SPM 2004: proceedings of the sixth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures, Beijing, China, May 24 - 26, 2004
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam [u.a.]
Elsevier
2005
|
| Schriftenreihe: | Ultramicroscopy
105 |
| Schlagworte: | |
| Beschreibung: | Einzelaufnahme eines Zeitschr.-Heftes |
| Beschreibung: | XIII, 357 S. Ill., graph. Darst. |
Internformat
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| publishDate | 2005 |
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| publisher | Elsevier |
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| series2 | Ultramicroscopy |
| spelling | SPM 6 2004 Peking Verfasser (DE-588)16035183-2 aut SPM 2004 proceedings of the sixth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures, Beijing, China, May 24 - 26, 2004 guest ed.: David P. Allison ... Amsterdam [u.a.] Elsevier 2005 XIII, 357 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Ultramicroscopy 105 Einzelaufnahme eines Zeitschr.-Heftes Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2004 Peking gnd-content Rastersondenmikroskopie (DE-588)4330328-6 s DE-604 Allison, David P. Sonstige oth |
| spellingShingle | SPM 2004 proceedings of the sixth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures, Beijing, China, May 24 - 26, 2004 Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| subject_GND | (DE-588)4330328-6 (DE-588)1071861417 |
| title | SPM 2004 proceedings of the sixth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures, Beijing, China, May 24 - 26, 2004 |
| title_auth | SPM 2004 proceedings of the sixth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures, Beijing, China, May 24 - 26, 2004 |
| title_exact_search | SPM 2004 proceedings of the sixth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures, Beijing, China, May 24 - 26, 2004 |
| title_exact_search_txtP | SPM 2004 proceedings of the sixth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures, Beijing, China, May 24 - 26, 2004 |
| title_full | SPM 2004 proceedings of the sixth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures, Beijing, China, May 24 - 26, 2004 guest ed.: David P. Allison ... |
| title_fullStr | SPM 2004 proceedings of the sixth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures, Beijing, China, May 24 - 26, 2004 guest ed.: David P. Allison ... |
| title_full_unstemmed | SPM 2004 proceedings of the sixth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures, Beijing, China, May 24 - 26, 2004 guest ed.: David P. Allison ... |
| title_short | SPM 2004 |
| title_sort | spm 2004 proceedings of the sixth international conference on scanning probe microscopy sensors and nanostructures beijing china may 24 26 2004 |
| title_sub | proceedings of the sixth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures, Beijing, China, May 24 - 26, 2004 |
| topic | Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| topic_facet | Rastersondenmikroskopie Konferenzschrift 2004 Peking |
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