Verfügbarkeit: Proceedings :: THWS Bibkatalog

Proceedings: [October 26 - October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA]

Gespeichert in:

Bibliographische Detailangaben
Körperschaft:	International Test Conference Charlotte, NC (VerfasserIn)
Format:	Tagungsbericht Buch
Sprache:	English
Veröffentlicht:	Piscataway, NJ IEEE 2004
Schlagworte:	Electronic digital computers > Circuits > Testing > Congresses Integrated circuits > Testing > Congresses Radio frequency > Congresses Telecommunication > Congresses Mustererkennung Medizin Integrierte Schaltung Testen Entwurf Telekommunikation Computerunterstütztes Verfahren Prüftechnik Mikroelektronik Elektronik Computersimulation Bildverstehen VLSI Datenverarbeitungssystem Maschinelles Sehen Konferenzschrift > 2004 > Charlotte NC
Beschreibung:	XVI, 1459 S. Ill., graph. Darst.
ISBN:	0780385802

Internformat

MARC


LEADER	00000nam a2200000 c 4500
001	BV019806495
003	DE-604
005	20050513
007	t
008	050511s2004 ad\|\| \|\|\|\| 10\|\|\| eng d
020			\|a 0780385802 \|9 0-7803-8580-2
035			\|a (OCoLC)65817026
035			\|a (DE-599)BVBBV019806495
040			\|a DE-604 \|b ger \|e rakwb
041	0		\|a eng
049			\|a DE-29T
050		0	\|a TK7874
082	0		\|a 621.3815/48 \|2 22
111	2		\|a International Test Conference \|n 35 \|d 2004 \|c Charlotte, NC \|j Verfasser \|0 (DE-588)6035138-X \|4 aut
245	1	0	\|a Proceedings \|b [October 26 - October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA] \|c International Test Conference 2004
264		1	\|a Piscataway, NJ \|b IEEE \|c 2004
300			\|a XVI, 1459 S. \|b Ill., graph. Darst.
336			\|b txt \|2 rdacontent
337			\|b n \|2 rdamedia
338			\|b nc \|2 rdacarrier
650		4	\|a Electronic digital computers \|x Circuits \|x Testing \|v Congresses
650		4	\|a Integrated circuits \|x Testing \|v Congresses
650		4	\|a Radio frequency \|v Congresses
650		4	\|a Telecommunication \|v Congresses
650	0	7	\|a Mustererkennung \|0 (DE-588)4040936-3 \|2 gnd \|9 rswk-swf
650	0	7	\|a Medizin \|0 (DE-588)4038243-6 \|2 gnd \|9 rswk-swf
650	0	7	\|a Integrierte Schaltung \|0 (DE-588)4027242-4 \|2 gnd \|9 rswk-swf
650	0	7	\|a Testen \|0 (DE-588)4367264-4 \|2 gnd \|9 rswk-swf
650	0	7	\|a Entwurf \|0 (DE-588)4121208-3 \|2 gnd \|9 rswk-swf
650	0	7	\|a Telekommunikation \|0 (DE-588)4059360-5 \|2 gnd \|9 rswk-swf
650	0	7	\|a Computerunterstütztes Verfahren \|0 (DE-588)4139030-1 \|2 gnd \|9 rswk-swf
650	0	7	\|a Prüftechnik \|0 (DE-588)4047610-8 \|2 gnd \|9 rswk-swf
650	0	7	\|a Mikroelektronik \|0 (DE-588)4039207-7 \|2 gnd \|9 rswk-swf
650	0	7	\|a Elektronik \|0 (DE-588)4014346-6 \|2 gnd \|9 rswk-swf
650	0	7	\|a Computersimulation \|0 (DE-588)4148259-1 \|2 gnd \|9 rswk-swf
650	0	7	\|a Bildverstehen \|0 (DE-588)4202022-0 \|2 gnd \|9 rswk-swf
650	0	7	\|a VLSI \|0 (DE-588)4117388-0 \|2 gnd \|9 rswk-swf
650	0	7	\|a Datenverarbeitungssystem \|0 (DE-588)4125229-9 \|2 gnd \|9 rswk-swf
650	0	7	\|a Maschinelles Sehen \|0 (DE-588)4129594-8 \|2 gnd \|9 rswk-swf
655		7	\|0 (DE-588)1071861417 \|a Konferenzschrift \|y 2004 \|z Charlotte NC \|2 gnd-content
689	0	0	\|a Mikroelektronik \|0 (DE-588)4039207-7 \|D s
689	0	1	\|a Prüftechnik \|0 (DE-588)4047610-8 \|D s
689	0		\|5 DE-604
689	1	0	\|a Integrierte Schaltung \|0 (DE-588)4027242-4 \|D s
689	1	1	\|a Testen \|0 (DE-588)4367264-4 \|D s
689	1		\|5 DE-604
689	2	0	\|a Integrierte Schaltung \|0 (DE-588)4027242-4 \|D s
689	2	1	\|a Prüftechnik \|0 (DE-588)4047610-8 \|D s
689	2		\|8 1\p \|5 DE-604
689	3	0	\|a Datenverarbeitungssystem \|0 (DE-588)4125229-9 \|D s
689	3	1	\|a Computersimulation \|0 (DE-588)4148259-1 \|D s
689	3		\|8 2\p \|5 DE-604
689	4	0	\|a Telekommunikation \|0 (DE-588)4059360-5 \|D s
689	4	1	\|a Computersimulation \|0 (DE-588)4148259-1 \|D s
689	4		\|8 3\p \|5 DE-604
689	5	0	\|a Elektronik \|0 (DE-588)4014346-6 \|D s
689	5	1	\|a Testen \|0 (DE-588)4367264-4 \|D s
689	5		\|8 4\p \|5 DE-604
689	6	0	\|a VLSI \|0 (DE-588)4117388-0 \|D s
689	6	1	\|a Entwurf \|0 (DE-588)4121208-3 \|D s
689	6		\|8 5\p \|5 DE-604
689	7	0	\|a Computerunterstütztes Verfahren \|0 (DE-588)4139030-1 \|D s
689	7	1	\|a Medizin \|0 (DE-588)4038243-6 \|D s
689	7		\|8 6\p \|5 DE-604
689	8	0	\|a Bildverstehen \|0 (DE-588)4202022-0 \|D s
689	8	1	\|a Maschinelles Sehen \|0 (DE-588)4129594-8 \|D s
689	8		\|8 7\p \|5 DE-604
689	9	0	\|a Mustererkennung \|0 (DE-588)4040936-3 \|D s
689	9	1	\|a Maschinelles Sehen \|0 (DE-588)4129594-8 \|D s
689	9		\|8 8\p \|5 DE-604
999			\|a oai:aleph.bib-bvb.de:BVB01-013131987
883	1		\|8 1\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 2\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 3\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 4\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 5\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 6\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 7\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 8\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk

Datensatz im Suchindex

_version_	1804133302657875968
any_adam_object
author_corporate	International Test Conference Charlotte, NC
author_corporate_role	aut
author_facet	International Test Conference Charlotte, NC
author_sort	International Test Conference Charlotte, NC
building	Verbundindex
bvnumber	BV019806495
callnumber-first	T - Technology
callnumber-label	TK7874
callnumber-raw	TK7874
callnumber-search	TK7874
callnumber-sort	TK 47874
callnumber-subject	TK - Electrical and Nuclear Engineering
ctrlnum	(OCoLC)65817026 (DE-599)BVBBV019806495
dewey-full	621.3815/48
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	621 - Applied physics
dewey-raw	621.3815/48
dewey-search	621.3815/48
dewey-sort	3621.3815 248
dewey-tens	620 - Engineering and allied operations
discipline	Elektrotechnik / Elektronik / Nachrichtentechnik
format	Conference Proceeding Book
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>04225nam a2200973 c 4500</leader><controlfield tag="001">BV019806495</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20050513 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">050511s2004 ad\|\| \|\|\|\| 10\|\|\| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780385802</subfield><subfield code="9">0-7803-8580-2</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)65817026</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV019806495</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/48</subfield><subfield code="2">22</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Test Conference</subfield><subfield code="n">35</subfield><subfield code="d">2004</subfield><subfield code="c">Charlotte, NC</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)6035138-X</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings</subfield><subfield code="b">[October 26 - October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA]</subfield><subfield code="c">International Test Conference 2004</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, NJ</subfield><subfield code="b">IEEE</subfield><subfield code="c">2004</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVI, 1459 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic digital computers</subfield><subfield code="x">Circuits</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Radio frequency</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Telecommunication</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mustererkennung</subfield><subfield code="0">(DE-588)4040936-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Medizin</subfield><subfield code="0">(DE-588)4038243-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Entwurf</subfield><subfield code="0">(DE-588)4121208-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Telekommunikation</subfield><subfield code="0">(DE-588)4059360-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Computerunterstütztes Verfahren</subfield><subfield code="0">(DE-588)4139030-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Bildverstehen</subfield><subfield code="0">(DE-588)4202022-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Datenverarbeitungssystem</subfield><subfield code="0">(DE-588)4125229-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Maschinelles Sehen</subfield><subfield code="0">(DE-588)4129594-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">2004</subfield><subfield code="z">Charlotte NC</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Datenverarbeitungssystem</subfield><subfield code="0">(DE-588)4125229-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2="1"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Telekommunikation</subfield><subfield code="0">(DE-588)4059360-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2="1"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="5" ind2="0"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2=" "><subfield code="8">4\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="6" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="6" ind2="1"><subfield code="a">Entwurf</subfield><subfield code="0">(DE-588)4121208-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="6" ind2=" "><subfield code="8">5\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="7" ind2="0"><subfield code="a">Computerunterstütztes Verfahren</subfield><subfield code="0">(DE-588)4139030-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="7" ind2="1"><subfield code="a">Medizin</subfield><subfield code="0">(DE-588)4038243-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="7" ind2=" "><subfield code="8">6\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="8" ind2="0"><subfield code="a">Bildverstehen</subfield><subfield code="0">(DE-588)4202022-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="8" ind2="1"><subfield code="a">Maschinelles Sehen</subfield><subfield code="0">(DE-588)4129594-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="8" ind2=" "><subfield code="8">7\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="9" ind2="0"><subfield code="a">Mustererkennung</subfield><subfield code="0">(DE-588)4040936-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="9" ind2="1"><subfield code="a">Maschinelles Sehen</subfield><subfield code="0">(DE-588)4129594-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="9" ind2=" "><subfield code="8">8\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-013131987</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">4\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">5\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">6\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">7\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">8\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection>
genre	(DE-588)1071861417 Konferenzschrift 2004 Charlotte NC gnd-content
genre_facet	Konferenzschrift 2004 Charlotte NC
id	DE-604.BV019806495
illustrated	Illustrated
indexdate	2024-07-09T20:06:34Z
institution	BVB
institution_GND	(DE-588)6035138-X
isbn	0780385802
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-013131987
oclc_num	65817026
open_access_boolean
owner	DE-29T
owner_facet	DE-29T
physical	XVI, 1459 S. Ill., graph. Darst.
publishDate	2004
publishDateSearch	2004
publishDateSort	2004
publisher	IEEE
record_format	marc
spelling	International Test Conference 35 2004 Charlotte, NC Verfasser (DE-588)6035138-X aut Proceedings [October 26 - October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA] International Test Conference 2004 Piscataway, NJ IEEE 2004 XVI, 1459 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electronic digital computers Circuits Testing Congresses Integrated circuits Testing Congresses Radio frequency Congresses Telecommunication Congresses Mustererkennung (DE-588)4040936-3 gnd rswk-swf Medizin (DE-588)4038243-6 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Entwurf (DE-588)4121208-3 gnd rswk-swf Telekommunikation (DE-588)4059360-5 gnd rswk-swf Computerunterstütztes Verfahren (DE-588)4139030-1 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf Computersimulation (DE-588)4148259-1 gnd rswk-swf Bildverstehen (DE-588)4202022-0 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Datenverarbeitungssystem (DE-588)4125229-9 gnd rswk-swf Maschinelles Sehen (DE-588)4129594-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2004 Charlotte NC gnd-content Mikroelektronik (DE-588)4039207-7 s Prüftechnik (DE-588)4047610-8 s DE-604 Integrierte Schaltung (DE-588)4027242-4 s Testen (DE-588)4367264-4 s 1\p DE-604 Datenverarbeitungssystem (DE-588)4125229-9 s Computersimulation (DE-588)4148259-1 s 2\p DE-604 Telekommunikation (DE-588)4059360-5 s 3\p DE-604 Elektronik (DE-588)4014346-6 s 4\p DE-604 VLSI (DE-588)4117388-0 s Entwurf (DE-588)4121208-3 s 5\p DE-604 Computerunterstütztes Verfahren (DE-588)4139030-1 s Medizin (DE-588)4038243-6 s 6\p DE-604 Bildverstehen (DE-588)4202022-0 s Maschinelles Sehen (DE-588)4129594-8 s 7\p DE-604 Mustererkennung (DE-588)4040936-3 s 8\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 7\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 8\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Proceedings [October 26 - October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA] Electronic digital computers Circuits Testing Congresses Integrated circuits Testing Congresses Radio frequency Congresses Telecommunication Congresses Mustererkennung (DE-588)4040936-3 gnd Medizin (DE-588)4038243-6 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Testen (DE-588)4367264-4 gnd Entwurf (DE-588)4121208-3 gnd Telekommunikation (DE-588)4059360-5 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd Prüftechnik (DE-588)4047610-8 gnd Mikroelektronik (DE-588)4039207-7 gnd Elektronik (DE-588)4014346-6 gnd Computersimulation (DE-588)4148259-1 gnd Bildverstehen (DE-588)4202022-0 gnd VLSI (DE-588)4117388-0 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Maschinelles Sehen (DE-588)4129594-8 gnd
subject_GND	(DE-588)4040936-3 (DE-588)4038243-6 (DE-588)4027242-4 (DE-588)4367264-4 (DE-588)4121208-3 (DE-588)4059360-5 (DE-588)4139030-1 (DE-588)4047610-8 (DE-588)4039207-7 (DE-588)4014346-6 (DE-588)4148259-1 (DE-588)4202022-0 (DE-588)4117388-0 (DE-588)4125229-9 (DE-588)4129594-8 (DE-588)1071861417
title	Proceedings [October 26 - October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA]
title_auth	Proceedings [October 26 - October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA]
title_exact_search	Proceedings [October 26 - October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA]
title_full	Proceedings [October 26 - October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA] International Test Conference 2004
title_fullStr	Proceedings [October 26 - October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA] International Test Conference 2004
title_full_unstemmed	Proceedings [October 26 - October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA] International Test Conference 2004
title_short	Proceedings
title_sort	proceedings october 26 october 28 2004 charlotte convention center charlotte nc usa
title_sub	[October 26 - October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA]
topic	Electronic digital computers Circuits Testing Congresses Integrated circuits Testing Congresses Radio frequency Congresses Telecommunication Congresses Mustererkennung (DE-588)4040936-3 gnd Medizin (DE-588)4038243-6 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Testen (DE-588)4367264-4 gnd Entwurf (DE-588)4121208-3 gnd Telekommunikation (DE-588)4059360-5 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd Prüftechnik (DE-588)4047610-8 gnd Mikroelektronik (DE-588)4039207-7 gnd Elektronik (DE-588)4014346-6 gnd Computersimulation (DE-588)4148259-1 gnd Bildverstehen (DE-588)4202022-0 gnd VLSI (DE-588)4117388-0 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Maschinelles Sehen (DE-588)4129594-8 gnd
topic_facet	Electronic digital computers Circuits Testing Congresses Integrated circuits Testing Congresses Radio frequency Congresses Telecommunication Congresses Mustererkennung Medizin Integrierte Schaltung Testen Entwurf Telekommunikation Computerunterstütztes Verfahren Prüftechnik Mikroelektronik Elektronik Computersimulation Bildverstehen VLSI Datenverarbeitungssystem Maschinelles Sehen Konferenzschrift 2004 Charlotte NC
work_keys_str_mv	AT internationaltestconferencecharlottenc proceedingsoctober26october282004charlotteconventioncentercharlottencusa

Verfügbarkeit

Es ist kein Print-Exemplar vorhanden.

Fernleihe Bestellen Achtung: Nicht im THWS-Bestand!

MARC

Datensatz im Suchindex

Es ist kein Print-Exemplar vorhanden.

Ähnliche Einträge