(2006). Structural, syntactic, and statistical pattern recognition: Joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings. Springer.
Chicago Style (17th ed.) CitationStructural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; Proceedings. Berlin [u.a.]: Springer, 2006.
MLA (9th ed.) CitationStructural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; Proceedings. Springer, 2006.
Warning: These citations may not always be 100% accurate.