Surface and interface analysis:
Saved in:
| Format: | Conference Proceeding Book |
|---|---|
| Language: | English |
| Published: |
Tokyo
Japan Soc. of Applied Physics
2003
|
| Series: | Japanese journal of applied physics
42,7B : special issue |
| Subjects: | |
| Item Description: | Einzelaufnahme eines Zeitschr.-H. - Beigef.: Scanning probe microscopy |
| Physical Description: | S. 4621 - 4904 Ill., graph. Darst. |
Staff View
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV019325888 | ||
| 003 | DE-604 | ||
| 005 | 20040706 | ||
| 007 | t | ||
| 008 | 040617s2003 ad|| |||| 10||| eng d | ||
| 035 | |a (OCoLC)52836362 | ||
| 035 | |a (DE-599)BVBBV019325888 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-384 | ||
| 050 | 0 | |a QC1 | |
| 245 | 1 | 0 | |a Surface and interface analysis |c ed. by Akira Sakai ... |
| 246 | 1 | 3 | |a Scanning probe microscopy |
| 264 | 1 | |a Tokyo |b Japan Soc. of Applied Physics |c 2003 | |
| 300 | |a S. 4621 - 4904 |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Japanese journal of applied physics |v 42,7B : special issue | |
| 500 | |a Einzelaufnahme eines Zeitschr.-H. - Beigef.: Scanning probe microscopy | ||
| 650 | 4 | |a Surface chemistry |v Congresses | |
| 650 | 4 | |a Surfaces (Physics) |v Congresses | |
| 650 | 4 | |a Thin films |v Congresses | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 700 | 1 | |a Sakai, Akira |e Sonstige |4 oth | |
| 711 | 2 | |a Asia Pacific Surface and Interface Analysis Conference |d 2002 |c Tokio |j Sonstige |0 (DE-588)5554116-1 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-012792975 | ||
Record in the Search Index
| _version_ | 1804132745803202560 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV019325888 |
| callnumber-first | Q - Science |
| callnumber-label | QC1 |
| callnumber-raw | QC1 |
| callnumber-search | QC1 |
| callnumber-sort | QC 11 |
| callnumber-subject | QC - Physics |
| ctrlnum | (OCoLC)52836362 (DE-599)BVBBV019325888 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01224nam a2200349 cb4500</leader><controlfield tag="001">BV019325888</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20040706 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">040617s2003 ad|| |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)52836362</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV019325888</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-384</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QC1</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Surface and interface analysis</subfield><subfield code="c">ed. by Akira Sakai ...</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Scanning probe microscopy</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Tokyo</subfield><subfield code="b">Japan Soc. of Applied Physics</subfield><subfield code="c">2003</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">S. 4621 - 4904</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Japanese journal of applied physics</subfield><subfield code="v">42,7B : special issue</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Einzelaufnahme eines Zeitschr.-H. - Beigef.: Scanning probe microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surface chemistry</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surfaces (Physics)</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Thin films</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Sakai, Akira</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">Asia Pacific Surface and Interface Analysis Conference</subfield><subfield code="d">2002</subfield><subfield code="c">Tokio</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)5554116-1</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-012792975</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV019325888 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T19:57:43Z |
| institution | BVB |
| institution_GND | (DE-588)5554116-1 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-012792975 |
| oclc_num | 52836362 |
| open_access_boolean | |
| owner | DE-384 |
| owner_facet | DE-384 |
| physical | S. 4621 - 4904 Ill., graph. Darst. |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Japan Soc. of Applied Physics |
| record_format | marc |
| series2 | Japanese journal of applied physics |
| spelling | Surface and interface analysis ed. by Akira Sakai ... Scanning probe microscopy Tokyo Japan Soc. of Applied Physics 2003 S. 4621 - 4904 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Japanese journal of applied physics 42,7B : special issue Einzelaufnahme eines Zeitschr.-H. - Beigef.: Scanning probe microscopy Surface chemistry Congresses Surfaces (Physics) Congresses Thin films Congresses (DE-588)1071861417 Konferenzschrift gnd-content Sakai, Akira Sonstige oth Asia Pacific Surface and Interface Analysis Conference 2002 Tokio Sonstige (DE-588)5554116-1 oth |
| spellingShingle | Surface and interface analysis Surface chemistry Congresses Surfaces (Physics) Congresses Thin films Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Surface and interface analysis |
| title_alt | Scanning probe microscopy |
| title_auth | Surface and interface analysis |
| title_exact_search | Surface and interface analysis |
| title_full | Surface and interface analysis ed. by Akira Sakai ... |
| title_fullStr | Surface and interface analysis ed. by Akira Sakai ... |
| title_full_unstemmed | Surface and interface analysis ed. by Akira Sakai ... |
| title_short | Surface and interface analysis |
| title_sort | surface and interface analysis |
| topic | Surface chemistry Congresses Surfaces (Physics) Congresses Thin films Congresses |
| topic_facet | Surface chemistry Congresses Surfaces (Physics) Congresses Thin films Congresses Konferenzschrift |
| work_keys_str_mv | AT sakaiakira surfaceandinterfaceanalysis AT asiapacificsurfaceandinterfaceanalysisconferencetokio surfaceandinterfaceanalysis AT sakaiakira scanningprobemicroscopy AT asiapacificsurfaceandinterfaceanalysisconferencetokio scanningprobemicroscopy |