Sell, B. (2002). Interface characterization of metal gate MOS-structures and the application to DRAM-capacitors.
Chicago Style (17th ed.) CitationSell, Bernhard. Interface Characterization of Metal Gate MOS-structures and the Application to DRAM-capacitors. 2002.
MLA (9th ed.) CitationSell, Bernhard. Interface Characterization of Metal Gate MOS-structures and the Application to DRAM-capacitors. 2002.
Warning: These citations may not always be 100% accurate.