Direct profiling of III/V semiconductor nanostructures at the atomic level by cross-sectional scanning tunneling microscopy:
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Bibliographic Details
Main Author: Bruls, Dominique Maria (Author)
Format: Book
Language:English
Published: Eindhoven 2003
Subjects:
Item Description:Eindhoven, Techn. Univ., Diss., 2003
Physical Description:119 S. Ill., graph. Darst.
ISBN:9038616155

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