ITC - International Test Conference 2000: October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM]
Saved in:
| Format: | Electronic Conference Proceeding Software eBook |
|---|---|
| Language: | English |
| Published: |
Piscataway, NJ
IEEE
2000
|
| Subjects: | |
| Physical Description: | 1 CD-ROM 12 cm |
| ISBN: | 0780365496 |
Staff View
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| physical | 1 CD-ROM 12 cm |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | IEEE |
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| spelling | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] Piscataway, NJ IEEE 2000 1 CD-ROM 12 cm txt rdacontent c rdamedia cd rdacarrier Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 03.10.2000-05.10.2000 Atlantic City, NJ gnd-content Mikroelektronik (DE-588)4039207-7 s Prüftechnik (DE-588)4047610-8 s DE-604 International Test Conference 31 2000 Atlantic City, NJ Sonstige (DE-588)6027040-8 oth |
| spellingShingle | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4039207-7 (DE-588)4047610-8 (DE-588)1071861417 |
| title | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| title_auth | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| title_exact_search | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| title_exact_search_txtP | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| title_full | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| title_fullStr | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| title_full_unstemmed | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| title_short | ITC - International Test Conference 2000 |
| title_sort | itc international test conference 2000 october 3 5 2000 atlantic city nj usa test challenges of faster and smaller technologies proceedings on cd rom |
| title_sub | October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| topic | Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Mikroelektronik Prüftechnik Konferenzschrift 03.10.2000-05.10.2000 Atlantic City, NJ |
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