SPM Las Vegas, Nev. (2003). SPM 2002: Proceedings of the fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures ; Las Vegas, Nevada, USA, May 26 - 29, 2002. Elsevier.
Chicago Style (17th ed.) CitationSPM Las Vegas, Nev. SPM 2002: Proceedings of the Fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures ; Las Vegas, Nevada, USA, May 26 - 29, 2002. Amsterdam [u.a.]: Elsevier, 2003.
MLA (9th ed.) CitationSPM Las Vegas, Nev. SPM 2002: Proceedings of the Fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures ; Las Vegas, Nevada, USA, May 26 - 29, 2002. Elsevier, 2003.
Warning: These citations may not always be 100% accurate.