Intrinsic point defects, impurities, and their diffusion in silicon:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Wien [u.a.]
Springer
2004
|
| Schriftenreihe: | Computational microelectronics
|
| Schlagworte: | |
| Beschreibung: | Zugl.: Erlangen-Nürnberg, Univ., Habil.-Schr., 2004 |
| Beschreibung: | XXI, 554 S. graph. Darst. |
| ISBN: | 3211206876 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV019374867 | ||
| 003 | DE-604 | ||
| 005 | 20111216 | ||
| 007 | t | ||
| 008 | 040826s2004 d||| m||| 00||| eng d | ||
| 020 | |a 3211206876 |9 3-211-20687-6 | ||
| 035 | |a (OCoLC)55963103 | ||
| 035 | |a (DE-599)BVBBV019374867 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29 |a DE-29T | ||
| 050 | 0 | |a TK7871.15.S55 | |
| 082 | 0 | |a 620.193 |2 22 | |
| 084 | |a UP 2100 |0 (DE-625)146354: |2 rvk | ||
| 100 | 1 | |a Pichler, Peter |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Intrinsic point defects, impurities, and their diffusion in silicon |c Peter Pichler |
| 264 | 1 | |a Wien [u.a.] |b Springer |c 2004 | |
| 300 | |a XXI, 554 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Computational microelectronics | |
| 500 | |a Zugl.: Erlangen-Nürnberg, Univ., Habil.-Schr., 2004 | ||
| 650 | 4 | |a Semiconductors |x Diffusion | |
| 650 | 4 | |a Silicon crystals |x Defects | |
| 650 | 0 | 7 | |a Diffusion |0 (DE-588)4012277-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Störstelle |0 (DE-588)4193400-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Silicium |0 (DE-588)4077445-4 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Silicium |0 (DE-588)4077445-4 |D s |
| 689 | 0 | 1 | |a Störstelle |0 (DE-588)4193400-3 |D s |
| 689 | 0 | 2 | |a Diffusion |0 (DE-588)4012277-3 |D s |
| 689 | 0 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-012838152 | ||
Datensatz im Suchindex
| _version_ | 1804132815991734272 |
|---|---|
| any_adam_object | |
| author | Pichler, Peter |
| author_facet | Pichler, Peter |
| author_role | aut |
| author_sort | Pichler, Peter |
| author_variant | p p pp |
| building | Verbundindex |
| bvnumber | BV019374867 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871.15.S55 |
| callnumber-search | TK7871.15.S55 |
| callnumber-sort | TK 47871.15 S55 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | UP 2100 |
| ctrlnum | (OCoLC)55963103 (DE-599)BVBBV019374867 |
| dewey-full | 620.193 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.193 |
| dewey-search | 620.193 |
| dewey-sort | 3620.193 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01458nam a2200433 c 4500</leader><controlfield tag="001">BV019374867</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20111216 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">040826s2004 d||| m||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3211206876</subfield><subfield code="9">3-211-20687-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)55963103</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV019374867</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29</subfield><subfield code="a">DE-29T</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7871.15.S55</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620.193</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 2100</subfield><subfield code="0">(DE-625)146354:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Pichler, Peter</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Intrinsic point defects, impurities, and their diffusion in silicon</subfield><subfield code="c">Peter Pichler</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Wien [u.a.]</subfield><subfield code="b">Springer</subfield><subfield code="c">2004</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXI, 554 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Computational microelectronics</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Zugl.: Erlangen-Nürnberg, Univ., Habil.-Schr., 2004</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Diffusion</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Silicon crystals</subfield><subfield code="x">Defects</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Diffusion</subfield><subfield code="0">(DE-588)4012277-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Störstelle</subfield><subfield code="0">(DE-588)4193400-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Silicium</subfield><subfield code="0">(DE-588)4077445-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4113937-9</subfield><subfield code="a">Hochschulschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Silicium</subfield><subfield code="0">(DE-588)4077445-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Störstelle</subfield><subfield code="0">(DE-588)4193400-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Diffusion</subfield><subfield code="0">(DE-588)4012277-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-012838152</subfield></datafield></record></collection> |
| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV019374867 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T19:58:49Z |
| institution | BVB |
| isbn | 3211206876 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-012838152 |
| oclc_num | 55963103 |
| open_access_boolean | |
| owner | DE-29 DE-29T |
| owner_facet | DE-29 DE-29T |
| physical | XXI, 554 S. graph. Darst. |
| publishDate | 2004 |
| publishDateSearch | 2004 |
| publishDateSort | 2004 |
| publisher | Springer |
| record_format | marc |
| series2 | Computational microelectronics |
| spelling | Pichler, Peter Verfasser aut Intrinsic point defects, impurities, and their diffusion in silicon Peter Pichler Wien [u.a.] Springer 2004 XXI, 554 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Computational microelectronics Zugl.: Erlangen-Nürnberg, Univ., Habil.-Schr., 2004 Semiconductors Diffusion Silicon crystals Defects Diffusion (DE-588)4012277-3 gnd rswk-swf Störstelle (DE-588)4193400-3 gnd rswk-swf Silicium (DE-588)4077445-4 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Silicium (DE-588)4077445-4 s Störstelle (DE-588)4193400-3 s Diffusion (DE-588)4012277-3 s DE-604 |
| spellingShingle | Pichler, Peter Intrinsic point defects, impurities, and their diffusion in silicon Semiconductors Diffusion Silicon crystals Defects Diffusion (DE-588)4012277-3 gnd Störstelle (DE-588)4193400-3 gnd Silicium (DE-588)4077445-4 gnd |
| subject_GND | (DE-588)4012277-3 (DE-588)4193400-3 (DE-588)4077445-4 (DE-588)4113937-9 |
| title | Intrinsic point defects, impurities, and their diffusion in silicon |
| title_auth | Intrinsic point defects, impurities, and their diffusion in silicon |
| title_exact_search | Intrinsic point defects, impurities, and their diffusion in silicon |
| title_full | Intrinsic point defects, impurities, and their diffusion in silicon Peter Pichler |
| title_fullStr | Intrinsic point defects, impurities, and their diffusion in silicon Peter Pichler |
| title_full_unstemmed | Intrinsic point defects, impurities, and their diffusion in silicon Peter Pichler |
| title_short | Intrinsic point defects, impurities, and their diffusion in silicon |
| title_sort | intrinsic point defects impurities and their diffusion in silicon |
| topic | Semiconductors Diffusion Silicon crystals Defects Diffusion (DE-588)4012277-3 gnd Störstelle (DE-588)4193400-3 gnd Silicium (DE-588)4077445-4 gnd |
| topic_facet | Semiconductors Diffusion Silicon crystals Defects Diffusion Störstelle Silicium Hochschulschrift |
| work_keys_str_mv | AT pichlerpeter intrinsicpointdefectsimpuritiesandtheirdiffusioninsilicon |