Matching properties of deep sub-micron MOS transistors:
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Bibliographic Details
Main Author: Croon, Jeroen A. (Author)
Format: Book
Language:English
Published: New York, NY Springer
2005
Series:The Kluwer international series in engineering and computer science
Subjects:
Physical Description:X, 206 S. Ill., graph. Darst.
ISBN:0387243143

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!