High energy electron diffraction and microscopy:
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Oxford [u.a.]
Oxford Univ. Press
2004
|
| Ausgabe: | 1. publ. |
| Schriftenreihe: | Monographs on the physics and chemistry of materials
61 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XXI, 535 S. Ill., graph. Darst. |
| ISBN: | 0198500742 |
Internformat
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| 100 | 1 | |a Peng, Lian-Mao |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a High energy electron diffraction and microscopy |c L.-M. Peng ; S. L. Dudarev ; M. J. Whelan |
| 250 | |a 1. publ. | ||
| 264 | 1 | |a Oxford [u.a.] |b Oxford Univ. Press |c 2004 | |
| 300 | |a XXI, 535 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Monographs on the physics and chemistry of materials |v 61 | |
| 490 | 0 | |a Oxford science publications | |
| 650 | 4 | |a Electron microscopy | |
| 650 | 4 | |a High energy electron diffraction | |
| 650 | 4 | |a Materials science | |
| 650 | 4 | |a Microscopy, Electron | |
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Datensatz im Suchindex
| _version_ | 1804130342285606912 |
|---|---|
| adam_text | CONTENTS
Basic concepts of high-energy electron diffraction
1
1.1
Introduction
1
1.2
The interaction between high-energy electrons and
a solid
2
1.3
Elastic and inelastic scattering, and the complex
potential
3
1.4
The amplitude and the differential cross-section of
scattering of electrons
4
1.5
Elastic scattering by a time-independent potential
-
the one-body
Schrödinger
equation
6
1.6
Selected area electron diffraction (SAED), convergent-
beam electron diffraction (CBED), and Kikuchi
patterns
8
1.7
Scattering by time-dependent fluctuations of the
potential
11
1.8
Damping of coherence in inelastic scattering and
the validity of the optical potential
14
1.9
Relativistic corrections
17
1.10
Probability current density and conservation of
probability
18
1.11
Correlation between theory and experiment
19
1.12
Summary
21
Kinematic theory
24
2.1
Introduction
24
2.2
Kinematic and quasi-kinematic diffraction theory
25
2.2.1
Kinematic diffraction
25
2.2.2
Quasi-kinematic diffraction
27
2.3
Scattering by a single atom
27
2.4
Amplitude of scattering by an assemblage of atoms
33
2.5
Diffraction by single crystals
36
2.6
Diffraction by a gas, an amorphous solid, and a
liquid
42
2.7
Diffraction by polycrystals and textures
45
2.8
Fluctuation microscopy
48
2.9
Summary
52
Dynamical theory I. General theory
54
3.1
Introduction
54
3.2
Role of symmetry in dynamical diffraction
55
CONTENTS
3.3
Forward and backward scattering
59
3.4
The multislice method
60
3.5
The general matrix method
63
3.5.1
Fundamental equations
64
3.5.2
The dispersion surface
65
3.5.3
Translation properties of Bloch waves
66
3.5.4
Boundary conditions and formal solutions
69
3.6
Summary
74
Dynamical theory II. Transmission high-energy
electron diffraction
75
4.1
Introduction
75
4.2
Diffraction geometry
75
4.3
Basic concepts and the treatment of ZOLZ
diffraction
79
4.3.1
Basic equations and Bloch waves
79
4.3.2
Bound and free Bloch waves
81
4.3.3
Dispersion surfaces and band structure
84
4.3.4
Excitation of Bloch waves
86
4.3.5
Two and few Bloch wave approximations
90
4.3.6
Propagation of Bloch waves
96
4.3.7
Effects of absorption
97
4.4
The general treatment of THEED and
HOLZ
diffraction
98
4.4.1
Kinematic geometry of
HOLZ
diffraction
98
4.4.2
Formation of a HOLZ ring
98
4.4.3
Distribution of intensity in HOLZ patterns
102
4.4.4
General treatment of HOLZ diffraction
107
4.5
Summary
115
Dynamical theory III. Reflection high-energy
electron diffraction
117
5.1
Introduction
117
5.2
Surface structure notation and RHEED geometry
118
5.2.1
The nature of the surface
118
5.2.2
The five surface nets
119
5.2.3
The relation between the surface mesh and
the substrate mesh
119
5.2.4
Surface reciprocal lattice rods
121
5.3
RHEED theory
123
5.3.1
The THEED approach to RHEED
123
5.3.2
The semi-reciprocal formulation
126
5.3.3
The Green s function approach
130
5.3.4
The Bloch wave method
138
CONTENTS xvii
5.4
Worked examples
159
5.4.1
RHEED from the surface of a metal: the
Ag(OOl) surface
160
5.4.2
RHEED from a surface of an ionic crystal:
the NiO(OOl) and UO2(111) surfaces
164
5.5
RHEED from growing surfaces: intensity
oscillations
175
5.6
Summary
185
Resonance effects in transmission and reflection
high-energy electron diffraction
186
6.1
The origin of resonances
186
6.2
Transmission resonance diffraction of high-energy
electrons
187
6.2.1
The geometry of transmission resonance
diffraction
188
6.2.2
Transmission resonance: a formal solution
191
6.2.3
Transmission resonance: diffraction via tightly
bound states
193
6.3
Resonance diffraction from a crystal surface
200
6.3.1
The geometry of surface resonance
scattering
202
6.3.2
The two-rod approximation
204
6.3.3
Resonance scattering via a surface state
208
6.3.4
Resonance diffraction via localized
bulk states
213
6.3.5
Interference between resonance and
potential scattering
217
6.3.6
The time delay of the incident electron in
the resonance state
223
6.4
Summary
227
Diffuse and inelastic scattering
-
Elementary
processes
228
7.1
Diffuse and inelastic scattering
228
7.2
The distorted wave Born approximation
230
7.3
Diffuse scattering by point defects
235
7.4
The Van Hove dynamic form factor
241
7.5
Thermal diffuse scattering
246
7.6
Electron energy losses
251
7.6.1
Plasmons 254
7.6.2
Ionization of inner electronic shells
256
7.6.3
The extended energy loss fine structure
(EXELFS) 259
7.7
Summary 263
xviii CONTENTS
8
Diffuse and inelastic scattering
-
Multiple
scattering effects
264
8.1
Introduction
264
8.2
Breakdown of the DWBA and the optical potential
model
266
8.3
Diffraction and multiple incoherent scattering of
electrons
268
8.4
Kinetic equation for the density matrix
269
8.5
Loss of coherence due to multiple scattering by
plasmons
274
8.6
Diffraction of diffusely scattered electrons: the
formation of Kikuchi lines and bands
282
8.7
Kikuchi patterns in electron backscattering
287
8.8
Multiple diffuse scattering: an exact solution of the
backscattering problem
290
8.9
Electron channelling patterns and channelling
imaging of crystal defects
296
8.10
Diffraction effects in inner-shell ionization, X-ray,
and Auger electron production
304
8.11
Summary
310
9
Crystal and diffraction symmetry
311
9.1
Introduction
311
9.2
Representation of symmetry
312
9.3
The reciprocity principle
313
9.4
Symmetry elements and their identification
314
9.5
Diffraction symmetry
-
a formal derivation
318
9.5.1
Basic solutions and relations
318
9.5.2
Effect of the space group symmetry
320
9.5.3
Diffraction groups and the symmetry of CBED
patterns
323
9.5.4
Derivation of the fundamental symmetry
relations
326
9.6
Crystal point group determination
330
9.7
Crystal space group determination
332
9.7.1
Formation of G-M lines
333
9.7.2
Identification of G-M lines
336
9.7.3
Space group determination
337
9.8
Automated identification of CBED pattern
symmetry
337
9.8.1
Genetic algorithm
—
basic concepts and
implementation
339
9.8.2
Identification of CBED pattern symmetry
344
9.9
Summary
34g
CONTENTS xix
10
Perturbation
methods and tensor theory
350
10.1
Introduction
350
10.2
Perturbation treatment of a periodic structure
353
10.2.1
Bloch waves, left-hand, and right-hand
eigenvectors
354
10.2.2
Non-degenerate perturbation theory
355
10.2.3
First-order perturbation
356
10.2.4
Second-order perturbation
357
10.3
Tensor THEED
358
10.4
Direct inversion of THEED data
362
10.4.1
Inversion of crystal structure factors
364
10.4.2
Inversion of atomic coordinates
370
10.5
Perturbation methods for non-periodic structures
379
10.5.1
The DWBA treatment of diffraction by a
non-periodic structure
379
10.6
Tensor RHEED and the direct inversion of a surface
structure
383
10.7
Summary
386
11
Digital electron micrograph recording and basic
processing
388
11.1
Introduction
388
11.2
Basic features of CCDs
389
11.3
A basic model of an SSC camera
390
11.4
Main characteristics of an SSC camera
391
11.4.1
The overall gain
391
11.4.2
Resolution and the point spread function
393
11.4.3
The detection quantum efficiency
395
11.5
The sampling theorem
398
11.6
Discrete and fast Fourier transform
399
11.6.1
Discrete Fourier transform
399
11.6.2
Fast Fourier transform (FFT)
401
11.7
Restoration of images
402
11.7.1
Generation of data points in reciprocal
space
402
11.7.2
Generation of data points in real space
404
11.8
Summary 404
12
Image formation and the retrieval of the electron
wave function
12.1
Introduction 406
12.2
Electron source and coherence
406
12.2.1
Partial coherence and the complex degree of
coherence
12.2.2
Temporal coherence
408
12.2.3
Spatial coherence 410
CONTENTS
12.3 Image
formation
in an
electron
microscope
412
12.3.1 Transmission
cross-coefficient
(ТСС)
for
coherent illumination
413
12.3.2
The TCC for incoherent illumination
415
12.3.3
The TCC for a partially coherent
illumination
417
12.4
Exit electron wave function retrieval
418
12.4.1
Linear image retrieval
419
12.4.2
Non-linear image retrieval
424
12.5
Summary
426
13
The atomic scattering factor and the optical
potential
427
13.1
Introduction
427
13.2
The optical potential
429
13.3
The averaged potential
432
13.3.1
Thermally averaged potential
432
13.3.2
Electron atomic scattering factor
433
13.3.3
Temperature factor
434
13.4
The absorptive potential
437
13.5
Computation of the complex structure factor
440
13.5.1
A worked example: strontium titanate
441
13.6
Analytical representation of atomic scattering
factors
443
13.6.1
The parameterization of the elastic atomic
scattering factor for electrons
444
13.6.2
Parameterization of the absorptive atomic
scattering factor
446
13.7
Analytical expressions for the optical potential of
atoms and crystals
447
13.8
Summary
449
14
Temperature-dependent Debye—Waller factors
454
14.1
Introduction and definitions
454
14.2
Debye-Waller factors of elemental crystals
456
14.3
Debye-Waller factors of cubic compounds
458
14.4
Summary
460
A Some useful mathematical relations
470
A.I Fourier transformation
470
A.2 The Dirac delta function
470
A.3 The
Kronecker
delta symbol
471
A.
4
Some useful integrals
472
В
Green s functions
473
CONTENTS xxi
С
FORTRAN
listing
of RHEED routines
477
C.I A FORTRAN routine for the calculation of UG{z)
477
C.I.I The input file for the calculation of Uq{z)
477
C.I.
2
FORTRAN routine for calculating UG(z)
477
C.2 A FORTRAN routine for dynamical RHEED
calculations
481
С
. 2.1
Example input data file for dynamical RHEED
calculations
482
C.2.2 A FORTRAN routine for dynamical RHEED
calculations
482
D
Parameterization of the electron atomic
scattering factor
490
D.I The parameterization algorithm
490
D.2 The absorptive atomic scattering factor
496
References
501
Subject Index
531
|
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| author | Peng, Lian-Mao Dudarev, Sergej Leonidovič 1951- Whelan, Michael J. |
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| discipline | Allgemeine Naturwissenschaft Physik |
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| id | DE-604.BV017577113 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T19:19:30Z |
| institution | BVB |
| isbn | 0198500742 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-010576539 |
| oclc_num | 52145463 |
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| owner_facet | DE-703 DE-355 DE-BY-UBR DE-11 |
| physical | XXI, 535 S. Ill., graph. Darst. |
| publishDate | 2004 |
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| publishDateSort | 2004 |
| publisher | Oxford Univ. Press |
| record_format | marc |
| series | Monographs on the physics and chemistry of materials |
| series2 | Monographs on the physics and chemistry of materials Oxford science publications |
| spelling | Peng, Lian-Mao Verfasser aut High energy electron diffraction and microscopy L.-M. Peng ; S. L. Dudarev ; M. J. Whelan 1. publ. Oxford [u.a.] Oxford Univ. Press 2004 XXI, 535 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Monographs on the physics and chemistry of materials 61 Oxford science publications Electron microscopy High energy electron diffraction Materials science Microscopy, Electron Elektronenbeugung (DE-588)4151862-7 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenbeugung (DE-588)4151862-7 s DE-604 Elektronenmikroskopie (DE-588)4014327-2 s Dudarev, Sergej Leonidovič 1951- Verfasser (DE-588)1074225600 aut Whelan, Michael J. Verfasser aut Monographs on the physics and chemistry of materials 61 (DE-604)BV000725086 61 Digitalisierung UB Regensburg application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=010576539&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Peng, Lian-Mao Dudarev, Sergej Leonidovič 1951- Whelan, Michael J. High energy electron diffraction and microscopy Monographs on the physics and chemistry of materials Electron microscopy High energy electron diffraction Materials science Microscopy, Electron Elektronenbeugung (DE-588)4151862-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4151862-7 (DE-588)4014327-2 |
| title | High energy electron diffraction and microscopy |
| title_auth | High energy electron diffraction and microscopy |
| title_exact_search | High energy electron diffraction and microscopy |
| title_full | High energy electron diffraction and microscopy L.-M. Peng ; S. L. Dudarev ; M. J. Whelan |
| title_fullStr | High energy electron diffraction and microscopy L.-M. Peng ; S. L. Dudarev ; M. J. Whelan |
| title_full_unstemmed | High energy electron diffraction and microscopy L.-M. Peng ; S. L. Dudarev ; M. J. Whelan |
| title_short | High energy electron diffraction and microscopy |
| title_sort | high energy electron diffraction and microscopy |
| topic | Electron microscopy High energy electron diffraction Materials science Microscopy, Electron Elektronenbeugung (DE-588)4151862-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Electron microscopy High energy electron diffraction Materials science Microscopy, Electron Elektronenbeugung Elektronenmikroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=010576539&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV000725086 |
| work_keys_str_mv | AT penglianmao highenergyelectrondiffractionandmicroscopy AT dudarevsergejleonidovic highenergyelectrondiffractionandmicroscopy AT whelanmichaelj highenergyelectrondiffractionandmicroscopy |