Special issue on functional source imaging:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York, NY [u.a.]
Inst. of Electrical and Electronics Engineers
2006
|
| Schriftenreihe: | IEEE transactions on biomedical engineering
53,9 |
| Beschreibung: | Einzelaufnahme eines Zeitschr.-H. |
| Beschreibung: | S. 1729 - 1858 Ill., graph. Darst. |
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| publishDate | 2006 |
| publishDateSearch | 2006 |
| publishDateSort | 2006 |
| publisher | Inst. of Electrical and Electronics Engineers |
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| series2 | IEEE transactions on biomedical engineering |
| spelling | Special issue on functional source imaging [Bin He, guest ed. ...] Functional source imaging New York, NY [u.a.] Inst. of Electrical and Electronics Engineers 2006 S. 1729 - 1858 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier IEEE transactions on biomedical engineering 53,9 Einzelaufnahme eines Zeitschr.-H. He, Bin Sonstige oth |
| spellingShingle | Special issue on functional source imaging |
| title | Special issue on functional source imaging |
| title_alt | Functional source imaging |
| title_auth | Special issue on functional source imaging |
| title_exact_search | Special issue on functional source imaging |
| title_exact_search_txtP | Special issue on functional source imaging |
| title_full | Special issue on functional source imaging [Bin He, guest ed. ...] |
| title_fullStr | Special issue on functional source imaging [Bin He, guest ed. ...] |
| title_full_unstemmed | Special issue on functional source imaging [Bin He, guest ed. ...] |
| title_short | Special issue on functional source imaging |
| title_sort | special issue on functional source imaging |
| work_keys_str_mv | AT hebin specialissueonfunctionalsourceimaging AT hebin functionalsourceimaging |