Effects of individual dopant atoms on the electronic properties of GaAs investigated by scanning tunneling microscopy and spectroscopy:
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
2003
|
Schlagworte: | |
Beschreibung: | Aachen, Techn. Hochsch., Diss., 2003. - Auch als: Berichte des Forschungszentrums Jülich ; 4053 |
Beschreibung: | VIII, 129 S. Ill., graph. Darst. |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV017560491 | ||
003 | DE-604 | ||
005 | 20031022 | ||
007 | t | ||
008 | 031007s2003 ad|| m||| 00||| eng d | ||
035 | |a (OCoLC)248802263 | ||
035 | |a (DE-599)BVBBV017560491 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-91 | ||
100 | 1 | |a Jäger, Nikos D. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Effects of individual dopant atoms on the electronic properties of GaAs investigated by scanning tunneling microscopy and spectroscopy |c vorgelegt von Nikos D. Jäger |
264 | 1 | |c 2003 | |
300 | |a VIII, 129 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Aachen, Techn. Hochsch., Diss., 2003. - Auch als: Berichte des Forschungszentrums Jülich ; 4053 | ||
650 | 7 | |a Dotierung |2 swd | |
650 | 7 | |a Galliumarsenid |2 swd | |
650 | 7 | |a Halbleiteroberfläche |2 swd | |
650 | 7 | |a Rastertunnelmikroskopie |2 swd | |
655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
999 | |a oai:aleph.bib-bvb.de:BVB01-010569200 |
Datensatz im Suchindex
_version_ | 1804130332314697728 |
---|---|
any_adam_object | |
author | Jäger, Nikos D. |
author_facet | Jäger, Nikos D. |
author_role | aut |
author_sort | Jäger, Nikos D. |
author_variant | n d j nd ndj |
building | Verbundindex |
bvnumber | BV017560491 |
ctrlnum | (OCoLC)248802263 (DE-599)BVBBV017560491 |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01093nam a2200313 c 4500</leader><controlfield tag="001">BV017560491</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20031022 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">031007s2003 ad|| m||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)248802263</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV017560491</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Jäger, Nikos D.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Effects of individual dopant atoms on the electronic properties of GaAs investigated by scanning tunneling microscopy and spectroscopy</subfield><subfield code="c">vorgelegt von Nikos D. Jäger</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2003</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VIII, 129 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Aachen, Techn. Hochsch., Diss., 2003. - Auch als: Berichte des Forschungszentrums Jülich ; 4053</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Dotierung</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Galliumarsenid</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Halbleiteroberfläche</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Rastertunnelmikroskopie</subfield><subfield code="2">swd</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4113937-9</subfield><subfield code="a">Hochschulschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-010569200</subfield></datafield></record></collection> |
genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
genre_facet | Hochschulschrift |
id | DE-604.BV017560491 |
illustrated | Illustrated |
indexdate | 2024-07-09T19:19:21Z |
institution | BVB |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-010569200 |
oclc_num | 248802263 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM |
owner_facet | DE-91 DE-BY-TUM |
physical | VIII, 129 S. Ill., graph. Darst. |
publishDate | 2003 |
publishDateSearch | 2003 |
publishDateSort | 2003 |
record_format | marc |
spelling | Jäger, Nikos D. Verfasser aut Effects of individual dopant atoms on the electronic properties of GaAs investigated by scanning tunneling microscopy and spectroscopy vorgelegt von Nikos D. Jäger 2003 VIII, 129 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Aachen, Techn. Hochsch., Diss., 2003. - Auch als: Berichte des Forschungszentrums Jülich ; 4053 Dotierung swd Galliumarsenid swd Halbleiteroberfläche swd Rastertunnelmikroskopie swd (DE-588)4113937-9 Hochschulschrift gnd-content |
spellingShingle | Jäger, Nikos D. Effects of individual dopant atoms on the electronic properties of GaAs investigated by scanning tunneling microscopy and spectroscopy Dotierung swd Galliumarsenid swd Halbleiteroberfläche swd Rastertunnelmikroskopie swd |
subject_GND | (DE-588)4113937-9 |
title | Effects of individual dopant atoms on the electronic properties of GaAs investigated by scanning tunneling microscopy and spectroscopy |
title_auth | Effects of individual dopant atoms on the electronic properties of GaAs investigated by scanning tunneling microscopy and spectroscopy |
title_exact_search | Effects of individual dopant atoms on the electronic properties of GaAs investigated by scanning tunneling microscopy and spectroscopy |
title_full | Effects of individual dopant atoms on the electronic properties of GaAs investigated by scanning tunneling microscopy and spectroscopy vorgelegt von Nikos D. Jäger |
title_fullStr | Effects of individual dopant atoms on the electronic properties of GaAs investigated by scanning tunneling microscopy and spectroscopy vorgelegt von Nikos D. Jäger |
title_full_unstemmed | Effects of individual dopant atoms on the electronic properties of GaAs investigated by scanning tunneling microscopy and spectroscopy vorgelegt von Nikos D. Jäger |
title_short | Effects of individual dopant atoms on the electronic properties of GaAs investigated by scanning tunneling microscopy and spectroscopy |
title_sort | effects of individual dopant atoms on the electronic properties of gaas investigated by scanning tunneling microscopy and spectroscopy |
topic | Dotierung swd Galliumarsenid swd Halbleiteroberfläche swd Rastertunnelmikroskopie swd |
topic_facet | Dotierung Galliumarsenid Halbleiteroberfläche Rastertunnelmikroskopie Hochschulschrift |
work_keys_str_mv | AT jagernikosd effectsofindividualdopantatomsontheelectronicpropertiesofgaasinvestigatedbyscanningtunnelingmicroscopyandspectroscopy |