On line testing for VLSI:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Boston, Mass. [u.a.]
Kluwer
1998
|
| Schriftenreihe: | Frontiers in electronic testing
|
| Schlagworte: | |
| Beschreibung: | Includes index. - Reprinted from a special issue of Journal of electronic testing: theory and applications, vol. 12, nos. 1 & 2, February/April 1998 |
| Beschreibung: | 159 S. graph. Darst. 27 cm |
| ISBN: | 0792381327 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV021238599 | ||
| 003 | DE-604 | ||
| 005 | 20060131 | ||
| 007 | t | ||
| 008 | 051124s1998 d||| |||| 00||| eng d | ||
| 010 | |a 982694 | ||
| 020 | |a 0792381327 |9 0-7923-8132-7 | ||
| 035 | |a (OCoLC)39076148 | ||
| 035 | |a (DE-599)BVBBV021238599 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 | ||
| 050 | 0 | |a TK7867 | |
| 082 | 0 | |a 621.381548 |2 21 | |
| 084 | |a ST 190 |0 (DE-625)143607: |2 rvk | ||
| 084 | |a ELT 359f |2 stub | ||
| 245 | 1 | 0 | |a On line testing for VLSI |c ed. by Michael Nicolaidis ... |
| 246 | 1 | 3 | |a On-line testing for VLSI |
| 246 | 1 | 3 | |a Online testing for VLSI |
| 264 | 1 | |a Boston, Mass. [u.a.] |b Kluwer |c 1998 | |
| 300 | |a 159 S. |b graph. Darst. |c 27 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Frontiers in electronic testing | |
| 500 | |a Includes index. - Reprinted from a special issue of Journal of electronic testing: theory and applications, vol. 12, nos. 1 & 2, February/April 1998 | ||
| 650 | 4 | |a Datenverarbeitung | |
| 650 | 4 | |a Electronic circuit design |v Congresses | |
| 650 | 4 | |a Electronic circuits |x Testing |x Data processing |v Congresses | |
| 650 | 4 | |a Error-correcting codes (Information theory) |v Congresses | |
| 650 | 4 | |a Online data processing |v Congresses | |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Test |0 (DE-588)4059549-3 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4143413-4 |a Aufsatzsammlung |2 gnd-content | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | 1 | |a Test |0 (DE-588)4059549-3 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Nicolaidis, Michael |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-014281332 | ||
Datensatz im Suchindex
| _version_ | 1804134684869787648 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| building | Verbundindex |
| bvnumber | BV021238599 |
| callnumber-first | T - Technology |
| callnumber-label | TK7867 |
| callnumber-raw | TK7867 |
| callnumber-search | TK7867 |
| callnumber-sort | TK 47867 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ST 190 |
| classification_tum | ELT 359f |
| ctrlnum | (OCoLC)39076148 (DE-599)BVBBV021238599 |
| dewey-full | 621.381548 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381548 |
| dewey-search | 621.381548 |
| dewey-sort | 3621.381548 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Informatik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01798nam a2200505 c 4500</leader><controlfield tag="001">BV021238599</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20060131 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">051124s1998 d||| |||| 00||| eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="a">982694</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0792381327</subfield><subfield code="9">0-7923-8132-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)39076148</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021238599</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7867</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381548</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 190</subfield><subfield code="0">(DE-625)143607:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 359f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">On line testing for VLSI</subfield><subfield code="c">ed. by Michael Nicolaidis ...</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">On-line testing for VLSI</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Online testing for VLSI</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston, Mass. [u.a.]</subfield><subfield code="b">Kluwer</subfield><subfield code="c">1998</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">159 S.</subfield><subfield code="b">graph. Darst.</subfield><subfield code="c">27 cm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Frontiers in electronic testing</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes index. - Reprinted from a special issue of Journal of electronic testing: theory and applications, vol. 12, nos. 1 & 2, February/April 1998</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Datenverarbeitung</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuit design</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield><subfield code="x">Testing</subfield><subfield code="x">Data processing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Error-correcting codes (Information theory)</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Online data processing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4143413-4</subfield><subfield code="a">Aufsatzsammlung</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Nicolaidis, Michael</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-014281332</subfield></datafield></record></collection> |
| genre | (DE-588)4143413-4 Aufsatzsammlung gnd-content (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Aufsatzsammlung Konferenzschrift |
| id | DE-604.BV021238599 |
| illustrated | Illustrated |
| index_date | 2024-07-02T13:30:32Z |
| indexdate | 2024-07-09T20:28:32Z |
| institution | BVB |
| isbn | 0792381327 |
| language | English |
| lccn | 982694 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-014281332 |
| oclc_num | 39076148 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | 159 S. graph. Darst. 27 cm |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Kluwer |
| record_format | marc |
| series2 | Frontiers in electronic testing |
| spelling | On line testing for VLSI ed. by Michael Nicolaidis ... On-line testing for VLSI Online testing for VLSI Boston, Mass. [u.a.] Kluwer 1998 159 S. graph. Darst. 27 cm txt rdacontent n rdamedia nc rdacarrier Frontiers in electronic testing Includes index. - Reprinted from a special issue of Journal of electronic testing: theory and applications, vol. 12, nos. 1 & 2, February/April 1998 Datenverarbeitung Electronic circuit design Congresses Electronic circuits Testing Data processing Congresses Error-correcting codes (Information theory) Congresses Online data processing Congresses VLSI (DE-588)4117388-0 gnd rswk-swf Test (DE-588)4059549-3 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content (DE-588)1071861417 Konferenzschrift gnd-content VLSI (DE-588)4117388-0 s Test (DE-588)4059549-3 s DE-604 Nicolaidis, Michael Sonstige oth |
| spellingShingle | On line testing for VLSI Datenverarbeitung Electronic circuit design Congresses Electronic circuits Testing Data processing Congresses Error-correcting codes (Information theory) Congresses Online data processing Congresses VLSI (DE-588)4117388-0 gnd Test (DE-588)4059549-3 gnd |
| subject_GND | (DE-588)4117388-0 (DE-588)4059549-3 (DE-588)4143413-4 (DE-588)1071861417 |
| title | On line testing for VLSI |
| title_alt | On-line testing for VLSI Online testing for VLSI |
| title_auth | On line testing for VLSI |
| title_exact_search | On line testing for VLSI |
| title_exact_search_txtP | On line testing for VLSI |
| title_full | On line testing for VLSI ed. by Michael Nicolaidis ... |
| title_fullStr | On line testing for VLSI ed. by Michael Nicolaidis ... |
| title_full_unstemmed | On line testing for VLSI ed. by Michael Nicolaidis ... |
| title_short | On line testing for VLSI |
| title_sort | on line testing for vlsi |
| topic | Datenverarbeitung Electronic circuit design Congresses Electronic circuits Testing Data processing Congresses Error-correcting codes (Information theory) Congresses Online data processing Congresses VLSI (DE-588)4117388-0 gnd Test (DE-588)4059549-3 gnd |
| topic_facet | Datenverarbeitung Electronic circuit design Congresses Electronic circuits Testing Data processing Congresses Error-correcting codes (Information theory) Congresses Online data processing Congresses VLSI Test Aufsatzsammlung Konferenzschrift |
| work_keys_str_mv | AT nicolaidismichael onlinetestingforvlsi |