SPM 2002: proceedings of the fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures ; Las Vegas, Nevada, USA, May 26 - 29, 2002
Gespeichert in:
Körperschaft: | |
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Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Amsterdam [u.a.]
Elsevier
2003
|
Schriftenreihe: | Ultramicroscopy
97,1/4 |
Schlagworte: | |
Beschreibung: | Einzelaufnahme eines Zeitschr.-H. |
Beschreibung: | XV, 522 S. Ill., graph. Darst. |
Internformat
MARC
LEADER | 00000nam a2200000 cb4500 | ||
---|---|---|---|
001 | BV017280540 | ||
003 | DE-604 | ||
005 | 20030708 | ||
007 | t | ||
008 | 030703s2003 ad|| |||| 10||| eng d | ||
035 | |a (OCoLC)52558161 | ||
035 | |a (DE-599)BVBBV017280540 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-384 | ||
050 | 0 | |a QH212.E4 | |
111 | 2 | |a SPM |n 4 |d 2002 |c Las Vegas, Nev. |j Verfasser |0 (DE-588)1902724-2 |4 aut | |
245 | 1 | 0 | |a SPM 2002 |b proceedings of the fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures ; Las Vegas, Nevada, USA, May 26 - 29, 2002 |c guest eds.: David P. Allison ... |
246 | 1 | 3 | |a Scanning probe microscopy, sensors & nanostructures |
264 | 1 | |a Amsterdam [u.a.] |b Elsevier |c 2003 | |
300 | |a XV, 522 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 0 | |a Ultramicroscopy |v 97,1/4 | |
500 | |a Einzelaufnahme eines Zeitschr.-H. | ||
650 | 4 | |a Detectors |v Congresses | |
650 | 4 | |a Nanostructures |v Congresses | |
650 | 4 | |a Scanning probe microscopy |v Congresses | |
650 | 0 | 7 | |a Rastersondenmikroskopie |0 (DE-588)4330328-6 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 2002 |z Las Vegas Nev. |2 gnd-content | |
689 | 0 | 0 | |a Rastersondenmikroskopie |0 (DE-588)4330328-6 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Allison, David P. |e Sonstige |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-010414982 |
Datensatz im Suchindex
_version_ | 1804130125336281088 |
---|---|
any_adam_object | |
author_corporate | SPM Las Vegas, Nev |
author_corporate_role | aut |
author_facet | SPM Las Vegas, Nev |
author_sort | SPM Las Vegas, Nev |
building | Verbundindex |
bvnumber | BV017280540 |
callnumber-first | Q - Science |
callnumber-label | QH212 |
callnumber-raw | QH212.E4 |
callnumber-search | QH212.E4 |
callnumber-sort | QH 3212 E4 |
callnumber-subject | QH - Natural History and Biology |
ctrlnum | (OCoLC)52558161 (DE-599)BVBBV017280540 |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01462nam a2200385 cb4500</leader><controlfield tag="001">BV017280540</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20030708 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">030703s2003 ad|| |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)52558161</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV017280540</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-384</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QH212.E4</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">SPM</subfield><subfield code="n">4</subfield><subfield code="d">2002</subfield><subfield code="c">Las Vegas, Nev.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)1902724-2</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">SPM 2002</subfield><subfield code="b">proceedings of the fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures ; Las Vegas, Nevada, USA, May 26 - 29, 2002</subfield><subfield code="c">guest eds.: David P. Allison ...</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Scanning probe microscopy, sensors & nanostructures</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam [u.a.]</subfield><subfield code="b">Elsevier</subfield><subfield code="c">2003</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XV, 522 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Ultramicroscopy</subfield><subfield code="v">97,1/4</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Einzelaufnahme eines Zeitschr.-H.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Detectors</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nanostructures</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scanning probe microscopy</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rastersondenmikroskopie</subfield><subfield code="0">(DE-588)4330328-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">2002</subfield><subfield code="z">Las Vegas Nev.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rastersondenmikroskopie</subfield><subfield code="0">(DE-588)4330328-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Allison, David P.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-010414982</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 2002 Las Vegas Nev. gnd-content |
genre_facet | Konferenzschrift 2002 Las Vegas Nev. |
id | DE-604.BV017280540 |
illustrated | Illustrated |
indexdate | 2024-07-09T19:16:03Z |
institution | BVB |
institution_GND | (DE-588)1902724-2 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-010414982 |
oclc_num | 52558161 |
open_access_boolean | |
owner | DE-384 |
owner_facet | DE-384 |
physical | XV, 522 S. Ill., graph. Darst. |
publishDate | 2003 |
publishDateSearch | 2003 |
publishDateSort | 2003 |
publisher | Elsevier |
record_format | marc |
series2 | Ultramicroscopy |
spelling | SPM 4 2002 Las Vegas, Nev. Verfasser (DE-588)1902724-2 aut SPM 2002 proceedings of the fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures ; Las Vegas, Nevada, USA, May 26 - 29, 2002 guest eds.: David P. Allison ... Scanning probe microscopy, sensors & nanostructures Amsterdam [u.a.] Elsevier 2003 XV, 522 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Ultramicroscopy 97,1/4 Einzelaufnahme eines Zeitschr.-H. Detectors Congresses Nanostructures Congresses Scanning probe microscopy Congresses Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2002 Las Vegas Nev. gnd-content Rastersondenmikroskopie (DE-588)4330328-6 s DE-604 Allison, David P. Sonstige oth |
spellingShingle | SPM 2002 proceedings of the fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures ; Las Vegas, Nevada, USA, May 26 - 29, 2002 Detectors Congresses Nanostructures Congresses Scanning probe microscopy Congresses Rastersondenmikroskopie (DE-588)4330328-6 gnd |
subject_GND | (DE-588)4330328-6 (DE-588)1071861417 |
title | SPM 2002 proceedings of the fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures ; Las Vegas, Nevada, USA, May 26 - 29, 2002 |
title_alt | Scanning probe microscopy, sensors & nanostructures |
title_auth | SPM 2002 proceedings of the fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures ; Las Vegas, Nevada, USA, May 26 - 29, 2002 |
title_exact_search | SPM 2002 proceedings of the fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures ; Las Vegas, Nevada, USA, May 26 - 29, 2002 |
title_full | SPM 2002 proceedings of the fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures ; Las Vegas, Nevada, USA, May 26 - 29, 2002 guest eds.: David P. Allison ... |
title_fullStr | SPM 2002 proceedings of the fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures ; Las Vegas, Nevada, USA, May 26 - 29, 2002 guest eds.: David P. Allison ... |
title_full_unstemmed | SPM 2002 proceedings of the fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures ; Las Vegas, Nevada, USA, May 26 - 29, 2002 guest eds.: David P. Allison ... |
title_short | SPM 2002 |
title_sort | spm 2002 proceedings of the fourth international conference on scanning probe microscopy sensors and nanostructures las vegas nevada usa may 26 29 2002 |
title_sub | proceedings of the fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures ; Las Vegas, Nevada, USA, May 26 - 29, 2002 |
topic | Detectors Congresses Nanostructures Congresses Scanning probe microscopy Congresses Rastersondenmikroskopie (DE-588)4330328-6 gnd |
topic_facet | Detectors Congresses Nanostructures Congresses Scanning probe microscopy Congresses Rastersondenmikroskopie Konferenzschrift 2002 Las Vegas Nev. |
work_keys_str_mv | AT spmlasvegasnev spm2002proceedingsofthefourthinternationalconferenceonscanningprobemicroscopysensorsandnanostructureslasvegasnevadausamay26292002 AT allisondavidp spm2002proceedingsofthefourthinternationalconferenceonscanningprobemicroscopysensorsandnanostructureslasvegasnevadausamay26292002 AT spmlasvegasnev scanningprobemicroscopysensorsnanostructures AT allisondavidp scanningprobemicroscopysensorsnanostructures |