Structural, syntactic, and statistical pattern recognition: joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
2006
|
| Schriftenreihe: | Lecture notes in computer science
4109 |
| Schlagworte: | |
| Online-Zugang: | Inhaltstext http://deposit.dnb.de/cgi-bin/dokserv?id=2837104&prov=M&dok0331var=1&dok0331ext=htm |
| Beschreibung: | XXI, 939 S. Ill., graph. Darst. |
| ISBN: | 9783540372363 3540372369 |
Internformat
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| index_date | 2024-07-02T15:25:55Z |
| indexdate | 2025-01-10T15:08:26Z |
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| physical | XXI, 939 S. Ill., graph. Darst. |
| publishDate | 2006 |
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| series | Lecture notes in computer science |
| series2 | Lecture notes in computer science |
| spelling | Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings Dit-Yan Yeung ... (eds.) Berlin [u.a.] Springer 2006 XXI, 939 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Lecture notes in computer science 4109 Mustererkennung (DE-588)4040936-3 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2006 Hongkong gnd-content Mustererkennung (DE-588)4040936-3 s DE-604 Yeung, Dit-Yan Sonstige oth SSPR 11 2006 Hongkong Sonstige (DE-588)6058518-3 oth SPR 6 2006 Hongkong Sonstige (DE-588)6058520-1 oth Lecture notes in computer science 4109 (DE-604)BV000000607 4109 text/html http://deposit.dnb.de/cgi-bin/dokserv?id=2837104&prov=M&dok_var=1&dok_ext=htm Inhaltstext http://deposit.dnb.de/cgi-bin/dokserv?id=2837104&prov=M&dok0331var=1&dok0331ext=htm |
| spellingShingle | Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings Lecture notes in computer science Mustererkennung (DE-588)4040936-3 gnd |
| subject_GND | (DE-588)4040936-3 (DE-588)1071861417 |
| title | Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings |
| title_auth | Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings |
| title_exact_search | Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings |
| title_exact_search_txtP | Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings |
| title_full | Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings Dit-Yan Yeung ... (eds.) |
| title_fullStr | Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings Dit-Yan Yeung ... (eds.) |
| title_full_unstemmed | Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings Dit-Yan Yeung ... (eds.) |
| title_short | Structural, syntactic, and statistical pattern recognition |
| title_sort | structural syntactic and statistical pattern recognition joint iapr international workshops sspr 2006 and spr 2006 hong kong china august 17 19 2006 proceedings |
| title_sub | joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 ; proceedings |
| topic | Mustererkennung (DE-588)4040936-3 gnd |
| topic_facet | Mustererkennung Konferenzschrift 2006 Hongkong |
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