Surface analysis by Auger and x-ray photoelectron spectroscopy:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Chichester [u.a.]
IM Publications [u.a.]
2003
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XI, 899 S. Ill., graph. Darst. |
| ISBN: | 9781901019049 1901019047 |
Internformat
MARC
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| 245 | 1 | 0 | |a Surface analysis by Auger and x-ray photoelectron spectroscopy |c ed. by David Briggs ... |
| 264 | 1 | |a Chichester [u.a.] |b IM Publications [u.a.] |c 2003 | |
| 300 | |a XI, 899 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Electron spectroscopy | |
| 650 | 4 | |a Surfaces (Technology) |x Analysis | |
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| 650 | 0 | 7 | |a Röntgen-Photoelektronenspektroskopie |0 (DE-588)4076787-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Auger-Spektroskopie |0 (DE-588)4122843-1 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |D s |
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| 689 | 0 | 2 | |a Auger-Spektroskopie |0 (DE-588)4122843-1 |D s |
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Datensatz im Suchindex
| _version_ | 1804133244401090560 |
|---|---|
| adam_text | Contents v
Contents
Preface ix
Dedication xi
Perspectives and basic principles
1. Perspectives on XPS and AES 1
David Briggs and John T. Grant
2. XPS: Basic Principles, Spectral Features and Qualitative Analysis 31
David Briggs
3. AES: Basic Principles, Spectral Features and Qualitative Analysis 57
John T. Grant
Sample handling, instrumentation and beam effects
4. Specimen Preparation and Handling 89
Joseph Geller
5. XPS: Instrumentation and Performance 117
Ian W. Drummond
6. AES Instrumentation and Performance 145
Masato Kudo
7. Instrument Calibration for AES and XPS 167
Martin P. Seah
8. Analysing Insulators with XPS and AES 191
Michael A. Kelly
9. Beam Effects During AES and XPS Analysis 211
Don R. Baer, Dan J. Gaspar, MarkH. Engelhard and A.Scott Lea
Surface sensitivity
10. Electron Transport in Solids 235
Wolfgang S.M. Werner
11. Electron Attenuation Lengths 259
Shigeo Tanuma
vi
Quantification
12. Quantification of Nano structures by Electron Spectroscopy 295
Sven Tougaard
13. Quantification in AES and XPS 345
Martin P. Seah
Spectral interpretation
14. The Use of Chemometrics in AES and XPS Data Treatment 377
William F. Stickle
15. XPS Lineshapes and Curve Fitting 397
Neal Fairley
16. Chemical Effects in XPS 421
Laszlo Kover
17. Chemical Information from Auger Lineshapes 465
David E. Ramaker
18. The Auger Parameter 501
Giuliano Moretti
19. Valence Bands Studied by XPS 531
Peter MA. Sherwood
Structural effects
20. Structural Effects in XPS and AES: Diffraction 557
J. Osterwalder
21. Electron Backscattering and Channelling 587
Ding Ze jun and Ryuichi Shimizu
Depth profiling
22. Sputter Depth Profiling in AES and XPS 619
Thomas Wagner, Jiang Y. Wang and Siegfried Hofinann
23. Angle Resolved X Ray Photoelectron Spectroscopy 651
Peter J. Cumpson
Imaging
24. XPS Imaging 677
Kateryna Artyushkova and Julia E. Fulghum
25. Processing, Interpretation and Quantification of Auger Images
Martin Prutton
Surface Analysis by Auger and X ray Photoelectron Spectroscopy vii
Developing aspects
26. X ray Photoelectron Spectroscopy and Imaging at Synchrotrons 733
G. Margaritondo
27. Total Reflection X ray Photoelectron Spectroscopy 749
Yoshitoki Iijima
28. Ion Excited Auger Electron Spectroscopy 763
John T. Grant
29. Positron Annihilation Induced Auger Electron Spectroscopy 775
Toshiyuki Ohdaira and Ryoichi Suzuki
30. Electron Coincidence Measurements 787
Stephen M. Thurgate
31. Recent Developments in the Theory of Auger Spectroscopy 797
Peter Weightman
Appendices
A. Peak Positions from Mg X Rays and from Al X Rays by
Atomic Number 815
B. Peak Positions from Mg X Rays and from Al X Rays in
Numerical Order 821
C. Auger Kinetic Energies and Sensitivity Factors by Atomic Number 825
D. Auger Kinetic Energies in Numerical Order 831
E. Polymer C Is Chemical Shifts 839
F. Comparing Beam Damage Rates Using Susceptibility Tables 843
D.R. Baer, M.H. Engelhard, A.S. Lea and D.J. Gaspar
G. Manufacturers of AES and XPS Systems 857
John T. Grant
H. Software for Processing AES and XPS Data 861
John T. Grant
I. Databases 869
John T. Grant
viii
J. Measurement and Documentary Standards 875
John T. Grant
K. Internet Resources 881
John T. Grant
Subject Index 885
|
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| dewey-ones | 543 - Analytical chemistry |
| dewey-raw | 543.62 |
| dewey-search | 543.62 |
| dewey-sort | 3543.62 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik |
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| id | DE-604.BV019766014 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T20:05:38Z |
| institution | BVB |
| isbn | 9781901019049 1901019047 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-013092261 |
| oclc_num | 56437120 |
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| owner_facet | DE-91G DE-BY-TUM DE-706 DE-20 DE-11 DE-384 DE-29T |
| physical | XI, 899 S. Ill., graph. Darst. |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | IM Publications [u.a.] |
| record_format | marc |
| spelling | Surface analysis by Auger and x-ray photoelectron spectroscopy ed. by David Briggs ... Chichester [u.a.] IM Publications [u.a.] 2003 XI, 899 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electron spectroscopy Surfaces (Technology) Analysis Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd rswk-swf Auger-Spektroskopie (DE-588)4122843-1 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 s Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 s Auger-Spektroskopie (DE-588)4122843-1 s DE-604 Briggs, David Sonstige oth HBZ Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=013092261&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Surface analysis by Auger and x-ray photoelectron spectroscopy Electron spectroscopy Surfaces (Technology) Analysis Oberflächenanalyse (DE-588)4172243-7 gnd Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd Auger-Spektroskopie (DE-588)4122843-1 gnd |
| subject_GND | (DE-588)4172243-7 (DE-588)4076787-5 (DE-588)4122843-1 |
| title | Surface analysis by Auger and x-ray photoelectron spectroscopy |
| title_auth | Surface analysis by Auger and x-ray photoelectron spectroscopy |
| title_exact_search | Surface analysis by Auger and x-ray photoelectron spectroscopy |
| title_full | Surface analysis by Auger and x-ray photoelectron spectroscopy ed. by David Briggs ... |
| title_fullStr | Surface analysis by Auger and x-ray photoelectron spectroscopy ed. by David Briggs ... |
| title_full_unstemmed | Surface analysis by Auger and x-ray photoelectron spectroscopy ed. by David Briggs ... |
| title_short | Surface analysis by Auger and x-ray photoelectron spectroscopy |
| title_sort | surface analysis by auger and x ray photoelectron spectroscopy |
| topic | Electron spectroscopy Surfaces (Technology) Analysis Oberflächenanalyse (DE-588)4172243-7 gnd Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd Auger-Spektroskopie (DE-588)4122843-1 gnd |
| topic_facet | Electron spectroscopy Surfaces (Technology) Analysis Oberflächenanalyse Röntgen-Photoelektronenspektroskopie Auger-Spektroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=013092261&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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