Improved atomic force microscopy based techniques for electrical and structural characterisation of thin dielectric films:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Bristol
2006
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| Schlagworte: | |
| Beschreibung: | Bristol, Univ., Thesis, 2006 |
| Beschreibung: | 172, [ca. 86] Bl. Ill., graph. Darst. |
Internformat
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Datensatz im Suchindex
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| author | Frammelsberger, Werner |
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| illustrated | Illustrated |
| index_date | 2024-07-02T14:53:47Z |
| indexdate | 2024-07-09T20:40:07Z |
| institution | BVB |
| language | English |
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| spelling | Frammelsberger, Werner Verfasser aut Improved atomic force microscopy based techniques for electrical and structural characterisation of thin dielectric films Werner Frammelsberger Bristol 2006 172, [ca. 86] Bl. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Bristol, Univ., Thesis, 2006 Dielektrische Schicht (DE-588)4194257-7 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 s Dielektrische Schicht (DE-588)4194257-7 s DE-604 |
| spellingShingle | Frammelsberger, Werner Improved atomic force microscopy based techniques for electrical and structural characterisation of thin dielectric films Dielektrische Schicht (DE-588)4194257-7 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4194257-7 (DE-588)4274473-8 |
| title | Improved atomic force microscopy based techniques for electrical and structural characterisation of thin dielectric films |
| title_auth | Improved atomic force microscopy based techniques for electrical and structural characterisation of thin dielectric films |
| title_exact_search | Improved atomic force microscopy based techniques for electrical and structural characterisation of thin dielectric films |
| title_exact_search_txtP | Improved atomic force microscopy based techniques for electrical and structural characterisation of thin dielectric films |
| title_full | Improved atomic force microscopy based techniques for electrical and structural characterisation of thin dielectric films Werner Frammelsberger |
| title_fullStr | Improved atomic force microscopy based techniques for electrical and structural characterisation of thin dielectric films Werner Frammelsberger |
| title_full_unstemmed | Improved atomic force microscopy based techniques for electrical and structural characterisation of thin dielectric films Werner Frammelsberger |
| title_short | Improved atomic force microscopy based techniques for electrical and structural characterisation of thin dielectric films |
| title_sort | improved atomic force microscopy based techniques for electrical and structural characterisation of thin dielectric films |
| topic | Dielektrische Schicht (DE-588)4194257-7 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Dielektrische Schicht Rasterkraftmikroskopie |
| work_keys_str_mv | AT frammelsbergerwerner improvedatomicforcemicroscopybasedtechniquesforelectricalandstructuralcharacterisationofthindielectricfilms |