Matching properties of deep sub-micron MOS transistors:
Gespeichert in:
1. Verfasser: | |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
New York, NY
Springer
2005 |
Schriftenreihe: | The Kluwer international series in engineering and computer science
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Schlagworte: | |
Beschreibung: | X, 206 S. Ill., graph. Darst. |
ISBN: | 0387243143 |
Internformat
MARC
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Datensatz im Suchindex
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any_adam_object | |
author | Croon, Jeroen A. |
author_facet | Croon, Jeroen A. |
author_role | aut |
author_sort | Croon, Jeroen A. |
author_variant | j a c ja jac |
building | Verbundindex |
bvnumber | BV019868248 |
callnumber-first | T - Technology |
callnumber-label | TK7871 |
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callnumber-search | TK7871.95 |
callnumber-sort | TK 47871.95 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_tum | ELT 321f |
ctrlnum | (OCoLC)59617139 (DE-599)BVBBV019868248 |
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dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815/284 |
dewey-search | 621.3815/284 |
dewey-sort | 3621.3815 3284 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Book |
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id | DE-604.BV019868248 |
illustrated | Illustrated |
indexdate | 2024-07-09T20:07:58Z |
institution | BVB |
isbn | 0387243143 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-013192612 |
oclc_num | 59617139 |
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owner_facet | DE-91 DE-BY-TUM |
physical | X, 206 S. Ill., graph. Darst. |
publishDateSort | 0000 |
publisher | Springer |
record_format | marc |
series2 | The Kluwer international series in engineering and computer science |
spelling | Croon, Jeroen A. Verfasser aut Matching properties of deep sub-micron MOS transistors Matching properties of deep sub micron MOS transistors New York, NY Springer 2005 X, 206 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier The Kluwer international series in engineering and computer science Metal oxide semiconductor field-effect transistors |
spellingShingle | Croon, Jeroen A. Matching properties of deep sub-micron MOS transistors Metal oxide semiconductor field-effect transistors |
title | Matching properties of deep sub-micron MOS transistors |
title_alt | Matching properties of deep sub micron MOS transistors |
title_auth | Matching properties of deep sub-micron MOS transistors |
title_exact_search | Matching properties of deep sub-micron MOS transistors |
title_full | Matching properties of deep sub-micron MOS transistors |
title_fullStr | Matching properties of deep sub-micron MOS transistors |
title_full_unstemmed | Matching properties of deep sub-micron MOS transistors |
title_short | Matching properties of deep sub-micron MOS transistors |
title_sort | matching properties of deep sub micron mos transistors |
topic | Metal oxide semiconductor field-effect transistors |
topic_facet | Metal oxide semiconductor field-effect transistors |
work_keys_str_mv | AT croonjeroena matchingpropertiesofdeepsubmicronmostransistors |