Electronic testing:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
McGraw-Hill Book Co.
1966
|
| Schlagworte: | |
| Beschreibung: | XI, 304 S. |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV017352654 | ||
| 003 | DE-604 | ||
| 005 | 20120319 | ||
| 007 | t | ||
| 008 | 030728s1966 |||| 00||| eng d | ||
| 035 | |a (OCoLC)914127 | ||
| 035 | |a (DE-599)BVBBV017352654 | ||
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| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-11 | ||
| 050 | 0 | |a TK7870 | |
| 082 | 0 | |a 621.38154 | |
| 245 | 1 | 0 | |a Electronic testing |c comp. and ed. by L. L. Farkas |
| 264 | 1 | |a New York [u.a.] |b McGraw-Hill Book Co. |c 1966 | |
| 300 | |a XI, 304 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Electronic apparatus and appliances |x Testing | |
| 700 | 1 | |a Farkas, L. L. |e Sonstige |4 oth | |
| 940 | 1 | |q HUB-ZB011201202 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-010458464 | ||
Datensatz im Suchindex
| _version_ | 1804130183901347840 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV017352654 |
| callnumber-first | T - Technology |
| callnumber-label | TK7870 |
| callnumber-raw | TK7870 |
| callnumber-search | TK7870 |
| callnumber-sort | TK 47870 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| ctrlnum | (OCoLC)914127 (DE-599)BVBBV017352654 |
| dewey-full | 621.38154 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.38154 |
| dewey-search | 621.38154 |
| dewey-sort | 3621.38154 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV017352654 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T19:16:59Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-010458464 |
| oclc_num | 914127 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-11 |
| owner_facet | DE-91 DE-BY-TUM DE-11 |
| physical | XI, 304 S. |
| psigel | HUB-ZB011201202 |
| publishDate | 1966 |
| publishDateSearch | 1966 |
| publishDateSort | 1966 |
| publisher | McGraw-Hill Book Co. |
| record_format | marc |
| spelling | Electronic testing comp. and ed. by L. L. Farkas New York [u.a.] McGraw-Hill Book Co. 1966 XI, 304 S. txt rdacontent n rdamedia nc rdacarrier Electronic apparatus and appliances Testing Farkas, L. L. Sonstige oth |
| spellingShingle | Electronic testing Electronic apparatus and appliances Testing |
| title | Electronic testing |
| title_auth | Electronic testing |
| title_exact_search | Electronic testing |
| title_full | Electronic testing comp. and ed. by L. L. Farkas |
| title_fullStr | Electronic testing comp. and ed. by L. L. Farkas |
| title_full_unstemmed | Electronic testing comp. and ed. by L. L. Farkas |
| title_short | Electronic testing |
| title_sort | electronic testing |
| topic | Electronic apparatus and appliances Testing |
| topic_facet | Electronic apparatus and appliances Testing |
| work_keys_str_mv | AT farkasll electronictesting |