Selected papers from NC-AFM 2004: the 7th International Conference on Non-Contact Atomic Microscopy Force Microscopy (Seattle, USA, 12 - 15 September 2004)
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Bibliographic Details
Corporate Author: International Conference on Non-Contact Atomic Force Microscopy Seattle, Wash (Author)
Format: Conference Proceeding Book
Language:English
Published: Philadelphia PA [u.a.] Inst. of Physics Publ. 2005
Series:Nanotechnology 16,3 : special issue
Subjects:
Item Description:Einzelaufnahme eines Zeitschr.-Heftes
Physical Description:137 S. Ill., graph. Darst.

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