Selected papers from NC-AFM 2004: the 7th International Conference on Non-Contact Atomic Microscopy Force Microscopy (Seattle, USA, 12 - 15 September 2004)
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Philadelphia PA [u.a.]
Inst. of Physics Publ.
2005
|
| Schriftenreihe: | Nanotechnology
16,3 : special issue |
| Schlagworte: | |
| Beschreibung: | Einzelaufnahme eines Zeitschr.-Heftes |
| Beschreibung: | 137 S. Ill., graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV019820067 | ||
| 003 | DE-604 | ||
| 005 | 20050525 | ||
| 007 | t | ||
| 008 | 050524s2005 ad|| |||| 10||| eng d | ||
| 035 | |a (OCoLC)634227882 | ||
| 035 | |a (DE-599)BVBBV019820067 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-384 | ||
| 111 | 2 | |a International Conference on Non-Contact Atomic Force Microscopy |n 7 |d 2004 |c Seattle, Wash. |j Verfasser |0 (DE-588)6039638-6 |4 aut | |
| 245 | 1 | 0 | |a Selected papers from NC-AFM 2004 |b the 7th International Conference on Non-Contact Atomic Microscopy Force Microscopy (Seattle, USA, 12 - 15 September 2004) |c guest ed.: U Schwarz |
| 264 | 1 | |a Philadelphia PA [u.a.] |b Inst. of Physics Publ. |c 2005 | |
| 300 | |a 137 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Nanotechnology |v 16,3 : special issue | |
| 500 | |a Einzelaufnahme eines Zeitschr.-Heftes | ||
| 650 | 0 | 7 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 2004 |z Seattle Wash. |2 gnd-content | |
| 689 | 0 | 0 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Schwarz, Udo |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-013145350 | ||
Datensatz im Suchindex
| _version_ | 1804133322416193536 |
|---|---|
| any_adam_object | |
| author_corporate | International Conference on Non-Contact Atomic Force Microscopy Seattle, Wash |
| author_corporate_role | aut |
| author_facet | International Conference on Non-Contact Atomic Force Microscopy Seattle, Wash |
| author_sort | International Conference on Non-Contact Atomic Force Microscopy Seattle, Wash |
| building | Verbundindex |
| bvnumber | BV019820067 |
| ctrlnum | (OCoLC)634227882 (DE-599)BVBBV019820067 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01301nam a2200325 cb4500</leader><controlfield tag="001">BV019820067</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20050525 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">050524s2005 ad|| |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)634227882</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV019820067</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-384</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Conference on Non-Contact Atomic Force Microscopy</subfield><subfield code="n">7</subfield><subfield code="d">2004</subfield><subfield code="c">Seattle, Wash.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)6039638-6</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Selected papers from NC-AFM 2004</subfield><subfield code="b">the 7th International Conference on Non-Contact Atomic Microscopy Force Microscopy (Seattle, USA, 12 - 15 September 2004)</subfield><subfield code="c">guest ed.: U Schwarz</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Philadelphia PA [u.a.]</subfield><subfield code="b">Inst. of Physics Publ.</subfield><subfield code="c">2005</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">137 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Nanotechnology</subfield><subfield code="v">16,3 : special issue</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Einzelaufnahme eines Zeitschr.-Heftes</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterkraftmikroskopie</subfield><subfield code="0">(DE-588)4274473-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">2004</subfield><subfield code="z">Seattle Wash.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rasterkraftmikroskopie</subfield><subfield code="0">(DE-588)4274473-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Schwarz, Udo</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-013145350</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 2004 Seattle Wash. gnd-content |
| genre_facet | Konferenzschrift 2004 Seattle Wash. |
| id | DE-604.BV019820067 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T20:06:52Z |
| institution | BVB |
| institution_GND | (DE-588)6039638-6 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-013145350 |
| oclc_num | 634227882 |
| open_access_boolean | |
| owner | DE-384 |
| owner_facet | DE-384 |
| physical | 137 S. Ill., graph. Darst. |
| publishDate | 2005 |
| publishDateSearch | 2005 |
| publishDateSort | 2005 |
| publisher | Inst. of Physics Publ. |
| record_format | marc |
| series2 | Nanotechnology |
| spelling | International Conference on Non-Contact Atomic Force Microscopy 7 2004 Seattle, Wash. Verfasser (DE-588)6039638-6 aut Selected papers from NC-AFM 2004 the 7th International Conference on Non-Contact Atomic Microscopy Force Microscopy (Seattle, USA, 12 - 15 September 2004) guest ed.: U Schwarz Philadelphia PA [u.a.] Inst. of Physics Publ. 2005 137 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Nanotechnology 16,3 : special issue Einzelaufnahme eines Zeitschr.-Heftes Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2004 Seattle Wash. gnd-content Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Schwarz, Udo Sonstige oth |
| spellingShingle | Selected papers from NC-AFM 2004 the 7th International Conference on Non-Contact Atomic Microscopy Force Microscopy (Seattle, USA, 12 - 15 September 2004) Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4274473-8 (DE-588)1071861417 |
| title | Selected papers from NC-AFM 2004 the 7th International Conference on Non-Contact Atomic Microscopy Force Microscopy (Seattle, USA, 12 - 15 September 2004) |
| title_auth | Selected papers from NC-AFM 2004 the 7th International Conference on Non-Contact Atomic Microscopy Force Microscopy (Seattle, USA, 12 - 15 September 2004) |
| title_exact_search | Selected papers from NC-AFM 2004 the 7th International Conference on Non-Contact Atomic Microscopy Force Microscopy (Seattle, USA, 12 - 15 September 2004) |
| title_full | Selected papers from NC-AFM 2004 the 7th International Conference on Non-Contact Atomic Microscopy Force Microscopy (Seattle, USA, 12 - 15 September 2004) guest ed.: U Schwarz |
| title_fullStr | Selected papers from NC-AFM 2004 the 7th International Conference on Non-Contact Atomic Microscopy Force Microscopy (Seattle, USA, 12 - 15 September 2004) guest ed.: U Schwarz |
| title_full_unstemmed | Selected papers from NC-AFM 2004 the 7th International Conference on Non-Contact Atomic Microscopy Force Microscopy (Seattle, USA, 12 - 15 September 2004) guest ed.: U Schwarz |
| title_short | Selected papers from NC-AFM 2004 |
| title_sort | selected papers from nc afm 2004 the 7th international conference on non contact atomic microscopy force microscopy seattle usa 12 15 september 2004 |
| title_sub | the 7th International Conference on Non-Contact Atomic Microscopy Force Microscopy (Seattle, USA, 12 - 15 September 2004) |
| topic | Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Rasterkraftmikroskopie Konferenzschrift 2004 Seattle Wash. |
| work_keys_str_mv | AT internationalconferenceonnoncontactatomicforcemicroscopyseattlewash selectedpapersfromncafm2004the7thinternationalconferenceonnoncontactatomicmicroscopyforcemicroscopyseattleusa1215september2004 AT schwarzudo selectedpapersfromncafm2004the7thinternationalconferenceonnoncontactatomicmicroscopyforcemicroscopyseattleusa1215september2004 |