Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching: application to rough and natural surfaces ; with 7 tables
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
2006
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| Schriftenreihe: | Nanoscience and technology
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| Schlagworte: | |
| Online-Zugang: | Inhaltstext Inhaltsverzeichnis |
| Beschreibung: | XII, 292 S. Ill., graph. Darst. |
| ISBN: | 9783540284055 3540284052 |
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Datensatz im Suchindex
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| adam_text | G. KAUPP ATOMIC FORCE MICROSCOPY, SCANNING NEARFIELD OPTICAL MICROSCOPY
AND NANOSCRATCHING APPLICATION TO ROUGH AND NATURAL SURFACES WITH 239
FIGURES AND 7 TABLES SPRINGER CONTENTS 1 ATOMIC FORCE MICROSCOPY 1 1.1
INTRODUCTION 1 1.2 BASICS OF CCMTACT AFM 2 1.3 INSTRUMENTAL 3 1.4
VALIDITY CHEEKS 9 1.5 ARTILACTS FF 1.6 SURFACE SCRATCHING AND PLOWING,
LIQUIDS ON THE SURFACC F 7 F .7 MOLECULAR STEPS 22 F .8 AMBIENT SURFACC
MODIFICATIONS 27 1.9 CHEMICAL SURFACE MODELING AND TYPICAL SHAPES OF
TOPOLOGIC FEATURES 31 1.9.1 VOLCANO OR CORIC TYPE 31 1.9.2 ISLANDS 32
1.9.3 CRAFERS 38 1.9.4 POOL BASIN TYPE 43 1.9.5 PRISMATIE FLOES 44 1.9.6
HEIGHTS AND VALLEYS 48 1.9.7 FISSURES 50 1.9.8 BRICKS 52 1.10
SHEAR-FORCC AFM 56 1.11 FURTHER FIELDS OF PRACTICAL APPLICATION 62 F
.11.1 BIOLOGY AND MEDICINE 63 1.11.2 PHARMACY 64 1.11.3 POLYMERS 65
1.11.4 CERAMICS 65 1.11.5 MINCRALOGY AND GEOLOGY 66 1.11.6 MCTALLURGY
AND CORROSION 68 1.11.7 CATALYSIS 69 1.11.8 FORENSICS 70 1.11.9
HISTORICAL OBJECTS 70 X CONTENTS 1.12 ELEETROMAGNETIC AFM 71 1.13
CONCHISIONS 71 REL ERENCES 73 2 SCANNING NEAR-FIELD OPTICAL MICROSCOPY
87 2.1 INTRODUCTION 87 2.2 FOUNDATIONS OF SNOM 88 2.3 EQUIPMENT 95 2.4
OPTICAL RESOLUTION 97 2.5 DEPENDENCE OF THE REFLECTANCE PJNHANCEMENT
FRONI THE SHCAR FORCE 102 2.6 ARTIFACTS 106 2.6.1 TIP BREAKAGE DURING
SCANNING 106 2.6.2 STRIPES CONTRAST 108 2.6.3 INVERTED DERIVATIVE OF THE
TOPOLOGY IN THE OPTICA! RESPONSE 110 2.6.4 INVERTED CONTRAST 112 2.6.5
DISPLACED OPTICAL CONTRAST 113 2.6.6 LOCAL FAR-PIELD LIGHT CONCENTRATION
115 2.6.7 TOPOLOGIC ARTIFACTS 115 2.7 APPLICATION OF SNOM IN SOLID-STATE
CHEMISTRY 118 2.8 PKYSICAL-STATC SNOM CONTRAST 125 2.9 TECHNICAL
APPLICATIONS 127 2.9.1 SNOM ON DENTAL ALLOYS 127 2.9.2 SNOM ON GLAZED
PAPER 129 2.9.3 SNOM ON BLOOD BAGS 132 2.9.4 QUALITY ASSESSMCNT OF MCTAL
SOL PATTICLCS FOR SERS BY SNOM 134 2.10 APPLICATIONS OF SNOM IN BIOLOGY
AND MEDIEINE 135 2.10.1 PREHISTORIC BACTERIUM, PYRITE FORMATION LIPON
PETRIFIKATION 136 2.10.2 SNOM ON A HUMAN TOOTH 136 2.10.3 SNOM ON
POLYMER BEADS 139 2.10.4 SNOM ON CRYO MICROTOME CUTS OF RABBIT, HEART
[61] . . 139 2.10.5 SNOM ON STAINED AND UNSTAINED SHRIMP EYE
PRCPARATIONS [61] 144 2.10.6 SNOM IN CANCER RESEARCH [61] 146 2.11
NEAR-FIELD SPECTROSCOPY 149 2.11.1 DIRECT LOCAL RAMAN SNOM 150 2.11.2
SERS SNOM 151 2.11.3 NEAR-FIELD INFRARED SPECTROSCOPY AND SCANNING
NEAR-FIELD DIELECTRIC MICROSCOPY 153 2.11.4 FLUORESCENCE SNOM 154 2.12
NANOPHOTOLITHOGRAPHY 163 2.13 DIGITAL MICROSCOPY FOR TTOUGH SURFACES 168
CONTENTS XI 2.14 CONCLUSIONS 169 REFERENCES 171 3 NANOINDENTATION 177
3.1 INTRODUCTION 177 3.2 EQUIPRNENT 177 3.3 FOUNDATIONS OF THE
NANOHIDENTATION TECHNIQUE 179 3.3.1 GENERAL REMARKS *. 179 3.3.2 LOAD
DISPLACCMERRT CURVES 179 3.3.3 ANISOTROPY AND FAR-REACHING RESPONSE 182
3.4 ELASTIC AND PLASTIC PARAMETERS 184 3.4.1 NANOHARDNESS 185 3.4.2
REDUCED ELASTIC MODULUS 186 3.4.3 CONTACT AREA AND CONTACT HEIGHT 187
3.4.4 STIFLHCSS AND (COMPLIANCE 189 3.4.5 THE UNLOADING ITERATION
PROCESS 189 3.5 IMPROVED INDENTATION PARAMETERS 193 3.6 LINEAR PLOTS FOR
THC LOADING CURVES - THC NEW UNIVERSAL EXPONENT 3/2 198 3.7 PHASE
TRANSITIONS 204 3.8 THC WORK OF INDENTATION AND ITS ANISOTROPY 206 3.9
R.CCCNT APPROACHES TO NANOHIDENTATION AT HIGHEST RESOLUTION 210 3.10
NANOINDENTATIONS WITH HIGLILY ANISOTROPIE ORGANIC CRYSTALS 211 3.11
NANOIRIDENTATIONS WITH ORGANIC POLYMERS 218 3.12 CONCLUDING REMARKS 221
R.EFCRENCES 223 4 NANOSCRATCHING 229 4.1 INTRODUCTION 229 4.2
FOUNDATIONS OF THE NANOSCRATCHING TECHNIQUE 232 4.3 EQUIPRNENT 234 4.4
THC APPEARANCE OF NANOSCRATCHES 237 4.5 QUANTITATIVE TREATMEIIT OF
NANOSCRATCHING 238 4.5.1 THE RELATION OF LATERAL AND NORMAL FORCE 238
4.5.2 SCRATCH WORK CONSIDERATIONS AND MATHEMATICAL 3/2 JUSTIFICATION OF
THE FL ~ F N RELATION 244 4.5.3 PHASE TRANSITIONS 246 4.5.4 THC RELATION
OF LATERAL FORCE AND NORMAL DISPLACEMENT: CONSISTENCY OF THE NEW 3/2
EXPONENTIAL R.CLATIONSHIPS IN NANOSCRATCHING AND NANOINDCNTATION 252
4.5.5 SCRATCH RESISTANCE 252 4.5.6 ANISOTROPY IN NANOSCRATCHES 255 XII
CONTENTS 4.5.7 MOLCCULAR MIGRATIONS IN ANISOTROPIE MOLECULAR CRYSTALS
257 4.6 SCRATCHING OF ORGANIC POLYMERS 268 4.7 CONCIUSIONS 273
REFERENCES 274 INDEX 279
|
| adam_txt |
G. KAUPP ATOMIC FORCE MICROSCOPY, SCANNING NEARFIELD OPTICAL MICROSCOPY
AND NANOSCRATCHING APPLICATION TO ROUGH AND NATURAL SURFACES WITH 239
FIGURES AND 7 TABLES SPRINGER CONTENTS 1 ATOMIC FORCE MICROSCOPY 1 1.1
INTRODUCTION 1 1.2 BASICS OF CCMTACT AFM 2 1.3 INSTRUMENTAL 3 1.4
VALIDITY CHEEKS 9 1.5 ARTILACTS FF 1.6 SURFACE SCRATCHING AND PLOWING,
LIQUIDS ON THE SURFACC F 7 F .7 MOLECULAR STEPS 22 F .8 AMBIENT SURFACC
MODIFICATIONS 27 1.9 CHEMICAL SURFACE MODELING AND TYPICAL SHAPES OF
TOPOLOGIC FEATURES 31 1.9.1 VOLCANO OR CORIC TYPE 31 1.9.2 ISLANDS 32
1.9.3 CRAFERS 38 1.9.4 POOL BASIN TYPE 43 1.9.5 PRISMATIE FLOES 44 1.9.6
HEIGHTS AND VALLEYS 48 1.9.7 FISSURES 50 1.9.8 BRICKS 52 1.10
SHEAR-FORCC AFM 56 1.11 FURTHER FIELDS OF PRACTICAL APPLICATION 62 F
.11.1 BIOLOGY AND MEDICINE 63 1.11.2 PHARMACY 64 1.11.3 POLYMERS 65
1.11.4 CERAMICS 65 1.11.5 MINCRALOGY AND GEOLOGY 66 1.11.6 MCTALLURGY
AND CORROSION 68 1.11.7 CATALYSIS 69 1.11.8 FORENSICS 70 1.11.9
HISTORICAL OBJECTS 70 X CONTENTS 1.12 ELEETROMAGNETIC AFM 71 1.13
CONCHISIONS 71 REL'ERENCES 73 2 SCANNING NEAR-FIELD OPTICAL MICROSCOPY
87 2.1 INTRODUCTION 87 2.2 FOUNDATIONS OF SNOM 88 2.3 EQUIPMENT 95 2.4
OPTICAL RESOLUTION 97 2.5 DEPENDENCE OF THE REFLECTANCE PJNHANCEMENT
FRONI THE SHCAR FORCE 102 2.6 ARTIFACTS 106 2.6.1 TIP BREAKAGE DURING
SCANNING 106 2.6.2 STRIPES CONTRAST 108 2.6.3 INVERTED DERIVATIVE OF THE
TOPOLOGY IN THE OPTICA! RESPONSE 110 2.6.4 INVERTED CONTRAST 112 2.6.5
DISPLACED OPTICAL CONTRAST 113 2.6.6 LOCAL FAR-PIELD LIGHT CONCENTRATION
115 2.6.7 TOPOLOGIC ARTIFACTS 115 2.7 APPLICATION OF SNOM IN SOLID-STATE
CHEMISTRY 118 2.8 PKYSICAL-STATC SNOM CONTRAST 125 2.9 TECHNICAL
APPLICATIONS 127 2.9.1 SNOM ON DENTAL ALLOYS 127 2.9.2 SNOM ON GLAZED
PAPER 129 2.9.3 SNOM ON BLOOD BAGS 132 2.9.4 QUALITY ASSESSMCNT OF MCTAL
SOL PATTICLCS FOR SERS BY SNOM 134 2.10 APPLICATIONS OF SNOM IN BIOLOGY
AND MEDIEINE 135 2.10.1 PREHISTORIC BACTERIUM, PYRITE FORMATION LIPON
PETRIFIKATION 136 2.10.2 SNOM ON A HUMAN TOOTH 136 2.10.3 SNOM ON
POLYMER BEADS 139 2.10.4 SNOM ON CRYO MICROTOME CUTS OF RABBIT, HEART
[61] . . 139 2.10.5 SNOM ON STAINED AND UNSTAINED SHRIMP EYE
PRCPARATIONS [61] 144 2.10.6 SNOM IN CANCER RESEARCH [61] 146 2.11
NEAR-FIELD SPECTROSCOPY 149 2.11.1 DIRECT LOCAL RAMAN SNOM 150 2.11.2
SERS SNOM 151 2.11.3 NEAR-FIELD INFRARED SPECTROSCOPY AND SCANNING
NEAR-FIELD DIELECTRIC MICROSCOPY 153 2.11.4 FLUORESCENCE SNOM 154 2.12
NANOPHOTOLITHOGRAPHY 163 2.13 DIGITAL MICROSCOPY FOR TTOUGH SURFACES 168
CONTENTS XI 2.14 CONCLUSIONS 169 REFERENCES 171 3 NANOINDENTATION 177
3.1 INTRODUCTION 177 3.2 EQUIPRNENT 177 3.3 FOUNDATIONS OF THE
NANOHIDENTATION TECHNIQUE 179 3.3.1 GENERAL REMARKS *. 179 3.3.2 LOAD
DISPLACCMERRT CURVES 179 3.3.3 ANISOTROPY AND FAR-REACHING RESPONSE 182
3.4 ELASTIC AND PLASTIC PARAMETERS 184 3.4.1 NANOHARDNESS 185 3.4.2
REDUCED ELASTIC MODULUS 186 3.4.3 CONTACT AREA AND CONTACT HEIGHT 187
3.4.4 STIFLHCSS AND (COMPLIANCE 189 3.4.5 THE UNLOADING ITERATION
PROCESS 189 3.5 IMPROVED INDENTATION PARAMETERS 193 3.6 LINEAR PLOTS FOR
THC LOADING CURVES - THC NEW UNIVERSAL EXPONENT 3/2 198 3.7 PHASE
TRANSITIONS 204 3.8 THC WORK OF INDENTATION AND ITS ANISOTROPY 206 3.9
R.CCCNT APPROACHES TO NANOHIDENTATION AT HIGHEST RESOLUTION 210 3.10
NANOINDENTATIONS WITH HIGLILY ANISOTROPIE ORGANIC CRYSTALS 211 3.11
NANOIRIDENTATIONS WITH ORGANIC POLYMERS 218 3.12 CONCLUDING REMARKS 221
R.EFCRENCES 223 4 NANOSCRATCHING 229 4.1 INTRODUCTION 229 4.2
FOUNDATIONS OF THE NANOSCRATCHING TECHNIQUE 232 4.3 EQUIPRNENT 234 4.4
THC APPEARANCE OF NANOSCRATCHES 237 4.5 QUANTITATIVE TREATMEIIT OF
NANOSCRATCHING 238 4.5.1 THE RELATION OF LATERAL AND NORMAL FORCE 238
4.5.2 SCRATCH WORK CONSIDERATIONS AND MATHEMATICAL 3/2 JUSTIFICATION OF
THE FL ~ F N RELATION 244 4.5.3 PHASE TRANSITIONS 246 4.5.4 THC RELATION
OF LATERAL FORCE AND NORMAL DISPLACEMENT: CONSISTENCY OF THE NEW 3/2
EXPONENTIAL R.CLATIONSHIPS IN NANOSCRATCHING AND NANOINDCNTATION 252
4.5.5 SCRATCH RESISTANCE 252 4.5.6 ANISOTROPY IN NANOSCRATCHES 255 XII
CONTENTS 4.5.7 MOLCCULAR MIGRATIONS IN ANISOTROPIE MOLECULAR CRYSTALS
257 4.6 SCRATCHING OF ORGANIC POLYMERS 268 4.7 CONCIUSIONS 273
REFERENCES 274 INDEX 279 |
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| author | Kaupp, Gerd |
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| dewey-full | 530 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530 |
| dewey-search | 530 |
| dewey-sort | 3530 |
| dewey-tens | 530 - Physics |
| discipline | Maschinenbau / Maschinenwesen Physik |
| discipline_str_mv | Maschinenbau / Maschinenwesen Physik |
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| id | DE-604.BV021823845 |
| illustrated | Illustrated |
| index_date | 2024-07-02T15:55:04Z |
| indexdate | 2024-07-09T20:45:28Z |
| institution | BVB |
| isbn | 9783540284055 3540284052 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015035954 |
| oclc_num | 315258482 |
| open_access_boolean | |
| owner | DE-703 DE-20 |
| owner_facet | DE-703 DE-20 |
| physical | XII, 292 S. Ill., graph. Darst. |
| publishDate | 2006 |
| publishDateSearch | 2006 |
| publishDateSort | 2006 |
| publisher | Springer |
| record_format | marc |
| series2 | Nanoscience and technology |
| spelling | Kaupp, Gerd Verfasser (DE-588)106272020 aut Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching application to rough and natural surfaces ; with 7 tables G. Kaupp Berlin [u.a.] Springer 2006 XII, 292 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Nanoscience and technology Ritzhärte (DE-588)4341899-5 gnd rswk-swf Optische Nahfeldmikroskopie (DE-588)4380320-9 gnd rswk-swf Härteprüfung (DE-588)4022844-7 gnd rswk-swf Härteeindruck (DE-588)4703729-5 gnd rswk-swf Nanometerbereich (DE-588)4327473-0 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Oberfläche (DE-588)4042907-6 gnd rswk-swf Oberfläche (DE-588)4042907-6 s Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Optische Nahfeldmikroskopie (DE-588)4380320-9 s Härteeindruck (DE-588)4703729-5 s Nanometerbereich (DE-588)4327473-0 s Ritzhärte (DE-588)4341899-5 s Härteprüfung (DE-588)4022844-7 s text/html http://deposit.dnb.de/cgi-bin/dokserv?id=2668954&prov=M&dok_var=1&dok_ext=htm Inhaltstext GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=015035954&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Kaupp, Gerd Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching application to rough and natural surfaces ; with 7 tables Ritzhärte (DE-588)4341899-5 gnd Optische Nahfeldmikroskopie (DE-588)4380320-9 gnd Härteprüfung (DE-588)4022844-7 gnd Härteeindruck (DE-588)4703729-5 gnd Nanometerbereich (DE-588)4327473-0 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd Oberfläche (DE-588)4042907-6 gnd |
| subject_GND | (DE-588)4341899-5 (DE-588)4380320-9 (DE-588)4022844-7 (DE-588)4703729-5 (DE-588)4327473-0 (DE-588)4274473-8 (DE-588)4042907-6 |
| title | Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching application to rough and natural surfaces ; with 7 tables |
| title_auth | Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching application to rough and natural surfaces ; with 7 tables |
| title_exact_search | Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching application to rough and natural surfaces ; with 7 tables |
| title_exact_search_txtP | Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching application to rough and natural surfaces ; with 7 tables |
| title_full | Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching application to rough and natural surfaces ; with 7 tables G. Kaupp |
| title_fullStr | Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching application to rough and natural surfaces ; with 7 tables G. Kaupp |
| title_full_unstemmed | Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching application to rough and natural surfaces ; with 7 tables G. Kaupp |
| title_short | Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching |
| title_sort | atomic force microscopy scanning nearfield optical microscopy and nanoscratching application to rough and natural surfaces with 7 tables |
| title_sub | application to rough and natural surfaces ; with 7 tables |
| topic | Ritzhärte (DE-588)4341899-5 gnd Optische Nahfeldmikroskopie (DE-588)4380320-9 gnd Härteprüfung (DE-588)4022844-7 gnd Härteeindruck (DE-588)4703729-5 gnd Nanometerbereich (DE-588)4327473-0 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd Oberfläche (DE-588)4042907-6 gnd |
| topic_facet | Ritzhärte Optische Nahfeldmikroskopie Härteprüfung Härteeindruck Nanometerbereich Rasterkraftmikroskopie Oberfläche |
| url | http://deposit.dnb.de/cgi-bin/dokserv?id=2668954&prov=M&dok_var=1&dok_ext=htm http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=015035954&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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