APA-Zitierstil (7. Ausg.)

(2000). ITC - International Test Conference 2000: October 3 - 5, 2000, Atlantic City, NJ, USA ; test challenges of faster and smaller technologies ; [proceedings on CD-ROM]. IEEE.

Chicago-Zitierstil (17. Ausg.)

ITC - International Test Conference 2000: October 3 - 5, 2000, Atlantic City, NJ, USA ; Test Challenges of Faster and Smaller Technologies ; [proceedings on CD-ROM]. Piscataway, NJ: IEEE, 2000.

MLA-Zitierstil (9. Ausg.)

ITC - International Test Conference 2000: October 3 - 5, 2000, Atlantic City, NJ, USA ; Test Challenges of Faster and Smaller Technologies ; [proceedings on CD-ROM]. IEEE, 2000.