High resolution focused ion beams: FIB and its applications ; the physics of liquid metal ion sources and ion optics and their application to focused beam technology
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
Kluwer Academic/Plenum Publ.
2003
|
| Schlagworte: | |
| Online-Zugang: | Table of contents |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | X, 303 S. Ill., graph. Darst. |
| ISBN: | 9780306473500 030647350X |
Internformat
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| 100 | 1 | |a Orloff, Jon |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a High resolution focused ion beams |b FIB and its applications ; the physics of liquid metal ion sources and ion optics and their application to focused beam technology |c Jon Orloff ; Mark Utlaut and Lynwood Swanson |
| 264 | 1 | |a New York [u.a.] |b Kluwer Academic/Plenum Publ. |c 2003 | |
| 300 | |a X, 303 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a aFocused ion beams |a xIndustrial applications | |
| 650 | 4 | |a aIon bombardment |a xIndustrial applications | |
| 650 | 0 | 7 | |a Fokussierung |0 (DE-588)4154950-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Ionenstrahl |0 (DE-588)4162347-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Anwendung |0 (DE-588)4196864-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Festkörperoberfläche |0 (DE-588)4127823-9 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Ionenstrahl |0 (DE-588)4162347-2 |D s |
| 689 | 0 | 1 | |a Fokussierung |0 (DE-588)4154950-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Ionenstrahl |0 (DE-588)4162347-2 |D s |
| 689 | 1 | 1 | |a Festkörperoberfläche |0 (DE-588)4127823-9 |D s |
| 689 | 1 | 2 | |a Anwendung |0 (DE-588)4196864-5 |D s |
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| 700 | 1 | |a Utlaut, Mark |e Verfasser |4 aut | |
| 700 | 1 | |a Swanson, Lynwood W. |e Verfasser |4 aut | |
| 856 | 4 | |u http://www.loc.gov/catdir/toc/fy036/2002028661.html |3 Table of contents | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-014277054 | ||
Datensatz im Suchindex
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| author | Orloff, Jon Utlaut, Mark Swanson, Lynwood W. |
| author_facet | Orloff, Jon Utlaut, Mark Swanson, Lynwood W. |
| author_role | aut aut aut |
| author_sort | Orloff, Jon |
| author_variant | j o jo m u mu l w s lw lws |
| building | Verbundindex |
| bvnumber | BV021234267 |
| callnumber-first | Q - Science |
| callnumber-label | QC702 |
| callnumber-raw | QC702.7.B65 |
| callnumber-search | QC702.7.B65 |
| callnumber-sort | QC 3702.7 B65 |
| callnumber-subject | QC - Physics |
| classification_rvk | UH 6200 ZN 4176 |
| classification_tum | PHY 323f ELT 270f |
| ctrlnum | (OCoLC)633956099 (DE-599)BVBBV021234267 |
| discipline | Physik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Physik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV021234267 |
| illustrated | Illustrated |
| index_date | 2024-07-02T13:29:17Z |
| indexdate | 2024-07-09T20:28:25Z |
| institution | BVB |
| isbn | 9780306473500 030647350X |
| language | English |
| lccn | 2002028661 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-014277054 |
| oclc_num | 633956099 |
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| physical | X, 303 S. Ill., graph. Darst. |
| publishDate | 2003 |
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| publisher | Kluwer Academic/Plenum Publ. |
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| spelling | Orloff, Jon Verfasser aut High resolution focused ion beams FIB and its applications ; the physics of liquid metal ion sources and ion optics and their application to focused beam technology Jon Orloff ; Mark Utlaut and Lynwood Swanson New York [u.a.] Kluwer Academic/Plenum Publ. 2003 X, 303 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Includes bibliographical references and index aFocused ion beams xIndustrial applications aIon bombardment xIndustrial applications Fokussierung (DE-588)4154950-8 gnd rswk-swf Ionenstrahl (DE-588)4162347-2 gnd rswk-swf Anwendung (DE-588)4196864-5 gnd rswk-swf Festkörperoberfläche (DE-588)4127823-9 gnd rswk-swf Ionenstrahl (DE-588)4162347-2 s Fokussierung (DE-588)4154950-8 s DE-604 Festkörperoberfläche (DE-588)4127823-9 s Anwendung (DE-588)4196864-5 s Utlaut, Mark Verfasser aut Swanson, Lynwood W. Verfasser aut http://www.loc.gov/catdir/toc/fy036/2002028661.html Table of contents |
| spellingShingle | Orloff, Jon Utlaut, Mark Swanson, Lynwood W. High resolution focused ion beams FIB and its applications ; the physics of liquid metal ion sources and ion optics and their application to focused beam technology aFocused ion beams xIndustrial applications aIon bombardment xIndustrial applications Fokussierung (DE-588)4154950-8 gnd Ionenstrahl (DE-588)4162347-2 gnd Anwendung (DE-588)4196864-5 gnd Festkörperoberfläche (DE-588)4127823-9 gnd |
| subject_GND | (DE-588)4154950-8 (DE-588)4162347-2 (DE-588)4196864-5 (DE-588)4127823-9 |
| title | High resolution focused ion beams FIB and its applications ; the physics of liquid metal ion sources and ion optics and their application to focused beam technology |
| title_auth | High resolution focused ion beams FIB and its applications ; the physics of liquid metal ion sources and ion optics and their application to focused beam technology |
| title_exact_search | High resolution focused ion beams FIB and its applications ; the physics of liquid metal ion sources and ion optics and their application to focused beam technology |
| title_exact_search_txtP | High resolution focused ion beams FIB and its applications ; the physics of liquid metal ion sources and ion optics and their application to focused beam technology |
| title_full | High resolution focused ion beams FIB and its applications ; the physics of liquid metal ion sources and ion optics and their application to focused beam technology Jon Orloff ; Mark Utlaut and Lynwood Swanson |
| title_fullStr | High resolution focused ion beams FIB and its applications ; the physics of liquid metal ion sources and ion optics and their application to focused beam technology Jon Orloff ; Mark Utlaut and Lynwood Swanson |
| title_full_unstemmed | High resolution focused ion beams FIB and its applications ; the physics of liquid metal ion sources and ion optics and their application to focused beam technology Jon Orloff ; Mark Utlaut and Lynwood Swanson |
| title_short | High resolution focused ion beams |
| title_sort | high resolution focused ion beams fib and its applications the physics of liquid metal ion sources and ion optics and their application to focused beam technology |
| title_sub | FIB and its applications ; the physics of liquid metal ion sources and ion optics and their application to focused beam technology |
| topic | aFocused ion beams xIndustrial applications aIon bombardment xIndustrial applications Fokussierung (DE-588)4154950-8 gnd Ionenstrahl (DE-588)4162347-2 gnd Anwendung (DE-588)4196864-5 gnd Festkörperoberfläche (DE-588)4127823-9 gnd |
| topic_facet | aFocused ion beams xIndustrial applications aIon bombardment xIndustrial applications Fokussierung Ionenstrahl Anwendung Festkörperoberfläche |
| url | http://www.loc.gov/catdir/toc/fy036/2002028661.html |
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