Surface analysis methods in materials science:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | German |
| Veröffentlicht: |
Berlin [u.a.]
Springer
2003
|
| Ausgabe: | 2. ed. |
| Schriftenreihe: | Springer series in surface sciences
23 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Literaturangaben |
| Beschreibung: | XXVI, 585 S. Ill., graph. Darst. |
| ISBN: | 3540413308 |
Internformat
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| 245 | 1 | 0 | |a Surface analysis methods in materials science |c D. J. O'Connor ... (eds.) |
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| 650 | 4 | |a Surfaces (Technology) |x Analysis | |
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Datensatz im Suchindex
| _version_ | 1804130036568031232 |
|---|---|
| adam_text | DJ. O CONNOR, B.A. SEXTON, R.ST.C. SMART (EDS.) SURFACE ANALYSIS METHODS
IN MATERIALS SCIENCE SECOND EDITION WITH 272 FIGURES SPRINGER CONTENTS
PART I INTRODUCTION 1 SOLID SURFACES, THEIR STRUCTURE AND COMPOSITION C.
KLAUBER. R. ST. C. SMART 3 1.1 IMPORTANCE OF THE SURFACE 3 1.2 SOLID
SURFACES OF DIFFERENT MATERIALS 7 1.2.1 A MATERIAL UNDER ATTACK:
ALUMINIUM 11 1.3 METHODS OF SURFACE ANALYSIS 12 1.3.1 VARIETY OF SURFACE
ANALYTICAL TECHNIQUES 12 1.4 STRUCTURAL IMAGING 13 1.4.1 DIRECT PHYSICAL
IMAGING 13 1.4.2 INDIRECT STRUCTURAL IMAGING - RELAXATION AND
RECONSTRUCTION 20 1.5 COMPOSITION OF THE SURFACE SELVEDGE 23 1.5.1
ELECTRON INELASTIC MEAN FREE PATHS 24 1.5.2 VARIATION OF ELEMENTAL
SENSITIVITIES 28 1.5.3 PRACTICAL DETECTION LIMITS 31 1.5.4 PRACTICAL
SPATIAL LIMITS 32 1.5.5 CHEMICAL STATE INFORMATION 37 1.5.6 LABORATORY
STANDARDS 41 1.5.7 INTER-LABORATORY ERRORS 41 1.6 DEFECT AND REACTION
SITES AT SURFACES 42 1.7 ELECTRONIC STRUCTURE AT SURFACES 46 1.8
STRUCTURES OF ADSORBED LAYERS 49 1.9 STRUCTURE IN DEPTH PROFILES THROUGH
SURFACES 51 1.10 SPECIFIC STRUCTURES 55 1.10.1 GRAM STRUCTURES. PHASE
DISTRIBUTIONS AND INCLUSIONS 55 1.10.2 FRACTURE FACES AND INTERGRANULAR
REGIONS 55 1.10.3 PORE STRUCTURES 57 XII CONTENTS 1.10.4 PRECIPITATES,
REACTION PRODUCTS AND RECRYSTALLISED PARTICLES ON SURFACES 60 1.10.5
MAGNETIC DOMAINS 60 1.11 TECHNIQUE-INDUCED ARTIFACTS 61 1.11.1 RADIATION
DARNAGE 61 1.11.2 ELECTROSTATIC CHARGING 64 REFERENCES 65 2 UHV BASICS
C. KLAUBER 71 2.1 THE NEED FOR ULTRAHIGH VACUUM 71 2.2 ACHIEVING UHV 74
2.3 SPECIMEN HANDLING 76 2.4 SPECIMEN HANDLING: ASTM STANDARDS 78
REFERENCES 81 PART II TECHNIQUES 3 ELECTRON MICROSCOPE TECHNIQUES FOR
SURFACE CHARACTERIZATION P.S. TURNER., C.E. NOCKOLDS, S. BULCOCK 85 3.1
WHAT DO WE NEED TO KNOW ABOUT SURFACE STRUCTURES? 86 3.2 ELECTRON
OPTICAL IMAGING SYSTEMS 87 3.2.1 ELECTRON SOURCES 89 3.2.2 ELECTRON
LENSES 89 3.2.3 DETECTION SYSTEMS 90 3.3 SCANNING ELECTRON MICROSCOPY OF
SURFACES 91 3.3.1 THE SEM 91 3.3.2 THE SIGNALS AND DETECTORS 92 3.3.3
RESOLUTION AND CONTRAST IN SEM IMAGES 93 3.3.4 VARIABLE PRESSURE SEM AND
ENVIRONMENTAL SEM 97 3.3.5 ENERGY DISPERSIVE X-RAY SPECTROMETRY 98 3.4
TRANSMISSION ELECTRON MICROSCOPY OF SURFACES 99 3.4.1 THE TRANSMISSION
ELECTRON MICROSCOPE 99 3.4.2 ELECTRON DIFFRACTION 101 3.4.3 IMAGE
CONTRAST AND RESOLUTION IN THE TEM 101 3.4.4 IMAGING SURFACE STRUCTURES
IN THE TEM 102 3.4.5 REFLECTION ELECTRON MICROSCOPY 103 3.5 OTHER
DEVELOPMENTS 103 REFERENCES 104 CONTENTS XIII 4 SPUTTER DEPTH PROFILING
B.V. KING 107 4.1 ANALYSIS OF A SPUTTER DEPTH PROFILE 108 4.1.1
CALIBRATION OF THE DEPTH SCALE 108 4.1.2 CALIBRATION OF THE
CONCENTRATION SCALE 112 4.2 THE DEPTH RESOLUTION OF SPUTTER PROFILING
115 4.2.1 SPECIFICATION OF THE DEPTH RESOLUTION 115 4.2.2 INSTRUMENTAL
FACTORS DETERMINING THE DEPTH RESOLUTION . . 117 4.2.3 SURFACE EFFECTS
DETERMINING THE DEPTH RESOLUTION 119 4.2.4 BULK EFFECTS AFFECTING THE
DEPTH RESOLUTION 120 4.2.5 MINIINISATION OF THE DEPTH RESOLUTION 121 4.3
CONCLUSION 123 REFERENCES 123 5 SIMS * SECONDARY ION MASS SPECTROMETRY
R.J. MACDONALD, B.V. KING 127 5.1 THE PRACTICE OF SIMS 128 5.1.1
OVERVIEW 128 5.1.2 ADVANTAGES AND DISADVANTAGES OF SIMS 130 5.1.3 THE
YIELD OF SECONDARY IONS 131 5.2 CONSTRUCTION OF A SECONDARY ION MASS
SPECTROMETER 138 5.3 TOPICS IN SIMS ANALYSIS 145 5.3.1 SIGNAL
ENHANCEMENT BY SURFACE ADSORPTION 145 5.3.2 USING SECONDARY ION ENERGIES
IN SIMS ANALYSIS 147 5.3.3 THE RELATIVE SENSITIVITY FACTOR 149 5.4
STATIC SIMS ANALYSIS 150 REFERENCES 153 6 AUGER ELECTRON SPECTROSCOPY
AND MICROSCOPY TECHNIQUES AND APPLICATIONS P.C. DASTOOR 155 6.1
INTRODUCTION 155 6.2 FUNDAMENTALS 155 6.3 INSTRUMENTATION 158 6.4
QUANTIFICCLTION 159 6.5 TECHNIQUES 160 6.5.1 SPOT ANALYSIS MODE 161
6.5.2 LINE SCAN MODE 162 6.5.3 SCANNING MODE 163 6.5.4 SCANNING AUGER
MICROSCOPY 164 6.5.5 DEPTH PROFILING MODE 167 6.5.6 PREFERENTIAL
SPUTTERING 167 6.5.7 ATTENUATION LENGTH 168 XIV CONTENTS 6.5.8 CHEMICAL
EFFECTS 168 6.6 APPLICATIONS 169 6.6.1 THIN FILM ANALYSIS 169 6.6.2
SURFACE DIFFUSION AND SEGREGATION 170 6.7 FUTURE 171 REFERENCES 171 7
X-RAY PHOTOELECTRON SPECTROSCOPY M.H. KIBEL 175 7.1 BASIC PRINCIPLES 175
7.1.1 THEORY 175 7.1.2 TYPICAL SPECTRUM 176 7.1.3 SURFACE SPECIFICITY
178 7.2 INSTRUMENTATION 179 7.2.1 ESSENTIAL COMPONENTS 179 7.2.2
OPTIONAL COMPONENTS 182 7.2.3 SYNCHROTRON RADIATION 183 7.2.4 IMAGING
XPS 183 7.3 SPECTRAL INFORMATION 184 7.3.1 SPIN-ORBIT SPLITTING 184
7.3.2 CHEMICAL SHIFTS 185 7.3.3 AUGER CHEMICAL SHIFTS IN XPS 186 7.3.4
X-RAY LINE SATELLITES 187 7.3.5 SHAKE-UP LINES 187 7.3.6 GHOST LINES
188 7.3.7 PLASMON LOESS LINES * 189 7.4 QUANTITATIVE ANALYSIS 189 7.5
EXPERIMENTAL TECHNIQUES 191 7.5.1 VARIATION OF X-RAY SOURCES 191 7.5.2
DEPTH PROFILES 191 7.5.3 ANGULAR VARIATIONS ; . . 194 7.5.4 SAMPLE
CHARGING 194 7.6 COMPARISON WITH OTHER TECHNIQUES 195 7.7 APPLICATIONS
197 7.8 CONCLUSION 197 R.EFERENCES 198 8 VIBRATIONAL SPECTROSCOPY OF
SURFACES R.L. FROST, N.K. ROBERTS 203 8.1 INTRODUCTION 203 8.2 SURFACE
TECHNIQUES 206 8.2.1 DIFFUSE REFLECTANCE INFRARED FOURIER TRANSFORM
(DRIFT) . . 207 8.2.2 ATTENUATED TOTAL REFLECTANCE SPECTROSCOPY (ATR)
209 8.2.3 PHOTOACOUSTIC SPECTROSCOPY (PAS) 216 CONTENTS XV 8.2.4
INFRARED EMISSION SPECTROSCOPY (IES) 219 8.3 FOURIER TRANSFORM RAMAN
SPECTROSCOPY 221 8.4 RAMAN MICROSCOPY 224 REFERENCES 227 9 RUTHERFORD
BACKSCATTERING SPECTROMETRY AND NUCLEAR REACTION ANALYSIS S.H. SIE 229
9.1 INTRODUCTION 229 9.2 PRINCIPLES 231 9.2.1 STOPPING POWER 232 9.2.2
STRAGGLING 233 9.3 RUTHERFORD BACKSCATTERING SPECTROMETRY 234 9.3.1
EXPERIMENTAL CONSIDERATIONS 236 9.3.2 EXAMPLES 236 9.3.3 SPECIAL CASES
238 9.4 NUCLEAR REACTION ANALYSIS 240 9.4.1 FORMALISM 241 9.4.2
EXPERIMENTAL CONSIDERATIONS 242 9.4.3 EXAMPLES 243 9.5 SUMMARY 245
REFERENCES 246 10 MATERIALS CHARACTERIZATION BY SCANNED PROBE ANALYSIS
S. MYHRA 247 10.1 INTRODUCTION 247 10.2 THE SURFACE ANALYTICAL CONTEXT
251 10.3 GENERIC SPM SYSTEMS 251 10.4 PHYSICAL PRINCIPLES 253 10.4.1
STM/STS 253 10.4.2 SCANNING FORCE MICROSCOPY (SFM) 256 10.4.3
INTERMITTENT CONTACT MODE 257 10.4.4 F-D ANALYSIS 258 10.4.5 LATERAL
FORCE MICROSCOPY (LFM) 260 10.5 PROCEDURES FOR BEST PRACTICE 262
10.5.1 SPATIAL CHARACTERISTICS OF SCANNERS 263 10.5.2 DETERMINATION OF
CN AND CT 264 10.5.3 DETERMINATION OF SPRING CONSTANTS 265 10.5.4
DETERMINATION OF ACTUAL TIP PARAMETERS IN THE MESOSCOPIC REGIME 266 10.6
ILLUSTRATIVE CASE STUDIES 267 10.6.1 SURFACE AND DEFECT STRUCTURES OF
WTE2 INVESTIGATED BY UHV-STM 267 XVI CONTENTS 10.6.2 ORGANIC THIN FILM
AND SURFACE MECHANICAL CHARACTERIZATION 269 10.6.3 AFM ANALYSIS OF SOFF
BIOLOGICAL MATERIALS 273 10.6.4 NANOTRIBOLOGY OF SOLID LUBRICANTS 278
REFERENCES 283 11 LOW ENERGY ION SCATTERING D. J. O CONNOR 287 11.1
QUALITATIVE SURFACE ANALYSIS 287 11.2 ADVANTAGE OF RECOIL DETECTION 289
11.3 QUANTITATIVE ANALYSIS 291 11.3.1 SCATTERED ION YIELD 291 11.3.2
DIFFERENTIAL SCATTERING CROSS SECTION 291 11.3.3 CHARGE EXCHANGE 292
11.3.4 RELATIVE MEASUREMENTS 295 11.3.5 STANDARDS 297 11.4 SURFACE
STRUCTURAL ANALYSIS 299 11.4.1 MULTIPLE SCATTERING 299 11.4.2 IMPACT
COLLISION ION SURFACE SCATTERING (ICISS) 300 11.5 EXPERIMENTAL APPARATUS
302 REFERENCES 304 12 REFLECTION HIGH ENERGY ELECTRON DIFFRACTION G.L.
PRICE 307 12.1 THEORY 309 12.2 APPLICATIONS : 312 REFERENCES 318 13 LOW
ENERGY ELECTRON DIFFRACTION P. J. JENNINGS, C.Q. SUN 319 13.1 THE
DEVELOPMENT OF LEED 319 13.2 THE LEED EXPERIMENT 320 13.2.1 SAMPLE
PREPARATION 323 13.2.2 DATA COLLECTION 323 13.3 DIFFRACTION FROM A
SURFACE 324 13.3.1 BRAGG PEAKS IN LEED SPECTRA % . 325 13.4 LEED
INTENSITY ANALYSIS 326 13.5 LEED FINE STRUCTURE 328 13.6 APPLICATIONS OF
LEED 329 13.6.1 DETERMINATION OF THE SYMMETRY AND SIZE OF THE UNIT MESH
329 13.6.2 UNIT MESHES FOR CHEMISORBED SYSTEMS 330 13.6.3 LEED INTENSITY
ANALYSIS 330 13.6.4 SURFACE BARRIER ANALYSIS 332 CONTENTS XVII 13.7
CONCLUSION 333 REFERENCES : 334 14 ULTRAVIOLET PHOTOELECTRON
SPECTROSCOPY OF SOLIDS R. LECKEY 337 14.1 EXPERIMENTAL CONSIDERATIONS
339 14.2 ANGLE RESOLVED UPS 340 14.3 FERMI SURFACE STUDIES 344
REFERENCES 345 15 EXAFS R.F. GARRETT, G.J. FORAN 347 15.1 INTRODUCTION
347 15.2 EXPERIMENTAL DETAILS 348 15.2.1 SYNCHROTRON RADIATION 350
15.2.2 SYNCHROTRON BEAMLINES FOR EXAFS 352 15.2.3 DETECTORS 354 15.2.4
THE SAMPLE 355 15.2.5 ACQUIRING EXAFS DATA 357 15.3 THEORY OF X-RAY
ABSORPTION 359 15.3.1 EXAFS 359 15.3.2 XANES 361 15.4 EXAFS ANALYSIS 362
15.4.1 DATA REDUCTION 362 15.4.2 CONVERSION TO FC-SPACE 363 15.4.3
BACKGROUND SUBTRACTION 363 15.4.4 FOURIER TRANSFORMATION 364 15.4.5
FOURIER FILTERING AND BACK TRANSFORMATION 364 15.4.6 MODELLING AND LEAST
SQUARES FITTING TO THE EXAFS EQUATION 365 15.5 CASE STUDIES 366 15.5.1
SURFACE EXAFS OF TITANIUM NANOSTRUCTURE THIN FILMS ... 366 15.5.2
ION-IMPLANTATION INDUCED AMORPHISATION OF GERMANIUM . . 370 REFERENCES
371 XVIIT CONTENTS PART III PROCESSES AND APPLICATIONS 16 MINERALS,
CERAMICS AND GLASSES R.ST.C. SMART 377 16.1 MINERALS 380 16.1.1 IRON
OXIDES IN MINERAL MIXTURES 380 16.1.2 SURFACE LAYERS ON MINERALS 381
16.1.3 MINERAL PROCESSING OF SULFIDE ORES 381 16.1.4 ADSORPTION AND
REACTION OF OXIDE AND CLAY MINERALS 386 16.1.5 SURFACE MODIFICATION OF
MINERALS 387 16.2 CERAMICS 389 16.2.1 LEACHING AND DISSOLUTION 390
16.2.2 CERAMIC SURFACE LAYERS: BIOCERAMICS 392 16.3 GLASSES 395 16.3.1
LEACHED AND RECRYSTALLISED SURFACES 395 16.3.2 SURFACE MODIFICATION OF
GLASS SURFACES 398 REFERENCES 400 17 CHARACTERIZATION OF CATALYSTS BY
SURFACE ANALYSIS N.K. SINGH, B.G. BAKER 405 17.1 EXAMPLES OF CATALYTIC
SYSTEMS STUDIED BY XPS 408 17.1.1 ALUMINA 408 17.1.2 TUNGSTEN OXIDE
CATALYSTS 409 17.1.3 PALLADIUM ON MAGNESIA 412 17.1.4 COBALT ON
KIESEIGUHR CATALYSTS 414 17.1.5 IRON CATALYSTS 416 17.2 EXAMPLES OF
CATALYTIC SYSTEMS STUDIED BY FT-INFRARED SPECTROSCOPY 420 17.2.1 ZSM-5
ZEOLITES .... . 420 17.2.2 THIN ALUMINA FILMS 426 17.2.3 RHODIUM
SUPPORTED ALUMINA FILMS 428 17.2.4 COPPER SUPPORTED SILICA FILMS 429
17.3 CONCLUSION 432 REFERENCES 432 18 APPLICATION TO SEMICONDUCTOR
DEVICES P.W. LEECH, P. RESSEL 435 18.1 MICRO AND NANO-ANALYSIS OF
INTEGRATED CIRCUITS 436 18.2 ANALYTICAL TECHNIQUES IN THE
CHARACTERISATION OF OHMIC METAL/SEMICONDUCTOR CONTACTS 443 18.3 SUMMARY
452 REFERENCES 452 CONTENTS XIX 19 CHARACTERISATION OF OXIDISED SURFACES
J.L. COCKING. G.R. JOHNSTON 455 19.1 THE OXIDATION PROBLEM 456 19.2
OXIDATION OF CO-22CR-LLAL 457 19.2.1 CHEMICAL CHARACTERISATION 458
19.2.2 SCANNING AUGER MICROSCOPY 458 19.2.3 RUTHERFORD BACKSCATTERING
ANALYSIS 459 19.3 OXIDATION OF NI-18CR-6AL-0.5Y 464 19.3.1 EXTENDED
X-RAY ABSORPTION FINE STRUCTURE 466 REFERENCES 471 20 COATED STEEL R.
PAYLING 473 20.1 APPLICATIONS 474 20.1.1 GRAIN BOUNDARIES IN STEEL 474
20.1.2 STEEL SURFACE 475 20.1.3 ALLOY REGION 478 20.1.4 METALLIC
COATINGS 478 20.1.5 TREATED METALLIC COATING SURFACE 483 20.1.6
METAL-POLYMER INTERFACE 483 20.1.7 POLYMER SURFACE 484 20.2 CONCLUSION
486 REFERENCES 486 21 THIN FILM ANALYSIS G.C. MORRIS 489 21.1 THIN FILM
PHOTOVOLTAICS 490 21.1.1 USE FOR SOLAR ELECTRICITY 490 21.1.2 THE THIN
FILM SOLAR CELL: GLASS/ITO/NCDS/PCDTE/AU . . 491 21.2 FILM PURITY 492
21.2.1 LOW LEVEL IMPURITIES - QUALITATIVE 492 21.2.2 LOW LEVEL
IMPURITIES - QUANTITATIVE 494 21.2.3 DOPING PROFILES IN THIN FILMS 495
21.3 COMPOSITION AND THICKNESS OF LAYERED FILMS 496 21.3.1 COMPOSITION
GRADATION IN FILMS. E.G. CD^HGI-ZTE FILMS ON PLATINUM 496 21.3.2 THIN
OVERLAYERS ON FILMS 497 21.4 BEAM EFFECTS IN THIN FILM ANALYSIS 501 21.5
CONCLUSION 502 REFERENCES 502 XX CONTENTS 22 IDENTIFICATION OF ADSORBED
SPECIES B.G. BAKER 505 22.1 EXAMPLES OF ADSORPTION STUDIES 505 22.1.1
NITRIC OXIDE ADSORPTION ON METALS 505 22.1.2 AUROCYANIDE ADSORPTION ON
CARBON 511 22.1.3 ADSORBED METHOXY ON COPPER AND PLATINUM 514 22.2
CONCLUSION 518 REFERENCES 518 23 SURFACE ANALYSIS OF POLYMERS H.A.W.
STJOHN, T.R. GENGENBACH, P.G. HARTLEY, H.J. GRIESSER 519 23.1 SPECIFIC
PROPERTIES OF POLYMERS 520 23.2 SURFACE CONTAMINATION AND ADDITIVES 525
23.3 CONTACT ANGLE MEASUREMENTS 529 23.4 X-RAY PHOTOELECTRON
SPECTROSCOPY (XPS) 529 23.4.1 GENERAL ASPECTS 529 23.4.2 ANGLE-RESOLVED
XPS 531 23.4.3 INELASTIC MEAN FREE PATH IN POLYMERS 532 23.4.4 COLD
STAGE XPS 533 23.4.5 DERIVATIZATION OF CHEMICAL GROUPS 534 23.5
SECONDARY ION MASS SPECTROMETRY (SIMS) 537 23.6 SCANNING PROBE
MICROSCOPY METHODS: SCANNING TUNNELING MICROSCOPY (STM) AND ATOMIC FORCE
MICROSCOPY (AFM) 540 23.7 SPECIMEN DAMAGE 543 23.8 CHARGE CORRECTION 547
23.9 GRAZING ANGLE INFRARED SPECTROSCOPY 548 REFERENCES 549 24 GLOW
DISCHARGE OPTICAL EMISSION SPECTROMETRY T. NELIS, R. PAYLING 553 24.1
INSTRUMENT 553 24.2 THEORY 555 24.3 APPLICATIONS 556 24.3.1 NEAR SURFACE
556 24.3.2 COATINGS 556 24.3.3 SEMICONDUCTOR PROCESSING 557 REFERENCES
559 CONTENTS XXI PART IV APPENDIX ACRONYMS USED IN SURFACE AND THIN FILM
ANALYSIS 563 SURFACE SCIENCE BIBLIOGRAPHY 569 INDEX 577
|
| any_adam_object | 1 |
| author_GND | (DE-588)124955975 |
| building | Verbundindex |
| bvnumber | BV017177896 |
| callnumber-first | T - Technology |
| callnumber-label | TA418 |
| callnumber-raw | TA418.7 |
| callnumber-search | TA418.7 |
| callnumber-sort | TA 3418.7 |
| callnumber-subject | TA - General and Civil Engineering |
| classification_rvk | UP 7500 VE 7000 ZM 7605 |
| classification_tum | PHY 160f WER 089f WER 092f WER 740f |
| ctrlnum | (OCoLC)248404702 (DE-599)BVBBV017177896 |
| dewey-full | 620.44 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.44 |
| dewey-search | 620.44 |
| dewey-sort | 3620.44 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Chemie / Pharmazie Physik Werkstoffwissenschaften Werkstoffwissenschaften / Fertigungstechnik |
| edition | 2. ed. |
| format | Book |
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| id | DE-604.BV017177896 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T19:14:39Z |
| institution | BVB |
| isbn | 3540413308 |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-010353639 |
| oclc_num | 248404702 |
| open_access_boolean | |
| owner | DE-1102 DE-91G DE-BY-TUM DE-M49 DE-BY-TUM DE-1050 DE-20 DE-703 DE-355 DE-BY-UBR DE-634 DE-83 DE-526 |
| owner_facet | DE-1102 DE-91G DE-BY-TUM DE-M49 DE-BY-TUM DE-1050 DE-20 DE-703 DE-355 DE-BY-UBR DE-634 DE-83 DE-526 |
| physical | XXVI, 585 S. Ill., graph. Darst. |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in surface sciences |
| series2 | Springer series in surface sciences Physics and astronomy online library |
| spelling | Surface analysis methods in materials science D. J. O'Connor ... (eds.) 2. ed. Berlin [u.a.] Springer 2003 XXVI, 585 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in surface sciences 23 Physics and astronomy online library Literaturangaben Oberflächenanalyse Surfaces (Technology) Analysis Oberflächeneigenschaft (DE-588)4219221-3 gnd rswk-swf Oberflächenprüfung (DE-588)4172254-1 gnd rswk-swf Werkstoffkunde (DE-588)4079184-1 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 s Werkstoffkunde (DE-588)4079184-1 s DE-604 Oberflächenprüfung (DE-588)4172254-1 s 1\p DE-604 Oberflächeneigenschaft (DE-588)4219221-3 s 2\p DE-604 O'Connor, Daniel J. 1952- Sonstige (DE-588)124955975 oth Springer series in surface sciences 23 (DE-604)BV000600785 23 HEBIS Datenaustausch Darmstadt application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=010353639&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Surface analysis methods in materials science Springer series in surface sciences Oberflächenanalyse Surfaces (Technology) Analysis Oberflächeneigenschaft (DE-588)4219221-3 gnd Oberflächenprüfung (DE-588)4172254-1 gnd Werkstoffkunde (DE-588)4079184-1 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| subject_GND | (DE-588)4219221-3 (DE-588)4172254-1 (DE-588)4079184-1 (DE-588)4172243-7 |
| title | Surface analysis methods in materials science |
| title_auth | Surface analysis methods in materials science |
| title_exact_search | Surface analysis methods in materials science |
| title_full | Surface analysis methods in materials science D. J. O'Connor ... (eds.) |
| title_fullStr | Surface analysis methods in materials science D. J. O'Connor ... (eds.) |
| title_full_unstemmed | Surface analysis methods in materials science D. J. O'Connor ... (eds.) |
| title_short | Surface analysis methods in materials science |
| title_sort | surface analysis methods in materials science |
| topic | Oberflächenanalyse Surfaces (Technology) Analysis Oberflächeneigenschaft (DE-588)4219221-3 gnd Oberflächenprüfung (DE-588)4172254-1 gnd Werkstoffkunde (DE-588)4079184-1 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| topic_facet | Oberflächenanalyse Surfaces (Technology) Analysis Oberflächeneigenschaft Oberflächenprüfung Werkstoffkunde |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=010353639&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV000600785 |
| work_keys_str_mv | AT oconnordanielj surfaceanalysismethodsinmaterialsscience |