Physical principles of electron microscopy: an introduction to TEM, SEM, and AEM
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
New York, NY
Springer
2005
|
Schlagworte: | |
Online-Zugang: | Inhaltstext |
Beschreibung: | XII, 202 S. Ill., graph. Darst. |
ISBN: | 0387258000 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV021318114 | ||
003 | DE-604 | ||
005 | 20100902 | ||
007 | t | ||
008 | 060202s2005 gw ad|| |||| 00||| eng d | ||
015 | |a 06,N02,0976 |2 dnb | ||
016 | 7 | |a 977475042 |2 DE-101 | |
020 | |a 0387258000 |c Gb. : EUR 58.80, sfr 97.50 |9 0-387-25800-0 | ||
020 | |z 9780387258000 |9 978-0-387-25800-0 | ||
024 | 3 | |a 9780387258003 | |
035 | |a (OCoLC)61714990 | ||
035 | |a (DE-599)BVBBV021318114 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | 0 | |a eng | |
044 | |a gw |c XA-DE-BE | ||
049 | |a DE-703 |a DE-573 |a DE-634 | ||
050 | 0 | |a QH212.E4 | |
082 | 1 | |a 502 |2 14 | |
084 | |a WC 3100 |0 (DE-625)148081: |2 rvk | ||
084 | |a 530 |2 sdnb | ||
100 | 1 | |a Egerton, Ray F. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Physical principles of electron microscopy |b an introduction to TEM, SEM, and AEM |c Ray F. Egerton |
264 | 1 | |a New York, NY |b Springer |c 2005 | |
300 | |a XII, 202 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Microscopie électronique | |
650 | 4 | |a Electron microscopy | |
650 | 4 | |a Microscopy, Electron | |
650 | 4 | |a Physics | |
650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
689 | 0 | |5 DE-604 | |
856 | 4 | 2 | |q text/html |u http://deposit.dnb.de/cgi-bin/dokserv?id=2738011&prov=M&dok_var=1&dok_ext=htm |3 Inhaltstext |
999 | |a oai:aleph.bib-bvb.de:BVB01-014638567 |
Datensatz im Suchindex
_version_ | 1804135125395439616 |
---|---|
adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author | Egerton, Ray F. |
author_facet | Egerton, Ray F. |
author_role | aut |
author_sort | Egerton, Ray F. |
author_variant | r f e rf rfe |
building | Verbundindex |
bvnumber | BV021318114 |
callnumber-first | Q - Science |
callnumber-label | QH212 |
callnumber-raw | QH212.E4 |
callnumber-search | QH212.E4 |
callnumber-sort | QH 3212 E4 |
callnumber-subject | QH - Natural History and Biology |
classification_rvk | WC 3100 |
ctrlnum | (OCoLC)61714990 (DE-599)BVBBV021318114 |
dewey-full | 502 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 502 - Miscellany |
dewey-raw | 502 |
dewey-search | 502 |
dewey-sort | 3502 |
dewey-tens | 500 - Natural sciences and mathematics |
discipline | Allgemeine Naturwissenschaft Physik Biologie |
discipline_str_mv | Allgemeine Naturwissenschaft Physik Biologie |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01508nam a2200457 c 4500</leader><controlfield tag="001">BV021318114</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20100902 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">060202s2005 gw ad|| |||| 00||| eng d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">06,N02,0976</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">977475042</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0387258000</subfield><subfield code="c">Gb. : EUR 58.80, sfr 97.50</subfield><subfield code="9">0-387-25800-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9780387258000</subfield><subfield code="9">978-0-387-25800-0</subfield></datafield><datafield tag="024" ind1="3" ind2=" "><subfield code="a">9780387258003</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)61714990</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021318114</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">XA-DE-BE</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-634</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QH212.E4</subfield></datafield><datafield tag="082" ind1="1" ind2=" "><subfield code="a">502</subfield><subfield code="2">14</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">WC 3100</subfield><subfield code="0">(DE-625)148081:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">530</subfield><subfield code="2">sdnb</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Egerton, Ray F.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Physical principles of electron microscopy</subfield><subfield code="b">an introduction to TEM, SEM, and AEM</subfield><subfield code="c">Ray F. Egerton</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">Springer</subfield><subfield code="c">2005</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XII, 202 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopie électronique</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy, Electron</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physics</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="q">text/html</subfield><subfield code="u">http://deposit.dnb.de/cgi-bin/dokserv?id=2738011&prov=M&dok_var=1&dok_ext=htm</subfield><subfield code="3">Inhaltstext</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-014638567</subfield></datafield></record></collection> |
id | DE-604.BV021318114 |
illustrated | Illustrated |
index_date | 2024-07-02T13:58:05Z |
indexdate | 2024-07-09T20:35:32Z |
institution | BVB |
isbn | 0387258000 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-014638567 |
oclc_num | 61714990 |
open_access_boolean | |
owner | DE-703 DE-573 DE-634 |
owner_facet | DE-703 DE-573 DE-634 |
physical | XII, 202 S. Ill., graph. Darst. |
publishDate | 2005 |
publishDateSearch | 2005 |
publishDateSort | 2005 |
publisher | Springer |
record_format | marc |
spelling | Egerton, Ray F. Verfasser aut Physical principles of electron microscopy an introduction to TEM, SEM, and AEM Ray F. Egerton New York, NY Springer 2005 XII, 202 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Microscopie électronique Electron microscopy Microscopy, Electron Physics Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s DE-604 text/html http://deposit.dnb.de/cgi-bin/dokserv?id=2738011&prov=M&dok_var=1&dok_ext=htm Inhaltstext |
spellingShingle | Egerton, Ray F. Physical principles of electron microscopy an introduction to TEM, SEM, and AEM Microscopie électronique Electron microscopy Microscopy, Electron Physics Elektronenmikroskopie (DE-588)4014327-2 gnd |
subject_GND | (DE-588)4014327-2 |
title | Physical principles of electron microscopy an introduction to TEM, SEM, and AEM |
title_auth | Physical principles of electron microscopy an introduction to TEM, SEM, and AEM |
title_exact_search | Physical principles of electron microscopy an introduction to TEM, SEM, and AEM |
title_exact_search_txtP | Physical principles of electron microscopy an introduction to TEM, SEM, and AEM |
title_full | Physical principles of electron microscopy an introduction to TEM, SEM, and AEM Ray F. Egerton |
title_fullStr | Physical principles of electron microscopy an introduction to TEM, SEM, and AEM Ray F. Egerton |
title_full_unstemmed | Physical principles of electron microscopy an introduction to TEM, SEM, and AEM Ray F. Egerton |
title_short | Physical principles of electron microscopy |
title_sort | physical principles of electron microscopy an introduction to tem sem and aem |
title_sub | an introduction to TEM, SEM, and AEM |
topic | Microscopie électronique Electron microscopy Microscopy, Electron Physics Elektronenmikroskopie (DE-588)4014327-2 gnd |
topic_facet | Microscopie électronique Electron microscopy Microscopy, Electron Physics Elektronenmikroskopie |
url | http://deposit.dnb.de/cgi-bin/dokserv?id=2738011&prov=M&dok_var=1&dok_ext=htm |
work_keys_str_mv | AT egertonrayf physicalprinciplesofelectronmicroscopyanintroductiontotemsemandaem |