Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors: Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997
Gespeichert in:
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Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Amsterdam [u.a.]
Gordon and Breach
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Schlagworte: | |
Beschreibung: | Literaturangaben. - In: Radiation effects and defects in solids ; ... |
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Datensatz im Suchindex
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author_corporate | Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos do Jordão |
author_corporate_role | aut |
author_facet | Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos do Jordão |
author_sort | Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos do Jordão |
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spelling | Symposium on Defect Dependent Processes in Insulators and Semiconductors 1997 Campos do Jordão Verfasser (DE-588)6014514-6 aut Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 Amsterdam [u.a.] Gordon and Breach txt rdacontent n rdamedia nc rdacarrier Literaturangaben. - In: Radiation effects and defects in solids ; ... Physikalische Eigenschaft (DE-588)4134738-9 gnd rswk-swf Nichtleiter (DE-588)4123451-0 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Halbleiter (DE-588)4022993-2 s DE-604 Nichtleiter (DE-588)4123451-0 s Gitterbaufehler (DE-588)4125030-8 s Physikalische Eigenschaft (DE-588)4134738-9 s Watanabe, Shigueo Sonstige oth |
spellingShingle | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 Physikalische Eigenschaft (DE-588)4134738-9 gnd Nichtleiter (DE-588)4123451-0 gnd Halbleiter (DE-588)4022993-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
subject_GND | (DE-588)4134738-9 (DE-588)4123451-0 (DE-588)4022993-2 (DE-588)4125030-8 (DE-588)1071861417 |
title | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
title_auth | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
title_exact_search | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
title_exact_search_txtP | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
title_full | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
title_fullStr | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
title_full_unstemmed | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
title_short | Proceedings of the Symposium on Defect Dependent Processes in Insulators and Semiconductors |
title_sort | proceedings of the symposium on defect dependent processes in insulators and semiconductors campos de jordao sp brazil july 31 august 4 1997 |
title_sub | Campos de Jordão, Sp, Brazil, July 31 - August 4, 1997 |
topic | Physikalische Eigenschaft (DE-588)4134738-9 gnd Nichtleiter (DE-588)4123451-0 gnd Halbleiter (DE-588)4022993-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
topic_facet | Physikalische Eigenschaft Nichtleiter Halbleiter Gitterbaufehler Konferenzschrift |
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