Proceedings of the ... IEEE International Conference on Microelectronic Test Structures:
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
New York, NY
IEEE
|
| Schlagworte: | |
| Beschreibung: | Ab 1990 u.d.T.: International Conference on Microelectronic Test Structures: Proceedings of the ... International Conference on Microelectronic Test Structures |
Internformat
MARC
| LEADER | 00000nam a2200000zca4500 | ||
|---|---|---|---|
| 001 | BV021847482 | ||
| 003 | DE-604 | ||
| 005 | 20150729 | ||
| 007 | t | ||
| 008 | 881021nuuuuuuuu |||| 10||| eng d | ||
| 035 | |a (OCoLC)633653545 | ||
| 035 | |a (DE-599)BVBBV021847482 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 111 | 2 | |a International Conference on Microelectronic Test Structures |j Verfasser |0 (DE-588)5014669-5 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the ... IEEE International Conference on Microelectronic Test Structures |
| 264 | 1 | |a New York, NY |b IEEE | |
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Ab 1990 u.d.T.: International Conference on Microelectronic Test Structures: Proceedings of the ... International Conference on Microelectronic Test Structures | ||
| 650 | 0 | 7 | |a Testauswertung |0 (DE-588)4124305-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Testauswertung |0 (DE-588)4124305-5 |D s |
| 689 | 1 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015063266 | ||
Datensatz im Suchindex
| _version_ | 1804135788328255488 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author_corporate | International Conference on Microelectronic Test Structures |
| author_corporate_role | aut |
| author_facet | International Conference on Microelectronic Test Structures |
| author_sort | International Conference on Microelectronic Test Structures |
| building | Verbundindex |
| bvnumber | BV021847482 |
| ctrlnum | (OCoLC)633653545 (DE-599)BVBBV021847482 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01217nam a2200313zca4500</leader><controlfield tag="001">BV021847482</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20150729 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">881021nuuuuuuuu |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)633653545</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021847482</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Conference on Microelectronic Test Structures</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5014669-5</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the ... IEEE International Conference on Microelectronic Test Structures</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">IEEE</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Ab 1990 u.d.T.: International Conference on Microelectronic Test Structures: Proceedings of the ... International Conference on Microelectronic Test Structures</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testauswertung</subfield><subfield code="0">(DE-588)4124305-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Testauswertung</subfield><subfield code="0">(DE-588)4124305-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015063266</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV021847482 |
| illustrated | Not Illustrated |
| index_date | 2024-07-02T16:02:44Z |
| indexdate | 2024-07-09T20:46:04Z |
| institution | BVB |
| institution_GND | (DE-588)5014669-5 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015063266 |
| oclc_num | 633653545 |
| open_access_boolean | |
| publishDateSort | 0000 |
| publisher | IEEE |
| record_format | marc |
| spelling | International Conference on Microelectronic Test Structures Verfasser (DE-588)5014669-5 aut Proceedings of the ... IEEE International Conference on Microelectronic Test Structures New York, NY IEEE txt rdacontent n rdamedia nc rdacarrier Ab 1990 u.d.T.: International Conference on Microelectronic Test Structures: Proceedings of the ... International Conference on Microelectronic Test Structures Testauswertung (DE-588)4124305-5 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Integrierte Schaltung (DE-588)4027242-4 s DE-604 Testauswertung (DE-588)4124305-5 s |
| spellingShingle | Proceedings of the ... IEEE International Conference on Microelectronic Test Structures Testauswertung (DE-588)4124305-5 gnd Integrierte Schaltung (DE-588)4027242-4 gnd |
| subject_GND | (DE-588)4124305-5 (DE-588)4027242-4 (DE-588)1071861417 |
| title | Proceedings of the ... IEEE International Conference on Microelectronic Test Structures |
| title_auth | Proceedings of the ... IEEE International Conference on Microelectronic Test Structures |
| title_exact_search | Proceedings of the ... IEEE International Conference on Microelectronic Test Structures |
| title_exact_search_txtP | Proceedings of the ... IEEE International Conference on Microelectronic Test Structures |
| title_full | Proceedings of the ... IEEE International Conference on Microelectronic Test Structures |
| title_fullStr | Proceedings of the ... IEEE International Conference on Microelectronic Test Structures |
| title_full_unstemmed | Proceedings of the ... IEEE International Conference on Microelectronic Test Structures |
| title_short | Proceedings of the ... IEEE International Conference on Microelectronic Test Structures |
| title_sort | proceedings of the ieee international conference on microelectronic test structures |
| topic | Testauswertung (DE-588)4124305-5 gnd Integrierte Schaltung (DE-588)4027242-4 gnd |
| topic_facet | Testauswertung Integrierte Schaltung Konferenzschrift |
| work_keys_str_mv | AT internationalconferenceonmicroelectronicteststructures proceedingsoftheieeeinternationalconferenceonmicroelectronicteststructures |