Adaptierung / Integration einer USB2.0 High Speed Schnittstelle in ein Boundary Scan basiertes Test-System für Mikrochips:
Saved in:
Bibliographic Details
Main Author: Gaßlmaier, Rainer (Author)
Format: Book
Language:Undetermined
Published: Ingolstadt 2004
Subjects:
Item Description:Fachhochschule Ingolstadt, Diplomarb., 2004
Physical Description:90 Bl. Ill., graph. Darst. 1 CD-ROM (12 cm)

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!