Foster, A., & Hofer, W. A. (2006). Scanning probe microscopy: Atomic scale engineering by forces and currents. Springer.
Chicago Style (17th ed.) CitationFoster, Adam, and Werner A. Hofer. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. Berin [u.a.]: Springer, 2006.
MLA (9th ed.) CitationFoster, Adam, and Werner A. Hofer. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. Springer, 2006.
Warning: These citations may not always be 100% accurate.