ITC - International Test Conference 2000: October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM]
Gespeichert in:
| Format: | Elektronisch Tagungsbericht Software E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Piscataway, NJ
IEEE
2000
|
| Schlagworte: | |
| Beschreibung: | 1 CD-ROM 12 cm |
| ISBN: | 0780365496 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV021786485 | ||
| 003 | DE-604 | ||
| 005 | 20220224 | ||
| 006 | a |||| 10||| | ||
| 007 | co|uuu---uuuuu | ||
| 008 | 061027s2000 xxu|||| q||u| ||||||eng d | ||
| 020 | |a 0780365496 |9 0-7803-6549-6 | ||
| 035 | |a (OCoLC)635337266 | ||
| 035 | |a (DE-599)BVBBV021786485 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 044 | |a xxu |c US | ||
| 049 | |a DE-29T | ||
| 245 | 1 | 0 | |a ITC - International Test Conference 2000 |b October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| 264 | 1 | |a Piscataway, NJ |b IEEE |c 2000 | |
| 300 | |a 1 CD-ROM |c 12 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cd |2 rdacarrier | ||
| 650 | 0 | 7 | |a Mikroelektronik |0 (DE-588)4039207-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 03.10.2000-05.10.2000 |z Atlantic City, NJ |2 gnd-content | |
| 689 | 0 | 0 | |a Mikroelektronik |0 (DE-588)4039207-7 |D s |
| 689 | 0 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 711 | 2 | |a International Test Conference |n 31 |d 2000 |c Atlantic City, NJ |j Sonstige |0 (DE-588)6027040-8 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-014999196 | ||
Datensatz im Suchindex
| _version_ | 1804135661916127232 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| building | Verbundindex |
| bvnumber | BV021786485 |
| ctrlnum | (OCoLC)635337266 (DE-599)BVBBV021786485 |
| format | Electronic Conference Proceeding Software eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01298nmm a2200349zc 4500</leader><controlfield tag="001">BV021786485</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20220224 </controlfield><controlfield tag="006">a |||| 10||| </controlfield><controlfield tag="007">co|uuu---uuuuu</controlfield><controlfield tag="008">061027s2000 xxu|||| q||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780365496</subfield><subfield code="9">0-7803-6549-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)635337266</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021786485</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">US</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">ITC - International Test Conference 2000</subfield><subfield code="b">October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM]</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, NJ</subfield><subfield code="b">IEEE</subfield><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 CD-ROM</subfield><subfield code="c">12 cm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cd</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">03.10.2000-05.10.2000</subfield><subfield code="z">Atlantic City, NJ</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">International Test Conference</subfield><subfield code="n">31</subfield><subfield code="d">2000</subfield><subfield code="c">Atlantic City, NJ</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)6027040-8</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-014999196</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 03.10.2000-05.10.2000 Atlantic City, NJ gnd-content |
| genre_facet | Konferenzschrift 03.10.2000-05.10.2000 Atlantic City, NJ |
| id | DE-604.BV021786485 |
| illustrated | Not Illustrated |
| index_date | 2024-07-02T15:43:05Z |
| indexdate | 2024-07-09T20:44:04Z |
| institution | BVB |
| institution_GND | (DE-588)6027040-8 |
| isbn | 0780365496 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-014999196 |
| oclc_num | 635337266 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | 1 CD-ROM 12 cm |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | IEEE |
| record_format | marc |
| spelling | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] Piscataway, NJ IEEE 2000 1 CD-ROM 12 cm txt rdacontent c rdamedia cd rdacarrier Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 03.10.2000-05.10.2000 Atlantic City, NJ gnd-content Mikroelektronik (DE-588)4039207-7 s Prüftechnik (DE-588)4047610-8 s DE-604 International Test Conference 31 2000 Atlantic City, NJ Sonstige (DE-588)6027040-8 oth |
| spellingShingle | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4039207-7 (DE-588)4047610-8 (DE-588)1071861417 |
| title | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| title_auth | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| title_exact_search | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| title_exact_search_txtP | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| title_full | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| title_fullStr | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| title_full_unstemmed | ITC - International Test Conference 2000 October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| title_short | ITC - International Test Conference 2000 |
| title_sort | itc international test conference 2000 october 3 5 2000 atlantic city nj usa test challenges of faster and smaller technologies proceedings on cd rom |
| title_sub | October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM] |
| topic | Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Mikroelektronik Prüftechnik Konferenzschrift 03.10.2000-05.10.2000 Atlantic City, NJ |
| work_keys_str_mv | AT internationaltestconferenceatlanticcitynj itcinternationaltestconference2000october352000atlanticcitynjusatestchallengesoffasterandsmallertechnologiesproceedingsoncdrom |