Bruls, D. M. (2003). Direct profiling of III/V semiconductor nanostructures at the atomic level by cross-sectional scanning tunneling microscopy.
Chicago-Zitierstil (17. Ausg.)Bruls, Dominique Maria. Direct Profiling of III/V Semiconductor Nanostructures at the Atomic Level by Cross-sectional Scanning Tunneling Microscopy. Eindhoven, 2003.
MLA-Zitierstil (9. Ausg.)Bruls, Dominique Maria. Direct Profiling of III/V Semiconductor Nanostructures at the Atomic Level by Cross-sectional Scanning Tunneling Microscopy. 2003.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.