2005 IEEE International Reliability Physics Symposium proceedings: 43rd annual ; San Jose, California April 17-21, 2005
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Piscataway, NJ
2005
|
| Schlagworte: | |
| Beschreibung: | XII, 764 S. Ill., graph. Darst. |
| ISBN: | 0780388038 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV021576255 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 060510s2005 ad||j |||| 00||| eng d | ||
| 020 | |a 0780388038 |9 0-7803-8803-8 | ||
| 035 | |a (OCoLC)60939158 | ||
| 035 | |a (DE-599)BVBBV021576255 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1050 | ||
| 050 | 0 | |a TK7870 | |
| 084 | |a ZN 4040 |0 (DE-625)157343: |2 rvk | ||
| 111 | 2 | |a International Reliability Physics Symposium |n 43 |d 2005 |c San José, Calif. |j Verfasser |0 (DE-588)6042412-6 |4 aut | |
| 245 | 1 | 0 | |a 2005 IEEE International Reliability Physics Symposium proceedings |b 43rd annual ; San Jose, California April 17-21, 2005 |
| 264 | 1 | |a Piscataway, NJ |c 2005 | |
| 300 | |a XII, 764 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Electronic apparatus and appliances |x Reliability |v Congresses | |
| 650 | 4 | |a Integrated circuits |x Reliability |v Congresses | |
| 650 | 4 | |a Semiconductors |x Reliability |v Congresses | |
| 650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronisches Bauelement |0 (DE-588)4014360-0 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 2005 |z San Jose Calif. |2 gnd-content | |
| 689 | 0 | 0 | |a Elektronisches Bauelement |0 (DE-588)4014360-0 |D s |
| 689 | 0 | 1 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-014791991 | ||
Datensatz im Suchindex
| _version_ | 1804135345491542016 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author_corporate | International Reliability Physics Symposium San José, Calif |
| author_corporate_role | aut |
| author_facet | International Reliability Physics Symposium San José, Calif |
| author_sort | International Reliability Physics Symposium San José, Calif |
| building | Verbundindex |
| bvnumber | BV021576255 |
| callnumber-first | T - Technology |
| callnumber-label | TK7870 |
| callnumber-raw | TK7870 |
| callnumber-search | TK7870 |
| callnumber-sort | TK 47870 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4040 |
| ctrlnum | (OCoLC)60939158 (DE-599)BVBBV021576255 |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01484nam a2200385 c 4500</leader><controlfield tag="001">BV021576255</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">060510s2005 ad||j |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780388038</subfield><subfield code="9">0-7803-8803-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)60939158</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021576255</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1050</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7870</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4040</subfield><subfield code="0">(DE-625)157343:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Reliability Physics Symposium</subfield><subfield code="n">43</subfield><subfield code="d">2005</subfield><subfield code="c">San José, Calif.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)6042412-6</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">2005 IEEE International Reliability Physics Symposium proceedings</subfield><subfield code="b">43rd annual ; San Jose, California April 17-21, 2005</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, NJ</subfield><subfield code="c">2005</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XII, 764 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Reliability</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Reliability</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Reliability</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronisches Bauelement</subfield><subfield code="0">(DE-588)4014360-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">2005</subfield><subfield code="z">San Jose Calif.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronisches Bauelement</subfield><subfield code="0">(DE-588)4014360-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-014791991</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 2005 San Jose Calif. gnd-content |
| genre_facet | Konferenzschrift 2005 San Jose Calif. |
| id | DE-604.BV021576255 |
| illustrated | Illustrated |
| index_date | 2024-07-02T14:40:11Z |
| indexdate | 2024-07-09T20:39:02Z |
| institution | BVB |
| institution_GND | (DE-588)6042412-6 |
| isbn | 0780388038 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-014791991 |
| oclc_num | 60939158 |
| open_access_boolean | |
| owner | DE-1050 |
| owner_facet | DE-1050 |
| physical | XII, 764 S. Ill., graph. Darst. |
| publishDate | 2005 |
| publishDateSearch | 2005 |
| publishDateSort | 2005 |
| record_format | marc |
| spelling | International Reliability Physics Symposium 43 2005 San José, Calif. Verfasser (DE-588)6042412-6 aut 2005 IEEE International Reliability Physics Symposium proceedings 43rd annual ; San Jose, California April 17-21, 2005 Piscataway, NJ 2005 XII, 764 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electronic apparatus and appliances Reliability Congresses Integrated circuits Reliability Congresses Semiconductors Reliability Congresses Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Elektronisches Bauelement (DE-588)4014360-0 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2005 San Jose Calif. gnd-content Elektronisches Bauelement (DE-588)4014360-0 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 |
| spellingShingle | 2005 IEEE International Reliability Physics Symposium proceedings 43rd annual ; San Jose, California April 17-21, 2005 Electronic apparatus and appliances Reliability Congresses Integrated circuits Reliability Congresses Semiconductors Reliability Congresses Zuverlässigkeit (DE-588)4059245-5 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd |
| subject_GND | (DE-588)4059245-5 (DE-588)4014360-0 (DE-588)1071861417 |
| title | 2005 IEEE International Reliability Physics Symposium proceedings 43rd annual ; San Jose, California April 17-21, 2005 |
| title_auth | 2005 IEEE International Reliability Physics Symposium proceedings 43rd annual ; San Jose, California April 17-21, 2005 |
| title_exact_search | 2005 IEEE International Reliability Physics Symposium proceedings 43rd annual ; San Jose, California April 17-21, 2005 |
| title_exact_search_txtP | 2005 IEEE International Reliability Physics Symposium proceedings 43rd annual ; San Jose, California April 17-21, 2005 |
| title_full | 2005 IEEE International Reliability Physics Symposium proceedings 43rd annual ; San Jose, California April 17-21, 2005 |
| title_fullStr | 2005 IEEE International Reliability Physics Symposium proceedings 43rd annual ; San Jose, California April 17-21, 2005 |
| title_full_unstemmed | 2005 IEEE International Reliability Physics Symposium proceedings 43rd annual ; San Jose, California April 17-21, 2005 |
| title_short | 2005 IEEE International Reliability Physics Symposium proceedings |
| title_sort | 2005 ieee international reliability physics symposium proceedings 43rd annual san jose california april 17 21 2005 |
| title_sub | 43rd annual ; San Jose, California April 17-21, 2005 |
| topic | Electronic apparatus and appliances Reliability Congresses Integrated circuits Reliability Congresses Semiconductors Reliability Congresses Zuverlässigkeit (DE-588)4059245-5 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd |
| topic_facet | Electronic apparatus and appliances Reliability Congresses Integrated circuits Reliability Congresses Semiconductors Reliability Congresses Zuverlässigkeit Elektronisches Bauelement Konferenzschrift 2005 San Jose Calif. |
| work_keys_str_mv | AT internationalreliabilityphysicssymposiumsanjosecalif 2005ieeeinternationalreliabilityphysicssymposiumproceedings43rdannualsanjosecaliforniaapril17212005 |