Proceedings of the ... Asian Test Symposium:
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Los Alamitos, Calif. [u.a.]
IEEE Computer Soc. Press
|
| Schlagworte: |
Internformat
MARC
| LEADER | 00000nam a2200000zca4500 | ||
|---|---|---|---|
| 001 | BV021856302 | ||
| 003 | DE-604 | ||
| 005 | 20111121 | ||
| 007 | t | ||
| 008 | 950620nuuuuuuuu |||| 10||| eng d | ||
| 035 | |a (OCoLC)633684645 | ||
| 035 | |a (DE-599)BVBBV021856302 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 110 | 2 | |a Asian Test Symposium |e Verfasser |0 (DE-588)16147659-4 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the ... Asian Test Symposium |
| 264 | 1 | |a Los Alamitos, Calif. [u.a.] |b IEEE Computer Soc. Press | |
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 0 | 7 | |a Test |0 (DE-588)4059549-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Schaltungsentwurf |0 (DE-588)4179389-4 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | 1 | |a Test |0 (DE-588)4059549-3 |D s |
| 689 | 0 | 2 | |a Schaltungsentwurf |0 (DE-588)4179389-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015072078 | ||
Datensatz im Suchindex
| _version_ | 1804135796030046208 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author_corporate | Asian Test Symposium |
| author_corporate_role | aut |
| author_facet | Asian Test Symposium |
| author_sort | Asian Test Symposium |
| building | Verbundindex |
| bvnumber | BV021856302 |
| ctrlnum | (OCoLC)633684645 (DE-599)BVBBV021856302 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01041nam a2200313zca4500</leader><controlfield tag="001">BV021856302</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20111121 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">950620nuuuuuuuu |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)633684645</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021856302</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">Asian Test Symposium</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)16147659-4</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the ... Asian Test Symposium</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Los Alamitos, Calif. [u.a.]</subfield><subfield code="b">IEEE Computer Soc. Press</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Schaltungsentwurf</subfield><subfield code="0">(DE-588)4179389-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Schaltungsentwurf</subfield><subfield code="0">(DE-588)4179389-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015072078</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV021856302 |
| illustrated | Not Illustrated |
| index_date | 2024-07-02T16:02:51Z |
| indexdate | 2024-07-09T20:46:11Z |
| institution | BVB |
| institution_GND | (DE-588)16147659-4 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015072078 |
| oclc_num | 633684645 |
| open_access_boolean | |
| publishDateSort | 0000 |
| publisher | IEEE Computer Soc. Press |
| record_format | marc |
| spelling | Asian Test Symposium Verfasser (DE-588)16147659-4 aut Proceedings of the ... Asian Test Symposium Los Alamitos, Calif. [u.a.] IEEE Computer Soc. Press txt rdacontent n rdamedia nc rdacarrier Test (DE-588)4059549-3 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Schaltungsentwurf (DE-588)4179389-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content VLSI (DE-588)4117388-0 s Test (DE-588)4059549-3 s Schaltungsentwurf (DE-588)4179389-4 s DE-604 |
| spellingShingle | Proceedings of the ... Asian Test Symposium Test (DE-588)4059549-3 gnd VLSI (DE-588)4117388-0 gnd Schaltungsentwurf (DE-588)4179389-4 gnd |
| subject_GND | (DE-588)4059549-3 (DE-588)4117388-0 (DE-588)4179389-4 (DE-588)1071861417 |
| title | Proceedings of the ... Asian Test Symposium |
| title_auth | Proceedings of the ... Asian Test Symposium |
| title_exact_search | Proceedings of the ... Asian Test Symposium |
| title_exact_search_txtP | Proceedings of the ... Asian Test Symposium |
| title_full | Proceedings of the ... Asian Test Symposium |
| title_fullStr | Proceedings of the ... Asian Test Symposium |
| title_full_unstemmed | Proceedings of the ... Asian Test Symposium |
| title_short | Proceedings of the ... Asian Test Symposium |
| title_sort | proceedings of the asian test symposium |
| topic | Test (DE-588)4059549-3 gnd VLSI (DE-588)4117388-0 gnd Schaltungsentwurf (DE-588)4179389-4 gnd |
| topic_facet | Test VLSI Schaltungsentwurf Konferenzschrift |
| work_keys_str_mv | AT asiantestsymposium proceedingsoftheasiantestsymposium |