Surface and interface analysis:
Gespeichert in:
Format: | Tagungsbericht Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
Tokyo
Japan Soc. of Applied Physics
2003
|
Schriftenreihe: | Japanese journal of applied physics
42,7B : special issue |
Schlagworte: | |
Beschreibung: | Einzelaufnahme eines Zeitschr.-H. - Beigef.: Scanning probe microscopy |
Beschreibung: | S. 4621 - 4904 Ill., graph. Darst. |
Internformat
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Datensatz im Suchindex
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indexdate | 2024-07-09T19:57:43Z |
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physical | S. 4621 - 4904 Ill., graph. Darst. |
publishDate | 2003 |
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spelling | Surface and interface analysis ed. by Akira Sakai ... Scanning probe microscopy Tokyo Japan Soc. of Applied Physics 2003 S. 4621 - 4904 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Japanese journal of applied physics 42,7B : special issue Einzelaufnahme eines Zeitschr.-H. - Beigef.: Scanning probe microscopy Surface chemistry Congresses Surfaces (Physics) Congresses Thin films Congresses (DE-588)1071861417 Konferenzschrift gnd-content Sakai, Akira Sonstige oth Asia Pacific Surface and Interface Analysis Conference 2002 Tokio Sonstige (DE-588)5554116-1 oth |
spellingShingle | Surface and interface analysis Surface chemistry Congresses Surfaces (Physics) Congresses Thin films Congresses |
subject_GND | (DE-588)1071861417 |
title | Surface and interface analysis |
title_alt | Scanning probe microscopy |
title_auth | Surface and interface analysis |
title_exact_search | Surface and interface analysis |
title_full | Surface and interface analysis ed. by Akira Sakai ... |
title_fullStr | Surface and interface analysis ed. by Akira Sakai ... |
title_full_unstemmed | Surface and interface analysis ed. by Akira Sakai ... |
title_short | Surface and interface analysis |
title_sort | surface and interface analysis |
topic | Surface chemistry Congresses Surfaces (Physics) Congresses Thin films Congresses |
topic_facet | Surface chemistry Congresses Surfaces (Physics) Congresses Thin films Congresses Konferenzschrift |
work_keys_str_mv | AT sakaiakira surfaceandinterfaceanalysis AT asiapacificsurfaceandinterfaceanalysisconferencetokio surfaceandinterfaceanalysis AT sakaiakira scanningprobemicroscopy AT asiapacificsurfaceandinterfaceanalysisconferencetokio scanningprobemicroscopy |