Physical principles of electron microscopy: an introduction to TEM, SEM, and AEM
Saved in:
Bibliographic Details
Main Author: Egerton, Ray F. (Author)
Format: Book
Language:English
Published: New York, NY Springer 2005
Subjects:
Online Access:Inhaltstext
Physical Description:XII, 202 S. Ill., graph. Darst.
ISBN:0387258000

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection! Description