="c">Campos do Jordão</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)6014514-6</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors</subfield><subfield code="b">Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam [u.a.]</subfield><subfield code="b">Gordon and Breach</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben. - In: Radiation effects and defects in solids ; ...</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Physikalische Eigenschaft</subfield><subfield code="0">(DE-588)4134738-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Nichtleiter</subfield><subfield code="0">(DE-588)4123451-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Nichtleiter</subfield><subfield code="0">(DE-588)4123451-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Physikalische Eigenschaft</subfield><subfield code="0">(DE-588)4134738-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Watanabe, Shigueo</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015077988</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV021862189 |
| illustrated | Not Illustrated |
| index_date | 2024-07-02T16:02:55Z |
| indexdate | 2024-07-09T20:46:16Z |
| institution | BVB |
| institution_GND | (DE-588)6014514-6 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015077988 |
| open_access_boolean | |
| publishDateSort | 0000 |
| publisher | Gordon and Breach |
| record_format | marc |
| spelling | Symposium on Defect Dependent Processes in Insulators and Semiconductors 1997 Campos do Jordão Verfasser (DE-588)6014514-6 aut Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 Amsterdam [u.a.] Gordon and Breach txt rdacontent n rdamedia nc rdacarrier Literaturangaben. - In: Radiation effects and defects in solids ; ... Physikalische Eigenschaft (DE-588)4134738-9 gnd rswk-swf Nichtleiter (DE-588)4123451-0 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Halbleiter (DE-588)4022993-2 s DE-604 Nichtleiter (DE-588)4123451-0 s Gitterbaufehler (DE-588)4125030-8 s Physikalische Eigenschaft (DE-588)4134738-9 s Watanabe, Shigueo Sonstige oth |
| spellingShingle | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 Physikalische Eigenschaft (DE-588)4134738-9 gnd Nichtleiter (DE-588)4123451-0 gnd Halbleiter (DE-588)4022993-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| subject_GND | (DE-588)4134738-9 (DE-588)4123451-0 (DE-588)4022993-2 (DE-588)4125030-8 (DE-588)1071861417 |
| title | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
| title_auth | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
| title_exact_search | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
| title_exact_search_txtP | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
| title_full | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
| title_fullStr | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
| title_full_unstemmed | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
| title_short | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors |
| title_sort | proceedings of the symposium on defect dependent processes in insulators and semiconductors campos de jordao sp brazil july 31 august 4 1997 |
| title_sub | Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
| topic | Physikalische Eigenschaft (DE-588)4134738-9 gnd Nichtleiter (DE-588)4123451-0 gnd Halbleiter (DE-588)4022993-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| topic_facet | Physikalische Eigenschaft Nichtleiter Halbleiter Gitterbaufehler Konferenzschrift |
| work_keys_str_mv | AT symposiumondefectdependentprocessesininsulatorsandsemiconductorscamposdojordao proceedingsofthesymposiumondefectdependentprocessesininsulatorsandsemiconductorscamposdejordaospbraziljuly31august41997 AT watanabeshigueo proceedingsofthesymposiumondefectdependentprocessesininsulatorsandsemiconductorscamposdejordaospbraziljuly31august41997 |