Symposium record:
Gespeichert in:
Körperschaft: | |
---|---|
Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
New York, NY
Inst. of Electrical and Electronics Engineers
|
Schlagworte: | |
Beschreibung: | Bis 1982 u.d.T.: International Symposium on Electromagnetic Compatibility: IEEE International Symposium on Electromagnetic Compatibility. - Nationales Symposium u.d.T.: National Symposium on Electromagnetic Compatibility: Symposium record |
Internformat
MARC
LEADER | 00000nam a2200000zca4500 | ||
---|---|---|---|
001 | BV021844357 | ||
003 | DE-604 | ||
005 | 20130312 | ||
007 | t | ||
008 | 870319nuuuuuuuu |||| 10||| eng d | ||
035 | |a (OCoLC)21613441 | ||
035 | |a (DE-599)BVBBV021844357 | ||
040 | |a DE-604 |b ger | ||
041 | 0 | |a eng | |
050 | 0 | |a TK6553 | |
111 | 2 | |a International Symposium on Electromagnetic Compatibility |j Verfasser |0 (DE-588)8763-4 |4 aut | |
245 | 1 | 0 | |a Symposium record |c IEEE International Symposium on Electromagnetic Compatibility |
264 | 1 | |a New York, NY |b Inst. of Electrical and Electronics Engineers | |
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Bis 1982 u.d.T.: International Symposium on Electromagnetic Compatibility: IEEE International Symposium on Electromagnetic Compatibility. - Nationales Symposium u.d.T.: National Symposium on Electromagnetic Compatibility: Symposium record | ||
650 | 4 | |a Radio |x Interference |v Congresses | |
650 | 0 | 7 | |a Elektromagnetische Verträglichkeit |0 (DE-588)4138552-4 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
689 | 0 | 0 | |a Elektromagnetische Verträglichkeit |0 (DE-588)4138552-4 |D s |
689 | 0 | |5 DE-604 | |
710 | 2 | |a Institute of Electrical and Electronics Engineers |e Sonstige |0 (DE-588)1692-5 |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-015060182 |
Datensatz im Suchindex
_version_ | 1804135785677455360 |
---|---|
adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author_corporate | International Symposium on Electromagnetic Compatibility |
author_corporate_role | aut |
author_facet | International Symposium on Electromagnetic Compatibility |
author_sort | International Symposium on Electromagnetic Compatibility |
building | Verbundindex |
bvnumber | BV021844357 |
callnumber-first | T - Technology |
callnumber-label | TK6553 |
callnumber-raw | TK6553 |
callnumber-search | TK6553 |
callnumber-sort | TK 46553 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
ctrlnum | (OCoLC)21613441 (DE-599)BVBBV021844357 |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01377nam a2200313zca4500</leader><controlfield tag="001">BV021844357</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20130312 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">870319nuuuuuuuu |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)21613441</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021844357</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK6553</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Symposium on Electromagnetic Compatibility</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)8763-4</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Symposium record</subfield><subfield code="c">IEEE International Symposium on Electromagnetic Compatibility</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">Inst. of Electrical and Electronics Engineers</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Bis 1982 u.d.T.: International Symposium on Electromagnetic Compatibility: IEEE International Symposium on Electromagnetic Compatibility. - Nationales Symposium u.d.T.: National Symposium on Electromagnetic Compatibility: Symposium record</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Radio</subfield><subfield code="x">Interference</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektromagnetische Verträglichkeit</subfield><subfield code="0">(DE-588)4138552-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektromagnetische Verträglichkeit</subfield><subfield code="0">(DE-588)4138552-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Institute of Electrical and Electronics Engineers</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)1692-5</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015060182</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift gnd-content |
genre_facet | Konferenzschrift |
id | DE-604.BV021844357 |
illustrated | Not Illustrated |
index_date | 2024-07-02T16:02:41Z |
indexdate | 2024-07-09T20:46:02Z |
institution | BVB |
institution_GND | (DE-588)8763-4 (DE-588)1692-5 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015060182 |
oclc_num | 21613441 |
open_access_boolean | |
publishDateSort | 0000 |
publisher | Inst. of Electrical and Electronics Engineers |
record_format | marc |
spelling | International Symposium on Electromagnetic Compatibility Verfasser (DE-588)8763-4 aut Symposium record IEEE International Symposium on Electromagnetic Compatibility New York, NY Inst. of Electrical and Electronics Engineers txt rdacontent n rdamedia nc rdacarrier Bis 1982 u.d.T.: International Symposium on Electromagnetic Compatibility: IEEE International Symposium on Electromagnetic Compatibility. - Nationales Symposium u.d.T.: National Symposium on Electromagnetic Compatibility: Symposium record Radio Interference Congresses Elektromagnetische Verträglichkeit (DE-588)4138552-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Elektromagnetische Verträglichkeit (DE-588)4138552-4 s DE-604 Institute of Electrical and Electronics Engineers Sonstige (DE-588)1692-5 oth |
spellingShingle | Symposium record Radio Interference Congresses Elektromagnetische Verträglichkeit (DE-588)4138552-4 gnd |
subject_GND | (DE-588)4138552-4 (DE-588)1071861417 |
title | Symposium record |
title_auth | Symposium record |
title_exact_search | Symposium record |
title_exact_search_txtP | Symposium record |
title_full | Symposium record IEEE International Symposium on Electromagnetic Compatibility |
title_fullStr | Symposium record IEEE International Symposium on Electromagnetic Compatibility |
title_full_unstemmed | Symposium record IEEE International Symposium on Electromagnetic Compatibility |
title_short | Symposium record |
title_sort | symposium record |
topic | Radio Interference Congresses Elektromagnetische Verträglichkeit (DE-588)4138552-4 gnd |
topic_facet | Radio Interference Congresses Elektromagnetische Verträglichkeit Konferenzschrift |
work_keys_str_mv | AT internationalsymposiumonelectromagneticcompatibility symposiumrecord AT instituteofelectricalandelectronicsengineers symposiumrecord |