Embedded processor-based self-test:
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boston u.a.
Kluwer
2004
|
| Schriftenreihe: | Frontiers in electronic testing
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XIV, 216 S. graph. Darst. |
| ISBN: | 1402027850 |
Internformat
MARC
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| 100 | 1 | |a Gizopoulos, Dimitris |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Embedded processor-based self-test |c by Dimitris Gizopoulos, Antonis Paschalis and Yervant Zorian |
| 264 | 1 | |a Boston u.a. |b Kluwer |c 2004 | |
| 300 | |a XIV, 216 S. |b graph. Darst. | ||
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| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Frontiers in electronic testing | |
| 650 | 4 | |a Computer engineering | |
| 650 | 4 | |a Electronic circuits |x Testing | |
| 700 | 1 | |a Paschalis, Antonis |e Verfasser |4 aut | |
| 700 | 1 | |a Zorian, Yervant |e Verfasser |4 aut | |
| 856 | 4 | 2 | |m GBV Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=014871404&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
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Datensatz im Suchindex
| _version_ | 1804135466057859072 |
|---|---|
| adam_text | EMBEDDED PROCESSOR-BASED SELF-TEST BY DIMITRIS GIZOPOULOS UNIVERSITY
OFPIRAEUS, PIRAEUS, GREECE ANTONIS PASCHALIS UNIVERSITY OF ATHENS,
ATHENS, GREECE AND YERVANT ZORIAN VIRAGE LOGIC, FREMONT, CALIFORNIA,
U.S.A. KLUWER ACADEMIC PUBLISHERS BOSTON / DORDRECHT / LONDON CONTENTS
CONTENTS LIST OF FIGURES LISTOF TABLES PREFACE ACKNOWLEDGMENTS
L.INTRODUCTION V VIII IX XIII XV 1 1.1 BOOK MOTIVATION AND OBJECTIVES 1
1.2 BOOK ORGANIZATION 4 2. DESIGN OF PROCESSOR-BASED SOC 7 2.1
INTEGRATED CIRCUITS TECHNOLOGY 7 2.2 EMBEDDED CORE-BASED SYSTEM-ON-CHIP
DESIGN 8 2.3 EMBEDDED PROCESSORS IN SOC ARCHITECTURES 11 3. TESTING OF
PROCESSOR-BASED SOC 21 3.1 TESTING AND DESIGN FOR TESTABILITY 21 3.2
HARDWARE-BASED SELF-TESTING 32 3.3 SOFTWARE-BASED SELF-TESTING 41 3.4
SOFTWARE-BASED SELF-TEST AND TEST RESOURCE PARTITIONING 46 3.5 WHY IS
EMBEDDED PROCESSOR TESTING IMPORTANT? 48 3.6 WHY IS EMBEDDED PROCESSOR
TESTING CHALLENGING? 49 4. PROCESSOR TESTING TECHNIQUES 55 4.1 PROCESSOR
TESTING TECHNIQUES OBJECTIVES 55 4.1.1 EXTERNAL TESTING VERSUS
SELF-TESTING 56 4.1.2 DFT-BASED TESTING VERSUS NON-INTRUSIVE TESTING 57
4.1.3 FUNCTIONAL TESTING VERSUS STRUCTURAL TESTING 58 4.1.4
COMBINATIONAL FAULTS VERSUS SEQUENTIAL FAULTS TESTING 59 4.1.5
PSEUDORANDOM VERSUS DETERMINISTIC TESTING 60 4.1.6 TESTING VERSUS
DIAGNOSIS 62 4.1.7 MANUFACTURING TESTING VERSUS ON-LINE/FIELD TESTING 63
4.1.8 MICROPROCESSOR VERSUS DSP TESTING 63 4.2 PROCESSOR TESTING
LITERATURE 64 4.2.1 CHRONOLOGICAL LIST OF PROCESSOR TESTING RESEARCH 64
4.2.2 INDUSTRIAL MICROPROCESSORS TESTING 78 4.3 CLASSIFICATION OF THE
PROCESSOR TESTING METHODOLOGIES 78 5. SOFTWARE-BASED PROCESSOR
SELF-TESTING 81 5.1 SOFTWARE-BASED SELF-TESTING CONCEPT AND FLOW 82 5.2
SOFTWARE-BASED SELF-TESTING REQUIREMENTS 87 5.2.1 FAULT COVERAGE AND
TEST QUALITY 88 5.2.2 TEST ENGINEERING EFFORT FOR SELF-TEST GENERATION
90 VI CONTENTS 5.2.3 TEST APPLICATION TIME 91 5.2.4 A NEW SELF-TESTING
EFFICIENCY MEASURE 96 5.2.5 EMBEDDED MEMORY SIZE FOR SELF-TEST EXECUTION
97 5.2.6 KNOWLEDGE OF PROCESSOR ARCHITECTURE 98 5.2.7 COMPONENT BASED
SELF-TEST CODE DEVELOPMENT 99 5.3 SOFTWARE-BASED SELF-TEST METHODOLOGY
OVERVIEW 100 5.4 PROCESSOR COMPONENTS CLASSIFICATION 107 5.4.1
FUNCTIONAL COMPONENTS 108 5.4.2 CONTROL COMPONENTS 111 5.4.3 HIDDEN
COMPONENTS 112 5.5 PROCESSOR COMPONENTS TEST PRIORITIZATION 113 5.5.1
COMPONENT SIZE AND CONTRIBUTION TO FAULT COVERAGE 115 5.5.2 COMPONENT
ACCESSIBILITY AND EASE OF TEST 117 5.5.3 COMPONENTS TESTABILITY
CORRELATION 119 5.6 COMPONENT OPERATIONS IDENTIFICATION AND SELECTION
121 5.7 OPERAND SELECTION 124 5.7.1 SELF-TEST ROUTINE DEVELOPMENT: ATPG
125 5.7.2 SELF-TEST ROUTINE DEVELOPMENT: PSEUDORANDOM 133 5.7.3
SELF-TEST ROUTINE DEVELOPMENT: PRE-COMPUTED TESTS 137 5.7.4 SELF-TEST
ROUTINE DEVELOPMENT: STYLE SELECTION 139 5.8 TEST DEVELOPMENT FOR
PROCESSOR COMPONENTS 141 5.8.1 TEST DEVELOPMENT FOR FUNCTIONAL
COMPONENTS 141 5.8.2 TEST DEVELOPMENT FOR CONTROL COMPONENTS 141 5.8.3
TEST DEVELOPMENT FOR HIDDEN COMPONENTS 143 5.9 TEST RESPONSES COMPACTION
IN SOFTWARE-BASED SELF-TESTING 146 5.10 OPTIMIZATION OF SELF-TEST
ROUTINES 148 5.10.1 CHAINED COMPONENT TESTING 149 5.10.2 PARALLEL
COMPONENT TESTING 152 5.11 SOFTWARE-BASED SELF-TESTING AUTOMATION 153 6.
CASE STUDIES - EXPERTMENTAL RESULTS 157 6.1 PARWAN PROCESSOR CORE 158
6.1.1 SOFTWARE-BASED SELF-TESTING OF PARWAN 159 6.2 PLASMA/MIPS
PROCESSOR CORE 160 6.2.1 SOFTWARE-BASED SELF-TESTING OF PLASMA/MIPS
163 6.3 MEISTER/MIPS RECONFIGURABLE PROCESSOR CORE 168 6.3.1
SOFTWARE-BASED SELF-TESTING OF MEISTER/MIPS 170 6.4 JAM PROCESSOR CORE
171 6.4.1 SOFTWARE-BASED SELF-TESTING OF JAM 172 6.5 OC8051
MICROCONTROLLER CORE 173 6.5.1 SOFTWARE-BASED SELF-TESTING OF OC8051 175
6.6 RISC-MCU MICROCONTROLLER CORE 176 6.6.1 SOFTWARE-BASED SELF-TESTING
OF RISC-MCU 177 CONTENTS VII 6.7 OC54X DSP CORE 178 6.7.1 SOFTWARE-BASED
SELF-TESTING OF OC54X 179 6.8 COMPACTIONOFTESTRESPONSES 181 6.9 SUMMARY
OF BENCHMARKS 181 7. PROCESSOR-BASED TESTING OF SOC 185 7.1 THE CONCEPT
185 7.1.1 METHODOLOGY ADVANTAGES AND OBJECTIVES 188 7.2 LITERATURE
REVIEW 190 7.3 RESEARCH FOCUS IN PROCESSOR-BASED SOC TESTING 193 8.
CONCLUSIONS 195 REFERENCES 197 INDEX 213 ABOUT THE AUTHORS 217
|
| adam_txt |
EMBEDDED PROCESSOR-BASED SELF-TEST BY DIMITRIS GIZOPOULOS UNIVERSITY
OFPIRAEUS, PIRAEUS, GREECE ANTONIS PASCHALIS UNIVERSITY OF ATHENS,
ATHENS, GREECE AND YERVANT ZORIAN VIRAGE LOGIC, FREMONT, CALIFORNIA,
U.S.A. KLUWER ACADEMIC PUBLISHERS BOSTON / DORDRECHT / LONDON CONTENTS
CONTENTS LIST OF FIGURES LISTOF TABLES PREFACE ACKNOWLEDGMENTS
L.INTRODUCTION V VIII IX XIII XV 1 1.1 BOOK MOTIVATION AND OBJECTIVES 1
1.2 BOOK ORGANIZATION 4 2. DESIGN OF PROCESSOR-BASED SOC 7 2.1
INTEGRATED CIRCUITS TECHNOLOGY 7 2.2 EMBEDDED CORE-BASED SYSTEM-ON-CHIP
DESIGN 8 2.3 EMBEDDED PROCESSORS IN SOC ARCHITECTURES 11 3. TESTING OF
PROCESSOR-BASED SOC 21 3.1 TESTING AND DESIGN FOR TESTABILITY 21 3.2
HARDWARE-BASED SELF-TESTING 32 3.3 SOFTWARE-BASED SELF-TESTING 41 3.4
SOFTWARE-BASED SELF-TEST AND TEST RESOURCE PARTITIONING 46 3.5 WHY IS
EMBEDDED PROCESSOR TESTING IMPORTANT? 48 3.6 WHY IS EMBEDDED PROCESSOR
TESTING CHALLENGING? 49 4. PROCESSOR TESTING TECHNIQUES 55 4.1 PROCESSOR
TESTING TECHNIQUES OBJECTIVES 55 4.1.1 EXTERNAL TESTING VERSUS
SELF-TESTING 56 4.1.2 DFT-BASED TESTING VERSUS NON-INTRUSIVE TESTING 57
4.1.3 FUNCTIONAL TESTING VERSUS STRUCTURAL TESTING 58 4.1.4
COMBINATIONAL FAULTS VERSUS SEQUENTIAL FAULTS TESTING 59 4.1.5
PSEUDORANDOM VERSUS DETERMINISTIC TESTING 60 4.1.6 TESTING VERSUS
DIAGNOSIS 62 4.1.7 MANUFACTURING TESTING VERSUS ON-LINE/FIELD TESTING 63
4.1.8 MICROPROCESSOR VERSUS DSP TESTING 63 4.2 PROCESSOR TESTING
LITERATURE 64 4.2.1 CHRONOLOGICAL LIST OF PROCESSOR TESTING RESEARCH 64
4.2.2 INDUSTRIAL MICROPROCESSORS TESTING 78 4.3 CLASSIFICATION OF THE
PROCESSOR TESTING METHODOLOGIES 78 5. SOFTWARE-BASED PROCESSOR
SELF-TESTING 81 5.1 SOFTWARE-BASED SELF-TESTING CONCEPT AND FLOW 82 5.2
SOFTWARE-BASED SELF-TESTING REQUIREMENTS 87 5.2.1 FAULT COVERAGE AND
TEST QUALITY 88 5.2.2 TEST ENGINEERING EFFORT FOR SELF-TEST GENERATION
90 VI CONTENTS 5.2.3 TEST APPLICATION TIME 91 5.2.4 A NEW SELF-TESTING
EFFICIENCY MEASURE 96 5.2.5 EMBEDDED MEMORY SIZE FOR SELF-TEST EXECUTION
97 5.2.6 KNOWLEDGE OF PROCESSOR ARCHITECTURE 98 5.2.7 COMPONENT BASED
SELF-TEST CODE DEVELOPMENT 99 5.3 SOFTWARE-BASED SELF-TEST METHODOLOGY
OVERVIEW 100 5.4 PROCESSOR COMPONENTS CLASSIFICATION 107 5.4.1
FUNCTIONAL COMPONENTS 108 5.4.2 CONTROL COMPONENTS 111 5.4.3 HIDDEN
COMPONENTS 112 5.5 PROCESSOR COMPONENTS TEST PRIORITIZATION 113 5.5.1
COMPONENT SIZE AND CONTRIBUTION TO FAULT COVERAGE 115 5.5.2 COMPONENT
ACCESSIBILITY AND EASE OF TEST 117 5.5.3 COMPONENTS' TESTABILITY
CORRELATION 119 5.6 COMPONENT OPERATIONS IDENTIFICATION AND SELECTION
121 5.7 OPERAND SELECTION 124 5.7.1 SELF-TEST ROUTINE DEVELOPMENT: ATPG
125 5.7.2 SELF-TEST ROUTINE DEVELOPMENT: PSEUDORANDOM 133 5.7.3
SELF-TEST ROUTINE DEVELOPMENT: PRE-COMPUTED TESTS 137 5.7.4 SELF-TEST
ROUTINE DEVELOPMENT: STYLE SELECTION 139 5.8 TEST DEVELOPMENT FOR
PROCESSOR COMPONENTS 141 5.8.1 TEST DEVELOPMENT FOR FUNCTIONAL
COMPONENTS 141 5.8.2 TEST DEVELOPMENT FOR CONTROL COMPONENTS 141 5.8.3
TEST DEVELOPMENT FOR HIDDEN COMPONENTS 143 5.9 TEST RESPONSES COMPACTION
IN SOFTWARE-BASED SELF-TESTING 146 5.10 OPTIMIZATION OF SELF-TEST
ROUTINES 148 5.10.1 "CHAINED" COMPONENT TESTING 149 5.10.2 "PARALLEL"
COMPONENT TESTING 152 5.11 SOFTWARE-BASED SELF-TESTING AUTOMATION 153 6.
CASE STUDIES - EXPERTMENTAL RESULTS 157 6.1 PARWAN PROCESSOR CORE 158
6.1.1 SOFTWARE-BASED SELF-TESTING OF PARWAN 159 6.2 PLASMA/MIPS
PROCESSOR CORE ' 160 6.2.1 SOFTWARE-BASED SELF-TESTING OF PLASMA/MIPS
163 6.3 MEISTER/MIPS RECONFIGURABLE PROCESSOR CORE 168 6.3.1
SOFTWARE-BASED SELF-TESTING OF MEISTER/MIPS 170 6.4 JAM PROCESSOR CORE
171 6.4.1 SOFTWARE-BASED SELF-TESTING OF JAM 172 6.5 OC8051
MICROCONTROLLER CORE 173 6.5.1 SOFTWARE-BASED SELF-TESTING OF OC8051 175
6.6 RISC-MCU MICROCONTROLLER CORE 176 6.6.1 SOFTWARE-BASED SELF-TESTING
OF RISC-MCU 177 CONTENTS VII 6.7 OC54X DSP CORE 178 6.7.1 SOFTWARE-BASED
SELF-TESTING OF OC54X 179 6.8 COMPACTIONOFTESTRESPONSES 181 6.9 SUMMARY
OF BENCHMARKS 181 7. PROCESSOR-BASED TESTING OF SOC 185 7.1 THE CONCEPT
185 7.1.1 METHODOLOGY ADVANTAGES AND OBJECTIVES 188 7.2 LITERATURE
REVIEW 190 7.3 RESEARCH FOCUS IN PROCESSOR-BASED SOC TESTING 193 8.
CONCLUSIONS 195 REFERENCES 197 INDEX 213 ABOUT THE AUTHORS 217 |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| spelling | Gizopoulos, Dimitris Verfasser aut Embedded processor-based self-test by Dimitris Gizopoulos, Antonis Paschalis and Yervant Zorian Boston u.a. Kluwer 2004 XIV, 216 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Frontiers in electronic testing Computer engineering Electronic circuits Testing Paschalis, Antonis Verfasser aut Zorian, Yervant Verfasser aut GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=014871404&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Gizopoulos, Dimitris Paschalis, Antonis Zorian, Yervant Embedded processor-based self-test Computer engineering Electronic circuits Testing |
| title | Embedded processor-based self-test |
| title_auth | Embedded processor-based self-test |
| title_exact_search | Embedded processor-based self-test |
| title_exact_search_txtP | Embedded processor-based self-test |
| title_full | Embedded processor-based self-test by Dimitris Gizopoulos, Antonis Paschalis and Yervant Zorian |
| title_fullStr | Embedded processor-based self-test by Dimitris Gizopoulos, Antonis Paschalis and Yervant Zorian |
| title_full_unstemmed | Embedded processor-based self-test by Dimitris Gizopoulos, Antonis Paschalis and Yervant Zorian |
| title_short | Embedded processor-based self-test |
| title_sort | embedded processor based self test |
| topic | Computer engineering Electronic circuits Testing |
| topic_facet | Computer engineering Electronic circuits Testing |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=014871404&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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