Transmission electron microscopy: physics of image formation
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | German |
| Veröffentlicht: |
New York, NY
Springer
2008
|
| Ausgabe: | 5. ed. |
| Schriftenreihe: | Springer series in optical sciences
36 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XVI, 587 S. Ill., graph. Darst. |
| ISBN: | 9780387400938 9780387347585 |
Internformat
MARC
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| 001 | BV017448568 | ||
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| 008 | 030826s2008 ad|| |||| 00||| ger d | ||
| 016 | 7 | |a 968587054 |2 DE-101 | |
| 020 | |a 9780387400938 |9 978-0-387-40093-8 | ||
| 020 | |a 9780387347585 |9 978-0-387-34758-5 | ||
| 035 | |a (OCoLC)234146401 | ||
| 035 | |a (DE-599)BVBBV017448568 | ||
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| 049 | |a DE-703 |a DE-384 |a DE-29T |a DE-1050 |a DE-91G |a DE-83 |a DE-11 |a DE-355 |a DE-20 | ||
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| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 084 | |a PHY 135f |2 stub | ||
| 100 | 1 | |a Reimer, Ludwig |d 1928- |e Verfasser |0 (DE-588)13230130X |4 aut | |
| 245 | 1 | 0 | |a Transmission electron microscopy |b physics of image formation |c L. Reimer ; H. Kohl |
| 250 | |a 5. ed. | ||
| 264 | 1 | |a New York, NY |b Springer |c 2008 | |
| 300 | |a XVI, 587 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Springer series in optical sciences |v 36 | |
| 650 | 4 | |a Transmission electron microscopy | |
| 650 | 0 | 7 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Kohl, Helmut |d 1955- |e Verfasser |0 (DE-588)137715617 |4 aut | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-0-387-34758-5 |
| 830 | 0 | |a Springer series in optical sciences |v 36 |w (DE-604)BV000000237 |9 36 | |
| 856 | 4 | 2 | |m Digitalisierung UB Regensburg |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=010511092&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-010511092 | ||
Datensatz im Suchindex
| _version_ | 1804130254667644928 |
|---|---|
| adam_text | Contents
Introduction
............................................... 1
1.1 Transmission Electron
Microscopy
......................... 1
1.1.1
Conventional
Transmission Electron
Microscopy
....... 1
1.1.2 High-Resolution Electron
Microscopy
................
З
1.1.3
Analytical Electron Microscopy
..................... 5
1.1.4
Energy-Filtering Electron Microscopy
................ 7
1.1.5
High-Voltage Electron Microscopy
................... 7
1.1.6
Dedicated Scanning Transmission Electron
Microscopy
....................................... 9
1.2
Alternative Types of Electron Microscopy
.................. 10
1.2.1
Emission Electron Microscopy
....................... 10
1.2.2
Reflection Electron Microscopy
...................... 11
1.2.3
Mirror Electron Microscopy
......................... 11
1.2.4
Scanning Electron Microscopy
...................... 12
1.2.5
X-ray and Auger-Electron
Microanałysis
............. 14
1.2.6
Scanning-Probe Microscopy
......................... 14
Particle Optics of Electrons
................................ 17
2.1
Acceleration and Deflection of Electrons
.................... 17
2.1.1
Relativistic Mechanics of Electron Acceleration
........ 17
2.1.2
Deflection by Magnetic and Electric Fields
............ 20
2.2
Electron Lenses
......................................... 22
2.2.1
Electron Trajectories in a Magnetic Lens Field
........ 22
2.2.2
Optics of an Electron Lens with a Bell-Shaped Field
... 25
2.2.3
Special Electron Lenses
............................ 29
2.3
Lens Aberrations
........................................ 31
2.3.1
Classification of Lens Aberrations
................... 31
2.3.2
Spherical Aberration
............................... 32
2.3.3
Astigmatism and Field Curvature
................... 34
2.3.4
Distortion
........................................ 36
2.3.5
Coma
............................................ 37
Contents
2.3.6 Anisotropie
Aberrations............................
38
2.3.7
Chromatic
Aberration............................. 38
2.4
Correction of Aberrations and Microscope Alignment
........ 40
2.4.1
Correction of Astigmatism
.......................... 40
2.4.2
Correction of Spherical and Chromatic Aberrations
.... 42
2.4.3
Microscope Alignment
............................. 43
Wave Optics of Electrons
.................................. 45
3.1
Electron Waves and Phase Shifts
.......................... 45
3.1.1 De Broglie
Waves
................................. 45
3.1.2
Probability Density and Wave Packets
............... 49
3.1.3
Electron-Optical Refractive Index
and the
Schrödinger
Equation
....................... 51
3.1.4
Electron
Interferometry
and Coherence
............... 53
3.2
Fresnel and
Fraunhofer
Diffraction.........................
55
3.2.1
Huygens Principle and Fresnel Diffraction
............ 55
3.2.2
Fresnel Fringes
.................................... 59
3.2.3 Fraunhofer
Diffraction
............................. 61
3.2.4
Mathematics of Fourier Transforms
.................. 63
3.3
Wave-Optical Formulation of Imaging
...................... 70
3.3.1
Wave Aberration of an Electron Lens
................ 70
3.3.2
Wave-Optical Theory of Imaging
.................... 73
Elements of a Transmission Electron Microscope
.......... 77
4.1
Electron Guns
.......................................... 78
4.1.1
Physics of Electron Emission
........................ 78
4.1.2
Energy Spread
.................................... 81
4.1.3
Gun Brightness
................................... 82
4.1.4
Thermionic Electron Guns
.......................... 84
4.1.5
Schottky Emission Guns
........................... 88
4.1.6
Field-Emission Guns
............................... 89
4.2
The Illumination System of
а ТЕМ
........................ 90
4.2.1
Condenser-Lens System
............................ 90
4.2.2
Electron-Probe Formation
.......................... 93
4.2.3
Illumination with an Objective Prefield Lens
.......... 96
4.3
Specimens
.............................................. 98
4.3.1
Useful Specimen Thickness
......................... 98
4.3.2
Specimen Mounting
................................ 99
4.3.3
Specimen Manipulation
............................100
4.4
The Imaging System of
а ТЕМ
............................103
4.4.1
Objective Lens
....................................103
4.4.2
Imaging Modes of
а ТЕМ
..........................104
4.4.3
Magnification and Calibration
.......................107
4.4.4
Depth of Image and Depth of Focus
.................108
4.5
Scanning Transmission Electron Microscopy (STEM)
........109
Contents
XI
4.5.1
Scanning
Transmission
Mode of
ТЕМ
................109
4.5.2
Dedicated STEM
..................................112
4.5.3
Theorem of Reciprocity
............................113
4.6
Electron Spectrometers and Imaging Energy Filters
..........115
4.6.1
Postcolumn Prism Spectrometer
.....................116
4.6.2 Wien
Filter
.......................................119
4.6.3
Imaging Energy Filter
.............................119
4.6.4
Operating Modes with Energy Filtering
..............124
4.7
Image Recording and Electron Detection
...................126
4.7.1
Fluorescent Screens
................................126
4.7.2
Photographic Emulsions
............................127
4.7.3
Imaging Plate
.....................................131
4.7.4
Detector Noise and Detection Quantum Efficiency
.....132
4.7.5
Low-Light-Level and Charge-Coupled-Device
(CCD)
Cameras
...................................134
4.7.6
Semiconductor and Scintillation Detectors
............138
4.7.7
Faraday Cages
....................................139
Electron—Specimen Interactions
............................141
5.1
Elastic Scattering
........................................141
5.1.1
Cross Section and Mean Free Path
..................141
5.1.2
Energy Transfer in an Electron-Nucleus Collision
......143
5.1.3
Elastic Differential Cross Section for Small-Angle
Scattering
........................................146
5.1.4
Total Elastic Cross Section
.........................152
5.2
Inelastic Scattering
......................................153
5.2.1
Electron-Specimen Interactions with Energy Loss
.....153
5.2.2
Differential Cross Section for Single-Electron
Excitation
........................................156
5.2.3
Bethe Surface and Compton Scattering
...............158
5.2.4
Approximation for the Total Inelastic Cross Section
.... 162
5.2.5
Dielectric Theory and Plasmon Losses in Solids
.......163
5.2.6
Surface-Plasmon Losses
............................171
5.3
Energy Losses by Inner-Shell Ionization
....................174
5.3.1
Position and Shape of Ionization Edges
..............174
5.3.2
Inner-Shell Ionization Cross Sections
.................177
5.3.3
Energy-Loss Near-Edge Structure (ELNES)
...........179
5.3.4
Extended Energy-Loss Fine Structure (EXELFS)
......182
5.3.5
Linear and Circular Dichroism
......................183
5.4
Multiple-Scattering Effects
................................184
5.4.1
Angular Distribution of Scattered Electrons
...........184
5.4.2
Energy Distribution of Transmitted Electrons
.........186
5.4.3
Electron-Probe Broadening by Multiple Scattering
.....188
5.4.4
Electron Diffusion, Backscattering,
and Secondary-Electron Emission
....................192
XII Contents
6
Scattering and Phase Contrast for Amorphous
Specimens
.................................................195
6.1
Scattering Contrast
......................................196
6.1.1
Transmission in the Bright-Field Mode
...............196
6.1.2
Dark-Field Mode
..................................201
6.1.3
Examples of Scattering Contrast
....................202
6.1.4
Improvement of Scattering Contrast by Energy
Filtering
.........................................205
6.1.5
Scattering Contrast in the STEM Mode
..............208
6.1.6
Measurement of Mass Thickness and Total Mass
......209
6.2
Phase Contrast
..........................................211
6.2.1
The Origin of Phase Contrast
.......................211
6.2.2
Defocusing Phase Contrast of Supporting Films
.......212
6.2.3
Examples of Phase Contrast
........................215
6.2.4
Theoretical Methods for Calculating Phase Contrast
... 216
6.2.5
Imaging of a Scattering Point Object
................218
6.2.6
Relation between Phase and Scattering Contrast
......220
6.3
Imaging of Single Atoms
.................................221
6.3.1
Imaging of Single Atoms in
ТЕМ
....................221
6.3.2
Imaging of Single Atoms in the STEM Mode
..........225
6.4
Contrast-Transfer Function (CTF)
.........................228
6.4.1
The CTF for Amplitude and Phase Specimens
........228
6.4.2
Influence of Energy Spread and Illumination
Aperture
.........................................230
6.4.3
The CTF for Tilted-Beam and Hollow-Cone
Illumination
......................................233
6.4.4
Contrast Transfer in STEM
.........................236
6.4.5
Phase Contrast by Inelastically Scattered Electrons
.... 237
6.4.6
Improvement of the CTF Inside the Microscope
.......238
6.4.7
Control of the CTF by Optical or Digital Fourier
Transform
........................................238
6.5
Electron Holography
.....................................241
6.5.1
Fresnel and
Fraunhofer In-Line
Holography
...........241
6.5.2
Single-Sideband Holography
........................244
6.5.3
Off-Axis Holography
...............................245
6.5.4
Reconstruction of Off-Axis Holograms
................246
6.6
Image Restoration and Specimen Reconstruction
............249
6.6.1
General Aspects
...................................249
6.6.2
Methods of Optical Analog Filtering
.................250
6.6.3
Digital Image Restoration
..........................252
6.6.4
Alignment by Cross-Correlation
.....................254
6.6.5
Averaging of Periodic and Aperiodic Structures
.......255
6.7
Three-Dimensional Reconstruction
.........................258
6.7.1
Stereometry
......................................258
6.7.2
Electron Tomography
..............................259
Contents XIII
6.8
Lorentz
Microscopy
......................................262
6.8.1
Lorentz
Microscopy and Presnel Diffraction
...........262
6.8.2
Imaging Modes of
Lorentz
Microscopy
...............264
6.8.3
Imaging of Electrostatic Specimen Fields
.............270
Theory of Electron Diffraction
.............................273
7.1
Fundamentals of Crystallography
..........................274
7.1.1
Bravais
Lattice and Lattice Planes
...................274
7.1.2
The Reciprocal Lattice
.............................279
7.1.3
Construction of
Laue
Zones
.........................282
7.2
Kinematical Theory of Electron Diffraction
.................283
7.2.1
Bragg Condition and
Ewald
Sphere
..................283
7.2.2
Structure Amplitude and Lattice Amplitude
..........285
7.2.3
Column Approximation
............................289
7.3
Dynamical Theory of Electron Diffraction
..................292
7.3.1
Limitations of the Kinematical Theory
...............292
7.3.2
Formulation of the Dynamical Theory as a System
of Differential Equations
...........................293
7.3.3
Formulation of the Dynamical Theory
as an Eigenvalue Problem
..........................294
7.3.4
Discussion of the Two-Beam Case
...................298
7.4
Dynamical Theory Including Absorption
...................302
7.4.1
Inelastic-Scattering Processes in Crystals
.............302
7.4.2
Absorption of the Bloch-Wave Field
.................306
7.4.3
Dynamical
η
-Beam Theory
.........................311
7.4.4
The Bethe Dynamical Potential and the Critical
Voltage Effect
.....................................313
7.5
Intensity Distribution in Diffraction Patterns
................317
7.5.1
Diffraction at Amorphous Specimens
.................317
7.5.2
Intensity of Debye-Scherrer Rings
...................318
7.5.3
Influence of Thermal Diffuse Scattering
..............321
7.5.4
Kikuchi Lines and Bands
...........................323
7.5.5
Electron Spectroscopic Diffraction
...................326
Electron-Diffraction Modes and Applications
..............329
8.1
Electron-Diffraction Modes
...............................329
8.1.1
Selected-Area Electron Diffraction (SAED)
...........329
8.1.2
Electron Diffraction Using a Rocking Beam
...........331
8.1.3
Electron Diffraction Using a Stationary Electron
Probe
............................................332
8.1.4
Electron Diffraction Using a Rocking Electron Probe.
.. 336
8.1.5
Further Diffraction Modes in
ТЕМ
..................338
8.2
Some Uses of Diffraction Patterns with Bragg Reflections
.....342
8.2.1
Lattice-Plane Spacings
.............................342
8.2.2
Texture Diagrams
.................................343
XIV Contents
8.2.3
Crystal Structure
..................................345
8.2.4
Crystal Orientation
................................347
8.2.5
Examples of Extra Spots and Streaks
................349
8.3
Convergent-Beam Electron Diffraction (CBED)
.............352
8.3.1
Determination of Point and Space Groups
............352
8.3.2
Determination of Foil Thickness
.....................352
8.3.3
Charge-Density Distributions
.......................353
8.3.4
High-Order
Laue Zone (HOLZ)
Patterns
.............354
8.3.5 HOLZ
Lines
......................................355
8.3.6
Large-Angle CBED
................................357
9
Imaging of Crystalline Specimens and Their Defects
.......359
9.1
Diffraction Contrast of Crystals Free of Defects
..............360
9.1.1
Edge and Bend Contours
...........................360
9.1.2
Dark-Field Imaging
................................362
9.1.3
Moiré
Fringes
.....................................365
9.1.4
The STEM Mode and Multibeam Imaging
............367
9.1.5
Energy Filtering of Diffraction Contrast
..............369
9.1.6
Transmission of Crystalline Specimens
...............370
9.2
Calculation of Diffraction Contrast of Lattice Defects
........373
9.2.1
Kinematical Theory and the Howie-Whelan
Equations
........................................373
9.2.2
Matrix-Multiplication Method
......................375
9.2.3
Bloch-Wave Method
...............................376
9.3
Planar Lattice Faults
....................................378
9.3.1
Kinematical Theory of Stacking-Fault Contrast
.......378
9.3.2
Dynamical Theory of Stacking-Fault Contrast
.........379
9.3.3
Antiphase and Other Boundaries
....................383
9.4
Dislocations
............................................385
9.4.1
Kinematical Theory of Dislocation Contrast
..........385
9.4.2
Dynamical Effects in Dislocation Images
.............390
9.4.3
Weak-Beam Imaging
...............................391
9.4.4
Determination of the Burgers Vector
.................394
9.5
Lattice Defects of Small Dimensions
.......................396
9.5.1
Coherent and Incoherent Precipitates
................396
9.5.2
Defect Clusters
....................................398
9.6
High-Resolution Electron Microscopy (HREM) of Crystals
___400
9.6.1
Lattice-Plane Fringes
..............................400
9.6.2
General Aspects of Crystal-Structure Imaging
.........402
9.6.3
Methods for Calculating Lattice-Image Contrast
.......405
9.6.4
Simulation, Matching, and Reconstruction
of Crystal Images
.................................407
9.6.5
Measurement of Atomic Displacements in HREM
......409
9.6.6
Crystal-Structure Imaging with a Scanning
Transmission Electron Microscope
...................411
Contents
XV
9.7
Imaging of Atomic Surface Steps and Structures
.............412
9.7.1
Imaging of Surface Steps in Transmission
.............412
9.7.2
Reflection Electron Microscopy
......................416
9.7.3
Surface-Profile Imaging
............................418
10
Elemental Analysis by X-ray and Electron Energy-Loss
Spectroscopy
..............................................419
10.1
X-ray and Auger-Electron Emission
........................419
10.1.1
X-ray Continuum
..................................419
10.1.2
Characteristic X-ray and Auger-Electron Emission
.....421
10.2
X-ray Microanalysis in a Transmission Electron Microscope
... 425
10.2.1
Wavelength-Dispersive Spectrometry
.................425
10.2.2
Energy-Dispersive Spectrometry (EDS)
..............427
10.2.3
X-ray Emission from Bulk Specimens and ZAF
Correction
........................................431
10.2.4
X-ray Microanalysis of Thin Specimens
..............434
10.2.5
X-ray Microanalysis of Organic Specimens
............436
10.3
Electron Energy-Loss Spectroscopy
........................437
10.3.1
Recording of Electron Energy-Loss Spectra
...........437
10.3.2
Kramers-Kronig Relation
..........................439
10.3.3
Background Fitting and Subtraction
.................441
10.3.4
Deconvolution
....................................442
10.3.5
Elemental Analysis by Inner-Shell Ionizations
.........444
10.4
Element-Distribution Images
..............................447
10.4.1
Elemental Mapping by
Х
-Rays......................
447
10.4.2
Element-Distribution Images Formed by Electron
Spectroscopie
Imaging
.............................448
10.4.3
Three-Window Method
............................449
10.4.4
White-Line Method
................................450
10.4.5
Correction of Scattering Contrast
....................450
10.5
Limitations of Elemental Analysis
.........................452
10.5.1
Specimen Thickness
...............................452
10.5.2
Radiation Damage and Loss of Elements
.............452
10.5.3
Counting Statistics and Sensitivity
..................453
10.5.4
Resolution and Detection Limits for Electron
Spectroscopie
Imaging
.............................456
11
Specimen Damage by Electron Irradiation
.................459
11.1
Specimen Heating
.......................................459
11.1.1
Methods of Measuring Specimen Temperature
........459
11.1.2
Generation of Heat by Electron Irradiation
...........461
11.1.3
Calculation of Specimen Temperature
................463
11.2
Radiation Damage of Organic Specimens
...................466
11.2.1
Elementary Damage Processes in Organic Specimens.
.. 466
11.2.2
Quantitative Methods of Measuring Damage Effects
... 470
XVI Contents
11.2.3
Methods of Reducing Radiation Damage
.............477
11.2.4
Radiation Damage and High Resolution
..............479
11.3
Radiation Damage of Inorganic Specimens
..................480
11.3.1
Damage by Electron Excitation
.....................480
11.3.2
Radiation Damage by Knock-On Collisions
...........482
11.4
Contamination
..........................................484
11.4.1
Origin and Sources of Contamination
................484
11.4.2
Methods for Decreasing Contamination
..............485
11.4.3
Dependence of Contamination on Irradiation
Conditions
.......................................486
References
.....................................................491
Index
..........................................................575
|
| any_adam_object | 1 |
| author | Reimer, Ludwig 1928- Kohl, Helmut 1955- |
| author_GND | (DE-588)13230130X (DE-588)137715617 |
| author_facet | Reimer, Ludwig 1928- Kohl, Helmut 1955- |
| author_role | aut aut |
| author_sort | Reimer, Ludwig 1928- |
| author_variant | l r lr h k hk |
| building | Verbundindex |
| bvnumber | BV017448568 |
| callnumber-first | Q - Science |
| callnumber-label | QH212 |
| callnumber-raw | QH212.T7 |
| callnumber-search | QH212.T7 |
| callnumber-sort | QH 3212 T7 |
| callnumber-subject | QH - Natural History and Biology |
| classification_rvk | UH 5100 UH 6300 |
| classification_tum | PHY 135f |
| ctrlnum | (OCoLC)234146401 (DE-599)BVBBV017448568 |
| dewey-full | 502.8/25 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.8/25 |
| dewey-search | 502.8/25 |
| dewey-sort | 3502.8 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| edition | 5. ed. |
| format | Book |
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| id | DE-604.BV017448568 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T19:18:07Z |
| institution | BVB |
| isbn | 9780387400938 9780387347585 |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-010511092 |
| oclc_num | 234146401 |
| open_access_boolean | |
| owner | DE-703 DE-384 DE-29T DE-1050 DE-91G DE-BY-TUM DE-83 DE-11 DE-355 DE-BY-UBR DE-20 |
| owner_facet | DE-703 DE-384 DE-29T DE-1050 DE-91G DE-BY-TUM DE-83 DE-11 DE-355 DE-BY-UBR DE-20 |
| physical | XVI, 587 S. Ill., graph. Darst. |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in optical sciences |
| series2 | Springer series in optical sciences |
| spelling | Reimer, Ludwig 1928- Verfasser (DE-588)13230130X aut Transmission electron microscopy physics of image formation L. Reimer ; H. Kohl 5. ed. New York, NY Springer 2008 XVI, 587 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in optical sciences 36 Transmission electron microscopy Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s DE-604 Kohl, Helmut 1955- Verfasser (DE-588)137715617 aut Erscheint auch als Online-Ausgabe 978-0-387-34758-5 Springer series in optical sciences 36 (DE-604)BV000000237 36 Digitalisierung UB Regensburg application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=010511092&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Reimer, Ludwig 1928- Kohl, Helmut 1955- Transmission electron microscopy physics of image formation Springer series in optical sciences Transmission electron microscopy Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| subject_GND | (DE-588)4215608-7 |
| title | Transmission electron microscopy physics of image formation |
| title_auth | Transmission electron microscopy physics of image formation |
| title_exact_search | Transmission electron microscopy physics of image formation |
| title_full | Transmission electron microscopy physics of image formation L. Reimer ; H. Kohl |
| title_fullStr | Transmission electron microscopy physics of image formation L. Reimer ; H. Kohl |
| title_full_unstemmed | Transmission electron microscopy physics of image formation L. Reimer ; H. Kohl |
| title_short | Transmission electron microscopy |
| title_sort | transmission electron microscopy physics of image formation |
| title_sub | physics of image formation |
| topic | Transmission electron microscopy Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| topic_facet | Transmission electron microscopy Durchstrahlungselektronenmikroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=010511092&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV000000237 |
| work_keys_str_mv | AT reimerludwig transmissionelectronmicroscopyphysicsofimageformation AT kohlhelmut transmissionelectronmicroscopyphysicsofimageformation |