Measuring the patenting success of companies: metrics and measurements for patent departments
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Japanese |
| Veröffentlicht: |
Tokyo
Inst. of Intellectual Property
2005
|
| Schriftenreihe: | Reports for international joint research and development of young IP researchers
|
| Beschreibung: | Text engl. und japan. |
| Beschreibung: | 51, 31 S. Ill. |
Internformat
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Datensatz im Suchindex
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| illustrated | Illustrated |
| index_date | 2024-07-02T14:07:51Z |
| indexdate | 2024-07-09T20:36:29Z |
| institution | BVB |
| language | Japanese |
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| series2 | Reports for international joint research and development of young IP researchers |
| spelling | Kaminski, Michael D. Verfasser aut Measuring the patenting success of companies metrics and measurements for patent departments Michael D. Kaminski Tokyo Inst. of Intellectual Property 2005 51, 31 S. Ill. txt rdacontent n rdamedia nc rdacarrier Reports for international joint research and development of young IP researchers Text engl. und japan. |
| spellingShingle | Kaminski, Michael D. Measuring the patenting success of companies metrics and measurements for patent departments |
| title | Measuring the patenting success of companies metrics and measurements for patent departments |
| title_auth | Measuring the patenting success of companies metrics and measurements for patent departments |
| title_exact_search | Measuring the patenting success of companies metrics and measurements for patent departments |
| title_exact_search_txtP | Measuring the patenting success of companies metrics and measurements for patent departments |
| title_full | Measuring the patenting success of companies metrics and measurements for patent departments Michael D. Kaminski |
| title_fullStr | Measuring the patenting success of companies metrics and measurements for patent departments Michael D. Kaminski |
| title_full_unstemmed | Measuring the patenting success of companies metrics and measurements for patent departments Michael D. Kaminski |
| title_short | Measuring the patenting success of companies |
| title_sort | measuring the patenting success of companies metrics and measurements for patent departments |
| title_sub | metrics and measurements for patent departments |
| work_keys_str_mv | AT kaminskimichaeld measuringthepatentingsuccessofcompaniesmetricsandmeasurementsforpatentdepartments |