VLSI testing: digital and mixed analogue/digital techniques
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
London
Institution of Electrical Engineers
1998
|
| Ausgabe: | Repr. with corr. |
| Schriftenreihe: | IEE circuits, devices and systems series
9 |
| Schlagworte: | |
| Beschreibung: | XX, 532 S. graph. Darst. |
| ISBN: | 0852969015 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV020044108 | ||
| 003 | DE-604 | ||
| 005 | 20050930 | ||
| 007 | t | ||
| 008 | 050926s1998 d||| |||| 00||| eng d | ||
| 020 | |a 0852969015 |9 0-85296-901-5 | ||
| 035 | |a (OCoLC)38423379 | ||
| 035 | |a (DE-599)BVBBV020044108 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T | ||
| 050 | 0 | |a TK7874 | |
| 082 | 0 | |a 621.3950287 |2 21 | |
| 084 | |a ZN 4950 |0 (DE-625)157424: |2 rvk | ||
| 100 | 1 | |a Hurst, Stanley L. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a VLSI testing |b digital and mixed analogue/digital techniques |c Stanley L. Hurst |
| 250 | |a Repr. with corr. | ||
| 264 | 1 | |a London |b Institution of Electrical Engineers |c 1998 | |
| 300 | |a XX, 532 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a IEE circuits, devices and systems series |v 9 | |
| 650 | 7 | |a Circuits intégrés à très grande échelle |2 ram | |
| 650 | 4 | |a Entegre devreler - Çok büyük boyutta integrasyon - Test etme | |
| 650 | 7 | |a Microélectronique |2 ram | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Testing | |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-013365146 | ||
Datensatz im Suchindex
| _version_ | 1804133617529520128 |
|---|---|
| any_adam_object | |
| author | Hurst, Stanley L. |
| author_facet | Hurst, Stanley L. |
| author_role | aut |
| author_sort | Hurst, Stanley L. |
| author_variant | s l h sl slh |
| building | Verbundindex |
| bvnumber | BV020044108 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4950 |
| ctrlnum | (OCoLC)38423379 (DE-599)BVBBV020044108 |
| dewey-full | 621.3950287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3950287 |
| dewey-search | 621.3950287 |
| dewey-sort | 3621.3950287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | Repr. with corr. |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01442nam a2200421 cb4500</leader><controlfield tag="001">BV020044108</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20050930 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">050926s1998 d||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0852969015</subfield><subfield code="9">0-85296-901-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)38423379</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV020044108</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3950287</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4950</subfield><subfield code="0">(DE-625)157424:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Hurst, Stanley L.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">VLSI testing</subfield><subfield code="b">digital and mixed analogue/digital techniques</subfield><subfield code="c">Stanley L. Hurst</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">Repr. with corr.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">London</subfield><subfield code="b">Institution of Electrical Engineers</subfield><subfield code="c">1998</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XX, 532 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">IEE circuits, devices and systems series</subfield><subfield code="v">9</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Circuits intégrés à très grande échelle</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Entegre devreler - Çok büyük boyutta integrasyon - Test etme</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Microélectronique</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Very large scale integration</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-013365146</subfield></datafield></record></collection> |
| id | DE-604.BV020044108 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T20:11:34Z |
| institution | BVB |
| isbn | 0852969015 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-013365146 |
| oclc_num | 38423379 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | XX, 532 S. graph. Darst. |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Institution of Electrical Engineers |
| record_format | marc |
| series2 | IEE circuits, devices and systems series |
| spelling | Hurst, Stanley L. Verfasser aut VLSI testing digital and mixed analogue/digital techniques Stanley L. Hurst Repr. with corr. London Institution of Electrical Engineers 1998 XX, 532 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier IEE circuits, devices and systems series 9 Circuits intégrés à très grande échelle ram Entegre devreler - Çok büyük boyutta integrasyon - Test etme Microélectronique ram Integrated circuits Very large scale integration Testing VLSI (DE-588)4117388-0 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf VLSI (DE-588)4117388-0 s Prüftechnik (DE-588)4047610-8 s DE-604 |
| spellingShingle | Hurst, Stanley L. VLSI testing digital and mixed analogue/digital techniques Circuits intégrés à très grande échelle ram Entegre devreler - Çok büyük boyutta integrasyon - Test etme Microélectronique ram Integrated circuits Very large scale integration Testing VLSI (DE-588)4117388-0 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4117388-0 (DE-588)4047610-8 |
| title | VLSI testing digital and mixed analogue/digital techniques |
| title_auth | VLSI testing digital and mixed analogue/digital techniques |
| title_exact_search | VLSI testing digital and mixed analogue/digital techniques |
| title_full | VLSI testing digital and mixed analogue/digital techniques Stanley L. Hurst |
| title_fullStr | VLSI testing digital and mixed analogue/digital techniques Stanley L. Hurst |
| title_full_unstemmed | VLSI testing digital and mixed analogue/digital techniques Stanley L. Hurst |
| title_short | VLSI testing |
| title_sort | vlsi testing digital and mixed analogue digital techniques |
| title_sub | digital and mixed analogue/digital techniques |
| topic | Circuits intégrés à très grande échelle ram Entegre devreler - Çok büyük boyutta integrasyon - Test etme Microélectronique ram Integrated circuits Very large scale integration Testing VLSI (DE-588)4117388-0 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Circuits intégrés à très grande échelle Entegre devreler - Çok büyük boyutta integrasyon - Test etme Microélectronique Integrated circuits Very large scale integration Testing VLSI Prüftechnik |
| work_keys_str_mv | AT hurststanleyl vlsitestingdigitalandmixedanaloguedigitaltechniques |